公开(公告)号：US10210155B2

公开(公告)日：2019-02-19

申请号：US15412227

申请日：2017-01-23

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Yosuke Tajika ,  Atsushi Yoshida ,  Wei Zhang

IPC: G06F17/27 ,  G06F11/26 ,  G06F11/30 ,  G06F11/34

Abstract: An apparatus state estimation method includes: storing first apparatus data that indicates a state of an apparatus; storing a work record, the work record being a record indicating a work that has been carried out for maintenance of the apparatus; estimating a category that is a malfunction of the apparatus or a content of a measure by using the work record; and learning a relationship between the estimated category and the first apparatus data.