ANALYSIS APPARATUS FOR HIGH ENERGY PARTICLE AND ANALYSIS METHOD USING THE SAME
    21.
    发明申请
    ANALYSIS APPARATUS FOR HIGH ENERGY PARTICLE AND ANALYSIS METHOD USING THE SAME 有权
    用于高能粒子的分析装置和使用该方法的分析方法

    公开(公告)号:US20130299706A1

    公开(公告)日:2013-11-14

    申请号:US13873708

    申请日:2013-04-30

    CPC classification number: G01T1/2002 B82Y15/00 G01T1/20

    Abstract: Provided is an analysis apparatus for a high energy particle and an analysis method for a high energy particle. The analysis apparatus for the high energy particle includes a scintillator generating photons with each unique wavelength by the impinging with a plurality of kinds of accelerated high energy particles, a parallel beam converting unit making the photons proceed in parallel to one another, a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength, and a plurality of sensing units arranged on positions where the photons refracted at different angles from the diffraction grating panel reach in a state of being spatially separated, and detecting each of the photons.

    Abstract translation: 提供了一种用于高能量粒子的分析装置和用于高能粒子的分析方法。 用于高能量粒子的分析装置包括闪烁体,其通过与多种加速的高能粒子碰撞而产生具有每个独特波长的光子,使得光子彼此平行地进行的平行光束转换单元,衍射光栅板 使光子彼此平行进行进入,并且根据每个唯一波长以不同的角度折射光子,并且多个感测单元布置在与衍射光栅面板以不同角度折射的光子到达的位置 处于空间分离的状态,并检测每个光子。

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