Fluid filtration for substrate processing chamber
    51.
    发明授权
    Fluid filtration for substrate processing chamber 失效
    衬底处理室的流体过滤

    公开(公告)号:US08382885B2

    公开(公告)日:2013-02-26

    申请号:US12914822

    申请日:2010-10-28

    IPC分类号: B01D53/02

    摘要: A filter for filtering a fluid in a substrate processing apparatus comprises first and second stages that are connected to one another. A delivery system provides a vaporized liquid to the filter. The first stage of the filter comprises a basic compound, and the second stage of the filter comprises a desiccant. A second filter comprises a permeation filter with permeable membrane to filter the fluid. Methods of filtering the fluid to reduce formation of undesirable process residues using the filter(s) are also described.

    摘要翻译: 用于过滤衬底处理设备中的流体的过滤器包括彼此连接的第一和第二阶段。 输送系统向过滤器提供蒸发的液体。 过滤器的第一阶段包括碱性化合物,并且过滤器的第二阶段包括干燥剂。 第二过滤器包括具有可渗透膜的渗透过滤器以过滤流体。 还描述了使用过滤器过滤流体以减少不期望的工艺残余物的形成的方法。

    Apparatus and method for exposing a substrate to UV radiation using asymmetric reflectors
    55.
    发明授权
    Apparatus and method for exposing a substrate to UV radiation using asymmetric reflectors 有权
    使用不对称反射器将基板暴露于UV辐射的装置和方法

    公开(公告)号:US07692171B2

    公开(公告)日:2010-04-06

    申请号:US11686900

    申请日:2007-03-15

    IPC分类号: H01J49/00 H01J49/44

    摘要: Embodiments of the invention relate generally to an ultraviolet (UV) cure chamber for curing a dielectric material disposed on a substrate and to methods of curing dielectric materials using UV radiation. A substrate processing tool according to one embodiment comprises a body defining a substrate processing region; a substrate support adapted to support a substrate within the substrate processing region; an ultraviolet radiation lamp spaced apart from the substrate support, the lamp configured to transmit ultraviolet radiation to a substrate positioned on the substrate support; and a motor operatively coupled to rotate at least one of the ultraviolet radiation lamp or substrate support at least 180 degrees relative to each other. The substrate processing tool may further comprise one or more reflectors adapted to generate a flood pattern of ultraviolet radiation over the substrate that has complementary high and low intensity areas which combine to generate a substantially uniform irradiance pattern if rotated. Other embodiments are also disclosed.

    摘要翻译: 本发明的实施方案一般涉及用于固化设置在基底上的介电材料的紫外(UV)固化室和使用UV辐射固化电介质材料的方法。 根据一个实施例的基板处理工具包括限定基板处理区域的主体; 衬底支撑件,适于支撑衬底处理区域内的衬底; 与衬底支撑件间隔开的紫外线辐射灯,所述灯被配置为将紫外线辐射透射到位于所述衬底支撑件上的衬底; 以及可操作地耦合以使所述紫外线辐射灯或衬底支撑体中的至少一个相对于彼此旋转至少180度的电动机。 衬底处理工具还可以包括一个或多个反射器,其适于在衬底上产生具有互补的高和低强度区域的紫外线辐射的泛化图案,其结合以在旋转时产生基本上均匀的辐照度图案。 还公开了其他实施例。

    High efficiency UV curing system
    56.
    发明授权
    High efficiency UV curing system 有权
    高效UV固化系统

    公开(公告)号:US07663121B2

    公开(公告)日:2010-02-16

    申请号:US11424368

    申请日:2006-06-15

    IPC分类号: G01N23/00

    摘要: An ultraviolet (UV) cure chamber enables curing a dielectric material disposed on a substrate and in situ cleaning thereof. A tandem process chamber provides two separate and adjacent process regions defined by a body covered with a lid having windows aligned respectively above each process region. One or more UV bulbs per process region that are covered by housings coupled to the lid emit UV light directed through the windows onto substrates located within the process regions. The UV bulbs can be an array of light emitting diodes or bulbs utilizing a source such as microwave or radio frequency. The UV light can be pulsed during a cure process. Using oxygen radical/ozone generated remotely and/or in-situ accomplishes cleaning of the chamber. Use of lamp arrays, relative motion of the substrate and lamp head, and real-time modification of lamp reflector shape and/or position can enhance uniformity of substrate illumination.

    摘要翻译: 紫外线(UV)固化室可固化设置在基底上的电介质材料并进行原位清洁。 串联处理室提供由覆盖有盖的主体限定的两个单独的和相邻的过程区域,所述盖子具有分别位于每个处理区域上方的窗口。 每个处理区域的一个或多个UV灯泡被耦合到盖的壳体覆盖,将通过窗口的UV光发射到位于处理区域内的衬底上。 UV灯泡可以是利用诸如微波或射频的源的发光二极管或灯泡阵列。 紫外光可以在固化过程中被脉冲。 使用远程生成的氧自由基/臭氧和/或原位实现清洁室。 灯阵列的使用,基板和灯头的相对运动以及灯反射器形状和/或位置的实时修改可以增强基板照明的均匀性。

    Decreasing the etch rate of silicon nitride by carbon addition
    60.
    发明授权
    Decreasing the etch rate of silicon nitride by carbon addition 有权
    通过碳添加降低氮化硅的蚀刻速率

    公开(公告)号:US07501355B2

    公开(公告)日:2009-03-10

    申请号:US11478273

    申请日:2006-06-29

    IPC分类号: H01L21/31 H01L21/469

    摘要: Methods for forming silicon nitride hard masks are provided. The silicon nitride hard masks include carbon-doped silicon nitride layers and undoped silicon nitride layers. Carbon-doped silicon nitride layers that are deposited from a mixture comprising a carbon source compound, a silicon source compound, and a nitrogen source in the presence of RF power are provided. Also provided are methods of UV post-treating silicon nitride layers to provide silicon nitride hard masks. The carbon-doped silicon nitride layers and UV post-treated silicon nitride layers have desirable wet etch rates and dry etch rates for hard mask layers.

    摘要翻译: 提供了形成氮化硅硬掩模的方法。 氮化硅硬掩模包括碳掺杂的氮化硅层和未掺杂的氮化硅层。 提供了在RF功率存在下由包含碳源化合物,硅源化合物和氮源的混合物沉积的碳掺杂氮化硅层。 还提供了UV后处理氮化硅层以提供氮化硅硬掩模的方法。 碳掺杂的氮化硅层和UV后处理的氮化硅层对于硬掩模层具有期望的湿蚀刻速率和干蚀刻速率。