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    Method and system for assigning radio resources in cellular system using wired relay stations
    21.
    发明申请
    Method and system for assigning radio resources in cellular system using wired relay stations 有权
    使用有线中继站在蜂窝系统中分配无线电资源的方法和系统

    公开(公告)号：US20080119194A1

    公开(公告)日：2008-05-22

    申请号：US11900333

    申请日：2007-09-10

    申请人： Byung-Jik Kim ,  Seong-Taek Hwang ,  Won-Jin Sung ,  Jin-Woo Choe ,  Jong-Hyun Park ,  Jong-Hyun Kim

    发明人： Byung-Jik Kim ,  Seong-Taek Hwang ,  Won-Jin Sung ,  Jin-Woo Choe ,  Jong-Hyun Park ,  Jong-Hyun Kim

    IPC分类号： H04Q7/20

    CPC分类号： H04W72/085 ,  H04W4/08 ,  H04W84/047

    摘要： A method of assigning radio resources in a cellular system using wired Relay Stations (RSs) includes: a Base Station (BS) gathering feed-back control information of all Mobile Stations (MSs) via the RSs in a cell of the BS; a first process, wherein the MSs are divided into two groups according to a channel state of each MS; a second process, wherein sub-channels are dynamically assigned to MSs belonging to a group, in which a channel state of each MS is good, of the two groups; and a third process, wherein sub-channels are dynamically assigned to MSs belonging to a group, in which a channel state of each MS is bad, of the two groups by considering a resource state per RS and a channel gain between sub-channels.

    摘要翻译： 一种使用有线中继站（RS）在蜂窝系统中分配无线电资源的方法包括：基站（BS），经由BS的小区中的RS收集所有移动站（MS）的反馈控制信息; 第一处理，其中根据每个MS的信道状态将MS划分成两组; 第二过程，其中子信道被动态地分配给属于组中每个MS的信道状态良好的组的MS; 以及第三处理，其中通过考虑每RS的资源状态和子信道之间的信道增益，子通道被动态地分配给两个组中属于每个MS的信道状态的组的MS。

    Traffic information providing apparatus and operating method using automatically scrolling display screen
    23.
    发明申请
    Traffic information providing apparatus and operating method using automatically scrolling display screen 审中-公开
    交通信息提供装置和操作方法使用自动滚动显示画面

    公开(公告)号：US20070153704A1

    公开(公告)日：2007-07-05

    申请号：US11606232

    申请日：2006-11-29

    申请人： Hyun-Suk Min ,  Kwang-Soo Kim ,  Jong-Hyun Kim ,  Jin-Won Kim ,  Sung-Chul Yang ,  Hye-Jung Yang ,  Suk-In Jung

    发明人： Hyun-Suk Min ,  Kwang-Soo Kim ,  Jong-Hyun Kim ,  Jin-Won Kim ,  Sung-Chul Yang ,  Hye-Jung Yang ,  Suk-In Jung

    IPC分类号： H04L12/26

    CPC分类号： G08G1/096775 ,  G08G1/0962 ,  G08G1/096716 ,  G08G1/09675

    摘要： The present invention relates to a traffic information providing apparatus and an operating method. The method includes receiving real time traffic information, storing sectional traffic information, dividing screen information currently displayed on the display unit into unit areas, selecting the unit areas sequentially, detecting additional traffic information on the corresponding unit areas from the sectional traffic information stored in the step of storing according to information on the selection, and displaying the additional traffic information. Accordingly, the present invention aims to decrease the danger of traffic accidents and provides convenient selection of search location for real time traffic information to a user.

