摘要:
A position measurement device measures the position of a position measurement mark formed on the lower surface of a reticle, thereby measuring the position of the reticle. A position measurement device measures the position of the position measurement mark formed on the lower surface of a lower lid, thereby measuring the position of the lower lid. The relative displacement of the reticle and lower lid is known when the position of the reticle and the position of the lower lid are known. Therefore, when the lower lid having the reticle loaded thereon is carried with a carrying device and set in an exposure device, the stop position of the lower lid is determined by taking this displacement into account. As a result, the reticle can be correctly set in the exposure device.
摘要:
Improvements in a semiconductor wafer container including improvements in side protection to the wafers, improved cover design to minimize rotation, a simplified top cover orientation mechanism and an improved bottom holding mechanism for automation. The side protection to the wafers is with multiple staggered inner and outer walls. The improved cover design improves alignment of the top and bottom housings and minimizes rotation of the housings in transit or motion. The housings have a recessed tab ramp feature with bi-directional locking that also increases the rigidity of the containment device when the two housings are assembled. The latching mechanism is located in a protective latch well that minimizes accidental opening of the latch(s). The improved bottom holding mechanism for automation is an integrated feature that is molded into the bottom housing and not assembled in a secondary operation.
摘要:
A dual containment pod having an outer pod and an inner pod that provides support structure and environmental control means. The inner pod includes a base having a flat, polished surface with protrusions upon which the reticle seats and providing a gap between the reticle and the polished surface. The gap separates the reticle from the flat, polished surface of the base and is dimensioned to inhibit migration of particles into the gap, thereby preventing contamination of sensitive surfaces of the wafer or reticle. The top cover of the inner pod seats on the polished surface proximate a periphery of the base. Moveable reticle engaging pins on the top cover of the inner pod are engaged by the top cover of the outer container when the inner pod is assembled inside the outer pod providing reticle restraint.
摘要:
A probe card container having a main case consisting of upper and lower case portions for storing therein a prove card, a handle provided on one side surface of the main case, one or more members for preventing the movement of the main case provided on a mounting surface of the main case, and one or more rollers for assisting the movement of the main case provided on the mounting surface or a corner formed between the mounting surface and the other side surface of the main case so as to project obliquely downward from the corner.
摘要:
A process cap for protecting a top side of a flat substrate includes a cap and a seal. The seal is circumferentially arranged on a circumferential rim of the cap such that the cap effects a liquid-tight and vapor-tight closure between cap and flat substrate when the cap is fitted on a top side of the flat substrate. The process cap touches the flat substrate only in a circumferential rim area of the same, when it is fitted on the flat substrate and defines a fluid-tight space without any openings between process cap and flat substrate.
摘要:
A dual containment pod having an outer pod and an inner pod that provides support structure and environmental control means. The inner pod includes a base having a flat, polished surface with protrusions upon which the reticle seats and providing a gap between the reticle and the polished surface. The gap separates the reticle from the flat, polished surface of the base and is dimensioned to inhibit migration of particles into the gap, thereby preventing contamination of sensitive surfaces of the wafer or reticle. The top cover of the inner pod seats on the polished surface proximate a periphery of the base. Moveable reticle engaging pins on the top cover of the inner pod are engaged by the top cover of the outer container when the inner pod is assembled inside the outer pod providing reticle restraint.
摘要:
A method of processing a microfeature workpiece generally includes depositing a first conducting layer, at least partially reducing oxides on the first conducting layer to provide a reduced first conducting layer, and exposing the reduced first conducting layer to a substantially oxygen-free environment to provide a passivated first conducting layer. A microfeature workpiece generally includes a first conducting layer, a monolayer directly on the first conducting layer, and a second conducting layer.
摘要:
In a first aspect, a loadport is provided. The loadport has a plate adapted to couple to a door of a substrate carrier to open the substrate carrier wherein the plate includes a first opening adapted to couple to a first port in the door of the substrate carrier on a first side of the plate and to couple to a gas source on a second side of the plate, and wherein the loadport is adapted to allow a flow of gas into the substrate carrier via the first opening in the plate. Methods of purging substrate carriers are provided, as are numerous other aspects.
摘要:
A packaging system for holding an object is provided. An outer container comprising a top, a bottom, and a plurality of sides is provided. An inner container comprising a top, a bottom, and a plurality of sides is provided. A top floater is attached to the top of the outer container. The top of the inner container is attached to the top floater. A bottom floater is attached to the bottom of the outer container. The bottom of the inner container is attached to the bottom floater. An internal support is attached to the inner container.
摘要:
Systems and methods to protect a mask from being contaminated by airborne particles are described. The systems and methods include providing a reticle secured in a two-part cover. The two part cover includes a removable protection device used to protect the reticle from contaminants. The cover can be held inside a pod or box that can be used to transport the cover through a lithography system from an atmospheric section to a vacuum section. While in the vacuum section, the removable cover can be moved during an exposure process during which a pattern on the reticle can be formed on a wafer.