Method of manufacturing a semiconductor device
    43.
    发明授权
    Method of manufacturing a semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US6013542A

    公开(公告)日:2000-01-11

    申请号:US717940

    申请日:1996-09-23

    摘要: In a method of manufacturing a semiconductor device, a gate wiring and a source wiring of a thin film transistor in the course of manufacture are connected, and are finally divided, so that it is possible to prevent breakage of a gate insulating film due to influence of plasma at the formation of various insulating films or conductive films. Specifically, openings are formed at every formation of interlayer insulating films to first layer wirings to be finally divided, and dummy electrodes not serving as electrodes are formed in the openings. When patterning a final electrode, openings are further formed in the dummy electrodes, and the first layer wirings are divided through the openings.

    摘要翻译: 在制造半导体器件的方法中,在制造过程中连接薄膜晶体管的栅极布线和源极布​​线,并且最终被分割,从而可以防止由于影响导致的栅极绝缘膜的破裂 的等离子体形成各种绝缘膜或导电膜。 具体地,在每层形成层间绝缘膜时形成开口,以将第一层布线最终分割,并且在开口中形成不用作电极的虚拟电极。 当对最终电极进行构图时,在虚拟电极中进一步形成开口,并且第一层布线通过开口分开。

    Method for fabricating semiconductor thin film
    44.
    再颁专利
    Method for fabricating semiconductor thin film 有权
    制造半导体薄膜的方法

    公开(公告)号:USRE43450E1

    公开(公告)日:2012-06-05

    申请号:US10678139

    申请日:2003-10-06

    摘要: An object of the present invention is to provide a technology of reducing a nickel element in the silicon film which is crystallized by using nickel. An extremely small amount of nickel is introduced into an amorphous silicon film which is formed on the glass substrate. Then this amorphous silicon film is crystallized by heating. At this time, the nickel element remains in the crystallized silicon film. Then an amorphous silicon film is formed on the surface of the silicon film crystallized with the action of nickel. Then the amorphous silicon film is further heat treated. By carrying out this heat treatment, the nickel element is dispersed from the crystallized silicon film into the amorphous silicon film with the result that the nickel density in the crystallized silicon film is lowered.

    摘要翻译: 本发明的一个目的是提供一种通过使用镍结晶的还原硅膜中的镍元素的技术。 将非常少量的镍引入形成在玻璃基板上的非晶硅膜中。 然后通过加热使非晶硅膜结晶。 此时,镍元素残留在结晶硅膜中。 然后在镍的作用下,在硅膜的表面上形成非晶硅膜。 然后将非晶硅膜进一步热处理。 通过进行这种热处理,镍元素从结晶硅膜分散到非晶硅膜中,结果是结晶硅膜中的镍密度降低。

    Method for fabricating semiconductor thin film
    48.
    发明授权
    Method for fabricating semiconductor thin film 失效
    制造半导体薄膜的方法

    公开(公告)号:US6071766A

    公开(公告)日:2000-06-06

    申请号:US115838

    申请日:1998-07-15

    摘要: An object of the present invention is to provide a technology of reducing a nickel element in the silicon film which is crystallized by using nickel. An extremely small amount of nickel is introduced into an amorphous silicon film which is formed on the glass substrate. Then this amorphous silicon film is crystallized by heating. At this time, the nickel element remains in the crystallized silicon film. Then an amorphous silicon film is formed on the surface of the silicon film crystallized with the action of nickel. Then the amorphous silicon film is further heat treated. By carrying out this heat treatment, the nickel element is dispersed from the crystallized silicon film into the amorphous silicon film with the result that the nickel density in the crystallized silicon film is lowered.

    摘要翻译: 本发明的一个目的是提供一种通过使用镍结晶的还原硅膜中的镍元素的技术。 将非常少量的镍引入形成在玻璃基板上的非晶硅膜中。 然后通过加热使非晶硅膜结晶。 此时,镍元素残留在结晶硅膜中。 然后在镍的作用下,在硅膜的表面上形成非晶硅膜。 然后将非晶硅膜进一步热处理。 通过进行这种热处理,镍元素从结晶硅膜分散到非晶硅膜中,结果是结晶硅膜中的镍密度降低。

    Method for crystallizing an amorphous silicon thin film
    49.
    发明授权
    Method for crystallizing an amorphous silicon thin film 失效
    使非晶硅薄膜结晶的方法

    公开(公告)号:US6048758A

    公开(公告)日:2000-04-11

    申请号:US789193

    申请日:1997-01-23

    CPC分类号: H01L29/66757 H01L21/2022

    摘要: A little amount of nickel is introduced into an amorphous silicon film formed on a glass substrate to crystallize the amorphous silicon film by heating. In this situation, nickel elements remain in a crystallized silicon film. An amorphous silicon film is formed on the surface of the crystallized silicon film and then subjected to a heat treatment. With this heat treatment, the nickel elements are diffused in the amorphous silicon film, thereby being capable of lowering the concentration of nickel in the crystallized silicon film.

    摘要翻译: 将少量的镍引入形成在玻璃基板上的非晶硅膜中,通过加热使非晶硅膜结晶。 在这种情况下,镍元素保留在结晶硅膜中。 在结晶硅膜的表面上形成非晶硅膜,然后进行热处理。 通过这种热处理,镍元素在非晶硅膜中扩散,从而能够降低结晶硅膜中的镍浓度。