    摘要翻译： 交通信息提供装置及操作方法技术领域本发明涉及一种交通信息提供装置和操作方法。 该方法包括接收实时交通信息，存储分段交通信息，将显示单元上当前显示的屏幕信息划分为单元区域，依次选择单位区域，从存储在该单元区域中的分段交通信息中检测相应单位区域上的附加交通信息 根据关于选择的信息进行存储的步骤，以及显示附加的交通信息。 因此，本发明旨在减少交通事故的危险，并且为用户提供方便的实时交通信息搜索位置的选择。

    Method and apparatus for testing semiconductor devices using an actual board-type product
    24.
    发明申请
    Method and apparatus for testing semiconductor devices using an actual board-type product 有权
    使用实际板式产品测试半导体器件的方法和装置

    公开(公告)号：US20050057272A1

    公开(公告)日：2005-03-17

    申请号：US10982646

    申请日：2004-11-03

    申请人： Sang-Jun Park ,  Chang-Nyun Kim ,  Hyun-Ho Park ,  Nam-Sik Jeong ,  Jong-Hyun Kim ,  Chung-Koo Yoon

    发明人： Sang-Jun Park ,  Chang-Nyun Kim ,  Hyun-Ho Park ,  Nam-Sik Jeong ,  Jong-Hyun Kim ,  Chung-Koo Yoon

    IPC分类号： G01R31/28 ,  G01R31/319 ,  G11C29/48 ,  G11C29/56 ,  G01R31/26

    CPC分类号： G11C29/48 ,  G01R31/31905 ,  G11C29/56016

    摘要： A method and apparatus for testing semiconductor devices allows devices to be tested under actual operating conditions by interfacing the devices to an actual board-type product. The semiconductor devices are interfaced to the board-type product with a test board that includes a mounting unit such as a socket or pattern of conductive lands that allows the devices being tested can be easily mounted to and removed from the test board with minimal effort and signal degradation. An interface circuit on the test board compensates for environmental differences between the board-type product and the mounting unit. For example, the interface circuit can include a clock distribution circuit, which utilizes a phase locked loop, and a register circuit to compensate for electrical loading caused by the device mounting unit, and to provide the proper timing margins between clock signals and control signals applied to the semiconductor devices. A power control circuit can be used to manipulate the supply voltage applied to the semiconductor devices, thereby providing a voltage margin screening function.

    摘要翻译： 用于测试半导体器件的方法和装置允许通过将器件与实际的板式产品相连接，在实际操作条件下测试器件。 半导体器件与板式产品接口，该测试板包括诸如插座或导电焊盘图案的安装单元，其允许被测试的器件能够以最小的努力容易地安装到测试板并从测试板移除， 信号劣化。 测试板上的接口电路补偿了板式产品和安装单元之间的环境差异。 例如，接口电路可以包括使用锁相环的时钟分配电路和用于补偿由器件安装单元引起的电负载的寄存器电路，并且提供时钟信号和施加的控制信号之间的适当时序余量 到半导体器件。 可以使用功率控制电路来操纵施加到半导体器件的电源电压，从而提供电压裕度屏蔽功能。

    Laplace transform impedance spectrometer and its measurement method
    25.
    发明授权
    Laplace transform impedance spectrometer and its measurement method 失效
    拉普拉斯变换阻抗谱仪及其测量方法

    公开(公告)号：US06687631B2

    公开(公告)日：2004-02-03

    申请号：US10272203

    申请日：2002-10-16

    申请人： Chul-Oh Yoon ,  Yevgen Barsukov ,  Jong-Hyun Kim

    发明人： Chul-Oh Yoon ,  Yevgen Barsukov ,  Jong-Hyun Kim

    IPC分类号： G06F1750

    CPC分类号： G01R31/2839 ,  G01R27/02

    摘要： A method of measuring impedance is based on carrier function Laplace transform. The measurement includes detecting a response signal from a device under test, to which signal an excitation such as a pulse, interrupt or constant load is applied. Resulting data is fitted to a carrier function, selected so as to be capable of providing a good fit and for which an analytical Laplace transform is known, in order to obtain parameters of such function providing best fit. Obtained parameters are further substituted into the analytical expression of Laplace transform of carrier function which is used to calculate a frequency dependent impedance function in the Laplace domain. The resulting impedance function is used for calculating the impedance spectrum in a frequency domain and for calculating the measurement error of the frequency domain impedance spectrum using the standard deviations of the parameters, obtained during fitting of time-domain data.

