Semiconductor memory device having a plurality of banks
    71.
    发明授权
    Semiconductor memory device having a plurality of banks 失效
    具有多个存储体的半导体存储器件

    公开(公告)号:US5818785A

    公开(公告)日:1998-10-06

    申请号:US764886

    申请日:1996-12-16

    申请人: Shigeo Ohshima

    发明人: Shigeo Ohshima

    IPC分类号: G11C7/10 G11C8/12 G11C8/00

    CPC分类号: G11C7/10 G11C7/1051 G11C8/12

    摘要: A semiconductor memory device having a plurality of banks of memory cells is provided. The device has a data line provided in each of the banks for coupling to one of the memory cells in the corresponding bank. A common data line is shared by the banks, and is selectively coupled to one of the data lines through switches. Additionally, an amplifier is coupled to the common data line to amplify data read from a selected memory cell, and an I/O line is coupled to the amplifier to transmit the amplified data to an outer section. In the device, one of the banks of memory cells is selected by a bank select signal. Therefore, the amplifier is shared by the banks. Further the length of the I/O line can be shortened so that the load on the amplifier can be reduced. Accordingly, chip area is decreased and the speed of the memory device is improved.

    摘要翻译: 提供具有多个存储单元组的半导体存储器件。 该设备具有在每个存储体中提供的数据线,用于耦合到相应存储体中的一个存储单元。 公共数据线由存储体共享,并且通过开关选择性地耦合到数据线之一。 此外,放大器耦合到公共数据线以放大从所选择的存储器单元读取的数据,并且I / O线耦合到放大器以将放大的数据传输到外部部分。 在器件中,存储单元组之一由存储体选择信号选择。 因此,放大器由银行共享。 此外,可以缩短I / O线的长度,从而可以减小放大器的负载。 因此,芯片面积减小,存储器件的速度提高。

    Semiconductor memory circuit equipped with a column addressing circuit
having a shift register
    72.
    发明授权
    Semiconductor memory circuit equipped with a column addressing circuit having a shift register 失效
    配备有具有移位寄存器的列寻址电路的半导体存储器电路

    公开(公告)号:US5777946A

    公开(公告)日:1998-07-07

    申请号:US770404

    申请日:1996-12-20

    CPC分类号: G11C8/04

    摘要: The present invention provides a semiconductor memory circuit capable of high-speed access to a predetermined column portion by a simplified high-speed addressing circuit. The memory circuit in a DRAM is such that a portion of a column addressing circuit normally comprising a counter constitutes a shift register in a column addressing circuit at a preceding stage of a column address buffer so that a plurality of address signal wrappings are realized for accessing the predetermined column portion.

    摘要翻译: 本发明提供一种能够通过简化的高速寻址电路高速访问预定列部分的半导体存储器电路。 DRAM中的存储器电路使得通常包括计数器的列寻址电路的一部分在列地址缓冲器的前级构成列寻址电路中的移位寄存器,从而实现多个地址信号包装以进行访问 预定列部分。

    Semiconductor integrated circuit
    73.
    发明授权
    Semiconductor integrated circuit 失效
    半导体集成电路

    公开(公告)号:US5703381A

    公开(公告)日:1997-12-30

    申请号:US557731

    申请日:1995-11-13

    CPC分类号: H01L22/34 G01R31/2884

    摘要: A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.

    摘要翻译: 半导体集成电路包括具有主表面的矩形半导体芯片,形成在半导体芯片的主表面的周边部分中的多个焊盘,用于连接到外部连接构件,多个集成电路的电路元件形成在 除了形成多个焊盘的区域之外的主表面的区域,以及至少一个特征评估电路元件,其通过共享形成的杂质掺杂区域而与集成电路的多个电路元件中的至少一个连接 所述至少一个电路元件的一部分与所述集成电路的所述至少一个电路元件在所述主表面的除了形成所述多个焊盘的外围部分之外的区域中。

    Semiconductor memory device
    74.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US5287306A

