公开(公告)号：US20050219528A1

公开(公告)日：2005-10-06

申请号：US11155825

申请日：2005-06-16

Applicant: Baoliang Wang

Inventor： Baoliang Wang

IPC: G01J4/00 ,  G01N21/23

CPC classification number: G01N21/23

Abstract: The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams are passed through a selected location of a sample optical element. One of the beams is incident to the sample surface. The characteristics of the beams are detected after passing through the sample, and the information detected is processed to determine the out-of-plane birefringence.

Abstract translation: 本发明涉及透明光学材料样品的平面外双折射性质的精确测量。 两个角度分开的光束通过样品光学元件的选定位置。 梁中的一个入射到样品表面。 在通过样品之后检测光束的特性，并且处理检测到的信息以确定平面外双折射。