公开(公告)号：US20070103249A1

公开(公告)日：2007-05-10

申请号：US11580188

申请日：2006-10-13

Applicant: Kyong Ha Lee

Inventor： Kyong Ha Lee

IPC: H03L1/00

CPC classification number: G01K7/32 ,  G01K7/346

Abstract: There is provided a temperature detecting apparatus for improving operational characteristics, which vary according to the temperature, of elements in a semiconductor memory device. The temperature detecting apparatus of the present invention includes: a first oscillator that outputs a first oscillating signal in response to a first oscillator reset signal, the first oscillating signal being independent of the temperature; a second oscillator that outputs a second oscillating signal in response to a second oscillator enable signal, the second oscillating signal being dependent on the temperature; a comparator that compares an output pulse of the first oscillator with an output pulse of the second oscillator and then outputs a temperature detection comparison signal; and an output unit that outputs a temperature detection signal in response to an input of the temperature detection comparison signals.

Abstract translation: 提供一种温度检测装置，用于改善半导体存储器件中元件的温度变化的操作特性。 本发明的温度检测装置包括：第一振荡器，响应于第一振荡器复位信号输出第一振荡信号，第一振荡信号独立于温度; 第二振荡器，其响应于第二振荡器使能信号输出第二振荡信号，所述第二振荡信号取决于所述温度; 比较器，将第一振荡器的输出脉冲与第二振荡器的输出脉冲进行比较，然后输出温度检测比较信号; 以及输出单元，其响应于温度检测比较信号的输入而输出温度检测信号。