    摘要翻译： 测量阻抗的方法是基于载波函数拉普拉斯变换。 测量包括检测来自被测器件的响应信号，施加诸如脉冲，中断或恒定负载的激励信号。 所得到的数据被拟合到载体功能，其被选择为能够提供良好的拟合并且已知分析拉普拉斯变换已知，以获得提供最佳拟合的这种功能的参数。 获得的参数被进一步代入载波函数的拉普拉斯变换的解析表达式，其用于计算拉普拉斯域中的频率相关阻抗函数。 所得到的阻抗函数用于计算频域中的阻抗谱，并使用在拟合时域数据期间获得的参数的标准偏差来计算频域阻抗谱的测量误差。

    Method for manufacturing a multi-domain liquid crystal cell
    27.
    发明授权
    Method for manufacturing a multi-domain liquid crystal cell 失效
    多畴液晶单元的制造方法

    公开(公告)号：US06593986B2

    公开(公告)日：2003-07-15

    申请号：US09108229

    申请日：1998-07-01

    申请人： Soon Bum Kwon ,  Jong Hyun Kim ,  Oleg Yaroshchuk ,  Andrey Dyadyusha

    发明人： Soon Bum Kwon ,  Jong Hyun Kim ,  Oleg Yaroshchuk ,  Andrey Dyadyusha

    IPC分类号： G02F11337

    CPC分类号： C08G77/20 ,  G02F1/133753 ,  G02F1/133788

    摘要： A method for fabricating a multi-domain liquid crystal cell is disclosed, wherein first and second alignment directions are formed in first and second portions of an alignment layer provided on a substrate by selectively subjecting the first and second portions to different energy doses of linearly polarized ultraviolet light. Liquid crystal material is then injected between the one substrate and another substrate and into contact with the alignment layer, thereby obtaining a wide viewing angle in the liquid crystal device.

    摘要翻译： 公开了一种制造多畴液晶单元的方法，其中通过选择性地使第一和第二部分经受不同能量的线性极化的第一和第二部分，在设置在基板上的取向层的第一和第二部分中形成第一和第二取向方向 紫外光线。 然后将液晶材料注入到一个基板和另一个基板之间并与取向层接触，从而在液晶装置中获得宽的视角。

    Apparatus for testing semiconductor memory
    29.
    发明授权
    Apparatus for testing semiconductor memory 有权
    半导体存储器测试装置

    公开(公告)号：US06301167B1

    公开(公告)日：2001-10-09

    申请号：US09638385

    申请日：2000-08-12

    申请人： Ill Young Lee ,  Sang Sik Lee ,  Jong Hyun Kim ,  Duk Chun Park ,  Byung Soo Ham ,  Byung Koo Ham

    发明人： Ill Young Lee ,  Sang Sik Lee ,  Jong Hyun Kim ,  Duk Chun Park ,  Byung Soo Ham ,  Byung Koo Ham

    IPC分类号： G11C700

    CPC分类号： G11C29/56

    摘要： An apparatus for testing a semiconductor memory is disclosed, which includes a power control module for varying an output voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module, thus implementing an accurate operation state of an actual mounting environment of a semiconductor memory device by varying and supplying a certain voltage supplied from a power supply unit when testing whether a semiconductor memory device is defective or not using a main board of a computer apparatus.

    摘要翻译： 公开了一种用于测试半导体存储器的装置，其包括用于改变电源单元的输出电压并根据来自主体的CPU（中央处理单元）的功率控制信号向半导体存储器供应的功率控制模块 以及用于将来自主板的CPU的功率控制信号提供给功率控制模块的接口单元，从而通过改变和提供从半导体存储器件提供的一定电压来实现半导体存储器件的实际安装环境的精确操作状态 当使用计算机装置的主板来测试半导体存储器件是否有故障时，电源单元。