公开(公告)号：US11002599B2

公开(公告)日：2021-05-11

申请号：US16919876

申请日：2020-07-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： So Young Lee ,  Sang Kyu Kim ,  Kun Sun Eom ,  Joon Hyung Lee

IPC: G06F17/18 ,  G01J3/02 ,  G01J3/28

Abstract: A method of verifying repeatability of a spectroscope that irradiates light to a user sample, detects light reflected from the user sample, and measures spectrum data of the user sample, includes: verifying repeatability of the spectrum data, measured by the spectroscope, based on repeatability verification criteria; and controlling the spectroscope whether or not to remeasure the spectrum data, based on the verifying.

公开(公告)号：US20200340917A1

公开(公告)日：2020-10-29

申请号：US16923608

申请日：2020-07-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyeong Seok JANG ,  Hyun Seok Moon ,  Jae Wook Shim ,  Kun Sun Eom ,  Myoung Hoon Jung

IPC: G01N21/59 ,  G01N21/47

Abstract: A method and an apparatus for analyzing a component of an object are provided. The apparatus includes an image sensor including an optical module, and the optical module includes a light source configured to emit a source light, a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident, and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object. The apparatus further includes a processor configured to calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light, and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient.

公开(公告)号：US20200029870A1

公开(公告)日：2020-01-30

申请号：US16521729

申请日：2019-07-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Myoung Hoon JUNG ,  Kun Sun Eom ,  Hyun Seok Moon ,  Jae Wook Shim ,  Hyeong Seok Jang

IPC: A61B5/145 ,  A61B5/053 ,  A61B5/00 ,  A61B5/0295 ,  A61B5/1455

Abstract: An apparatus and method for measuring a biosignal are provided. The apparatus may include an optical sensor configured to emit light in a measurement region to an object of interest, and receive an optical signal reflected from the object of interest. The apparatus may include a bioelectrical impedance sensor configured to measure a depth-specific bioelectrical impedance in the measurement region of the optical sensor.