公开(公告)号：US20150211994A1

公开(公告)日：2015-07-30

申请号：US14563318

申请日：2014-12-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jeong-min JO ,  Tae-soo KIM ,  Sung-hwa LEE ,  Hyun-soo JANG

IPC: G01N21/59

CPC classification number: G01N21/13 ,  G01N2201/0256

Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.

Abstract translation: 公开了一种分析装置和确定安装在分析装置中的盒的安装状态的方法。 分析装置包括：安装单元，其构造成安装其上形成有用于容纳样品的至少一个孔的盒; 测量单元，被配置为测量与形成在所述盒上的所述至少一个阱相对应的至少一个信号; 以及操作处理器，被配置为相对于由所述测量单元测量的所述至少一个井处理所述至少一个测量信号，其中所述操作处理器基于所述至少一个测量信号相对于所述测量单元确定所述盒的安装状态 至少一个孔形成在筒上。