摘要:
A semiconductor memory device includes a bit line sense amplifier for sensing and amplifying data applied on a bit line; a first driver for driving a pull-up voltage line of the bit line sense amplifier to a voltage applied on a normal driving voltage terminal; an overdriving signal generator for generating an overdriving signal defining an overdriving period in response to an active command; an overdriving control signal generator for receiving the overdriving signal to generate an overdriving control signal for selectively performing an overdriving operation according to a voltage level of an overdriving voltage; and a second driver for driving the normal driving voltage terminal to the overdriving voltage in response to the overdriving control signal.
摘要:
A semiconductor memory device that includes a first high voltage oscillator configured to generate a first control pulse in response to a first enable signal, a level shifter configured to generate a high voltage control pulse by boosting a level of the first control pulse using a source high voltage, and a first high voltage generator configured to generate a high voltage by boosting an external power supply voltage in response to the high voltage control pulse.
摘要:
A circuit for generating a voltage of a semiconductor memory apparatus includes a control unit that outputs a driving control signal in response to an enable signal and a burn-in signal, a first voltage generating unit that generates and outputs a first voltage in response to the enable signal, and a voltage maintaining unit that maintains the first voltage in response to the driving control signal.
摘要:
A semiconductor memory device includes a bit line sense amplifying block that senses and amplifies bit line data. A first driving block drives a pull up power line of the bit line sense amplifying block using a voltage applied to a normal driving voltage terminal. A second driving block drives the normal driving voltage terminal using an over driving voltage. An over driving signal generation block generates an over driving signal that defines an over driving interval in response to an active command. An external power supply voltage level detection block detects a voltage level of the external power supply voltage. A selective output block selectively outputs the over driving signal in response to an output signal of the external power supply voltage level detection block, wherein an output signal of the selective output block controls the second driving block.
摘要:
A voltage sensing circuit is capable of controlling a pumping voltage to be stably generated in a low voltage environment. The voltage sensing circuit includes a current mirror having first and second terminals, a first switching element configured to control current on the first terminal of the current mirror by a reference voltage, a second switching element configured to control current from the second terminal of the current mirror in response to a pumping voltage, and a third switching element configured to control current sources of the first and second switching elements to receive a negative voltage.
摘要:
A semiconductor memory device that includes a first high voltage oscillator configured to generate a first control pulse in response to a first enable signal, a level shifter configured to generate a high voltage control pulse by boosting a level of the first control pulse using a source high voltage, and a first high voltage generator configured to generate a high voltage by boosting an external power supply voltage in response to the high voltage control pulse.
摘要:
A first input unit, coupled to a repair checking node through a first fuse, is for inverting a logic level of the repair checking node in response to a first address. A second input unit, coupled to the repair checking node through a two or more second fuses, is for inverting a logic level of the repair checking node in response to a second address. The number of the second fuses corresponds to a delay time between a transfer path of the first address and a transfer path of the second address. A repair detecting signal generating unit is for generating a repair detecting signal in response to the logic level of the repair checking node. Other embodiments are also described.
摘要:
An internal voltage generator for a semiconductor memory device is provided. The internal voltage generator includes a first reference voltage generator for generating a first reference voltage, a second reference voltage generator for generating a second reference voltage, a core voltage generator for raising a core voltage based on the first reference voltage, and a core voltage discharger for discharging the core voltage depending on the second reference voltage.
摘要:
A semiconductor memory apparatus includes: a driving controller that decodes bank activating signals to generate a plurality of driving control signals, activates some of the driving control signals, and outputs the activated driving signals; and a plurality of internal voltage generators each of which outputs an internal voltage in response to a reference voltage and the corresponding driving control signal and is disposed between two different banks among a plurality of banks.
摘要:
An internal voltage generation circuit includes an internal reference voltage generation unit configured to generate first and second reference voltages, a core voltage generation unit configured to receive the first reference voltage and to generate a core voltage based on the first reference voltage, and a bit line pre-charge voltage generation unit configured to receive the second reference voltage and to generate a bit-line pre-charge voltage based on the second reference voltage.