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公开(公告)号:US11121166B2
公开(公告)日:2021-09-14
申请号:US16398133
申请日:2019-04-29
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Volume Chien , Yun-Wei Cheng , Zhe-Ju Liu , Kuo-Cheng Lee , Chi-Cherng Jeng , Chuan-Pu Liu
IPC: H01L27/146
Abstract: An image sensor device is provided. The image sensor device includes a semiconductor substrate including a front surface, a back surface opposite to the front surface, and a light-sensing region extending from the front surface into the semiconductor substrate. The image sensor device includes a light-blocking structure in the semiconductor substrate and surrounding the light-sensing region. The light-blocking structure includes a conductive light reflection structure and a light absorption structure, and the light absorption structure is between the conductive light reflection structure and the back surface. The image sensor device includes an insulating layer between the light-blocking structure and the semiconductor substrate.
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公开(公告)号:US20180158851A1
公开(公告)日:2018-06-07
申请号:US15866745
申请日:2018-01-10
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Kuo-Hung Lee , Chia-Pin Cheng , Fu-Cheng Chang , Volume Chien , Ching-Hung Kao
IPC: H01L27/146
CPC classification number: H01L27/1463 , H01L27/14609 , H01L27/14614 , H01L27/1462 , H01L27/14636 , H01L27/14643 , H01L27/14689
Abstract: A semiconductor device is provided. The semiconductor device includes a semiconductor substrate. An isolation feature is disposed in the semiconductor substrate to define a pixel region and a periphery region of the semiconductor substrate. A transistor gate is formed on the semiconductor substrate in the pixel region, in which the transistor gate has a first sidewall and a second sidewall opposite to the first sidewall. A photodiode is disposed in the semiconductor substrate and adjacent to the second sidewall of the transistor gate. A patterned spacer layer is formed on the photodiode and on the transistor gate. The patterned spacer layer includes a first sidewall spacer on the first sidewall of the transistor gate, and a protective structure covering the photodiode and a top surface of the transistor gate.
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