公开(公告)号：US5045780A

公开(公告)日：1991-09-03

申请号：US445979

申请日：1989-12-04

申请人： Mark A. Swart

发明人： Mark A. Swart

IPC分类号： G01R1/067 ,  H05K3/00 ,  H05K13/08

CPC分类号： G01R1/06722

摘要： An electrical test probe comprises an outer barrel, and a plunger extending axially through the barrel and having an outer portion extending through an open end of the barrel and terminating in a contact tip outside the barrel for contact with a test point. The plunger is supported within the barrel by spring pressure for allowing spring biased relative axial motion between the plunger and the barrel. The plunger is rotatable about its axis during relative axial motion between the plunger and barrel against the bias of the spring so that rotation of the plunger causes enhanced contact between the probe and a test point on a circuit board under test. The contact tip comprises a head having a substantially continuous outer blade edge extending around a periphery of the head and positioned thereon to engage the test point on the board, and at least one further substantially continuous inner blade edge inside the outer blade edge and positioned preferably concentrically with respect to the outer blade edge also for contact with the test point on the board. The inner and outer blade edges are able to spin about the axis of the plunger during their contact with the test point without causing the plunger to bind in the barrel as the head is rotated during contact with an irregularly shaped test point on the board.