Abstract:
A method of changing an association of a remote control device from a first electronic device to a second electronic device is presented. In the method, a command for an electronic device is generated and transmitted by the remote control device. At this point, the remote control device is associated with the first electronic device to control the first electronic device, and the remote control device is not associated with the second electronic device. If an acknowledgment of the command is not received, a request to associate the remote control device with another electronic device is transmitted. A reply to the request is then received from the second electronic device. In response to the reply, the remote control device is disassociated from the first electronic device and associated with the second electronic device.
Abstract:
Systems and methods of issuing a reminder from a remote control are disclosed. In at least one embodiment, an exemplary embodiment has a remote control and a set top box (STB). In at least one embodiment, the remote control has a transmitter that transmits information corresponding to at least one reminder event with a reminder time, a reminder alert receiver that receives a reminder alert, and at least one of a sound emitter that issues audible reminder alerts, a vibration generator that issues vibration reminder alerts, and a light source that issues visible reminder alerts. In at least one embodiment, the STB has a receiver that receives the information corresponding to the reminder event from the remote control, a STB processing system that generates a reminder alert based upon the received reminder event, and a reminder alert transmitter that transmits the reminder alert to the remote control.
Abstract:
A wafer position error detection and correction system determines the presence of a wafer on a wafer transport robot blade. The system also determines a wafer position error by monitoring the position of the wafer with respect to the blade with one sensor which is located proximate to each entrance of a process chamber. When a wafer position error is detected, the system determines the extent of the misalignment and corrects such misalignment if correctable by the wafer transport robot or alerts an operator for operator intervention. The system incorporates a transparent cover on the surface of the wafer handling chamber and four optical detection sensors disposed on the surface of the transparent cover, in which each sensor is placed proximate to the entrance of the process chamber. In addition, an I/O sensor is placed adjacent the I/O slit valve to detect and correct wafer position errors. The detection sensors direct light through the wafer handling chamber to reflectors on the floor of the transfer chamber which reflect the light back to the detector sensors. A detector within the detector sensor detects when the beam path from the position sensor to the reflector is uninterrupted. As a wafer is retracted out of a process chamber or a wafer cassette, the position of the wafer with respect to the blade is measured, thus determining whether the wafer is properly placed on the wafer.