公开(公告)号：US20140123117A1

公开(公告)日：2014-05-01

申请号：US14044259

申请日：2013-10-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byeong-hu LEE

IPC: G06F11/36

CPC classification number: G06F11/3672 ,  G06F3/00 ,  G06F8/20 ,  G06F8/433 ,  G06F11/34 ,  G06F11/3684 ,  G06F11/3688 ,  G06F11/3692 ,  G06F17/28

Abstract: An automatic test apparatus for embedded software, an automatic testing method thereof and a test scenario composing method may be used to detect an unpredictable problem as well as a predictable problem that may occur under user's conditions and reproduce various events. The automatic testing apparatus may include a keyword composer which extracts a keyword from status information output by executing the embedded software, and composes a keyword list using the extracted keywords, an output analyzer which analyzes the output from the execution of the embedded software based on the composed keyword list, a control command generator which loads at least one scenario previously stored in accordance with the analysis results, and generates an instruction list corresponding to a predetermined event status, and a test processor which processes the embedded software to reproduce the event status based on the generated instruction list.