Lateral microelectromechanical system switch
    23.
    发明申请
    Lateral microelectromechanical system switch 有权
    侧向微机电系统开关

    公开(公告)号:US20050024169A1

    公开(公告)日:2005-02-03

    申请号:US10915742

    申请日:2004-08-11

    IPC分类号: H01H59/00 H01H53/00

    摘要: A switch comprising a substrate, an elongated movable part, a pair of electrical contacts disposed at one side of said part, an actuation electrode disposed at the one side of the part and separated from the pair of electrical contacts, wherein the part, the contacts and the electrode are disposed on the substrate, wherein the elongated movable part is arranged and dimensioned such that the part is movable in a generally lateral direction toward the contacts; the movable part includes a central elongated member fixed to a head having an electrical contact disposed at the one side. One end of the movable part is attached to the substrate by means of various anchoring arrangements.

    摘要翻译: 一种开关,其包括基板,细长可动部分,设置在所述部分一侧的一对电触点,设置在该部分的一侧并与所述一对电触头分离的致动电极,其中所述部分,所述触点 并且所述电极设置在所述基板上,其中所述细长可动部分被布置和尺寸设定成使得所述部件能够沿大致横向方向朝向所述触点移动; 可移动部分包括固定到头部的中心细长构件,其具有设置在一侧的电触头。 可移动部分的一端通过各种锚定装置附接到基板。

    Plasma RIE polymer removal
    25.
    发明授权
    Plasma RIE polymer removal 失效
    等离子体RIE聚合物去除

    公开(公告)号:US06758223B1

    公开(公告)日:2004-07-06

    申请号:US09603254

    申请日:2000-06-23

    IPC分类号: B08B600

    摘要: A method for removal of post reactive ion etch by-product from a semiconductor wafer surface or microelectronic composite structure comprising: supplying a reducing gas plasma incorporating a forming gas mixture selected from the group consisting of a mixture of N2/H2 or a mixture of NH3/H2 into a vacuum chamber in which a semiconductor wafer surface or a microelectronic composite structure is supported to form a post-RIE polymer material by-product on the composite structure without significant removal of an organic, low K material which has also been exposed to the reducing gas plasma; and removing the post-RIE polymer material by-product with a wet clean.

    摘要翻译: 一种用于从半导体晶片表面或微电子复合结构去除后反应离子蚀刻副产物的方法,包括:提供还原气体等离子体,该还原气体等离子体包含选自N2 / H2或NH3混合物的成形气体混合物 / H2进入真空室,其中半导体晶片表面或微电子复合结构被支撑以在复合结构上形成后RIE聚合物材料副产物,而不显着除去已经暴露于 还原气体等离子体; 并用湿式清洁剂除去后RIE聚合物材料副产物。

    Apparatus and methods for encapsulating microelectromechanical (MEM) devices on a wafer scale
    27.
    发明申请
    Apparatus and methods for encapsulating microelectromechanical (MEM) devices on a wafer scale 有权
    用于将微机电(MEM)器件封装在晶片上的装置和方法

    公开(公告)号:US20060108675A1

    公开(公告)日:2006-05-25

    申请号:US10993548

    申请日:2004-11-19

    CPC分类号: B81C1/00293 B81C2203/0145

    摘要: Apparatus and methods are provided for enabling wafer-scale encapsulation of microelectromechanical (MEM) devices (e.g., resonators, filters) to protect the MEMs from the ambient and to provide either a controlled ambient or a reduced pressure. In particular, methods for wafer-scale encapsulation of MEM devices are provided, which enable encapsulation of MEM devices under desired ambient conditions that are not determined by the deposition conditions of a sealing process in which MEM release via holes are sealed or pinched-off, and which prevent sealing material from being inadvertently deposited on the MEM device during the sealing process.

    摘要翻译: 提供了设备和方法,用于实现微机电(MEM)装置(例如,谐振器,滤波器)的晶片级封装,以保护MEM免受环境影响,并提供受控的环境或减压。 特别地,提供了用于MEM器件的晶片级封装的方法,其能够在期望的环境条件下封装MEM器件,所述环境条件不是通过其中MEM释放通孔被密封或夹断的密封过程的沉积条件来确定的, 并且其在密封过程中防止密封材料被无意中沉积在MEM装置上。