    公开(公告)日:1994-02-15

    申请号:US718449

    申请日:1991-06-20

    CPC分类号: G11C5/14 G11C7/1051

    摘要: A semiconductor memory device includes a first power source having a non-ground potential V.sub.cc1 terminal and a ground potential V.sub.ss1 terminal. The internal circuit is supplied with power from the first power source. The first power source is dedicated to the internal circuit. The internal circuit selects a memory cell of a memory cell array in accordance with an inputted address. The internal circuit has a first output terminal and a second output terminal the first output terminal outputs one of a pair of potential V.sub.cc1 and V.sub.ss1 and the second output terminal outputs the other of the pair in accordance with the data in the selected memory cell. A second power source has a non-ground potential V.sub.cc2 terminal and a ground potential V.sub.ss2 terminal. The output circuit is supplied with power from the second power source which is dedicated to the output circuit. The output circuit has first and second transistors serially connected between the V.sub.cc2 terminal and V.sub.ss2. The control terminals of the first and second transistors are connected to the first and second output terminals. A third transistor is connected between an interconnection between the first and second transistors connected to a data output from which data is externally outputted and the first output terminal, and the control terminal of the third transistor being connected to the second output terminal.

    摘要翻译: 半导体存储器件包括具有非接地电位Vcc1端子和接地电位Vss1端子的第一电源。 内部电路由第一个电源供电。 第一个电源专用于内部电路。 内部电路根据输入的地址选择存储单元阵列的存储单元。 内部电路具有第一输出端子和第二输出端子,第一输出端子输出一对电位Vcc1和Vss1中的一个,第二输出端子根据所选存储单元中的数据输出该对中的另一个。 第二电源具有非接地电位Vcc2端子和接地电位Vss2端子。 输出电路由专用于输出电路的第二电源供电。 输出电路具有串联连接在Vcc2端子和Vss2之间的第一和第二晶体管。 第一和第二晶体管的控制端子连接到第一和第二输出端子。 第三晶体管连接在与外部输出数据的数据输出端连接的第一和第二晶体管之间的互连和第一输出端子之间,第三晶体管的控制端子连接到第二输出端子。

    Semiconductor memory device
    75.
    发明授权

    公开(公告)号:US5251180A

    公开(公告)日:1993-10-05

    申请号:US799988

    申请日:1991-11-29

    申请人: Shigeo Ohshima

    发明人: Shigeo Ohshima

    摘要: In the semiconductor memory composed of divided dynamic memory cell arrays, when a drive signal is supplied to a word line selected by a row decoder, data stored at the memory cells connected to the word line are transferred to bit lines, respectively. A change in potential at the bit line pair is amplified by the sense amplifier to completely read the data. To prevent the bit line pairs from being sensed erroneously due to fluctuation of the timings at which the word line driving signals are generated in the divided cell arrays, a bit line sense signal is generated a predetermined delay time after all the word line driving signals have been generated, in order to drive all the sense amplifiers simultaneously, so that data can be definitely read from the memory cells to the bit lines. To detect that all the word line driving signals have been generated, a drive signal detection section is connected between word line driving circuits for all the divided cell arrays and a delay circuit connected to a sense amplifier driving circuit.

    Serially-accessed type memory device for providing an interleaved data
read operation
    76.
    发明授权
    Serially-accessed type memory device for providing an interleaved data read operation 失效
    用于提供交错数据读取操作的串行访问型存储器件

    公开(公告)号:US5237532A

    公开(公告)日:1993-08-17

    申请号:US794668

    申请日:1991-11-18

    IPC分类号: G11C7/10

    CPC分类号: G11C7/103

    摘要: In a semiconductor memory having a column-direction serial access function, two systems of circuits for selecting and fetching data are provided. A circuit operation is alternately performed such that one system is set up while the other system is accessed, thereby reducing a cycle time for a data selecting/fetching operation.

    摘要翻译: 在具有列方向串行访问功能的半导体存储器中,提供用于选择和取出数据的两个电路系统。 交替执行电路操作,使得在另一个系统被访问时建立一个系统,从而减少数据选择/取出操作的周期时间。

    Semiconductor memory device
    77.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US5229971A

    公开(公告)日:1993-07-20

    申请号:US613001

    申请日:1990-11-15

    CPC分类号: G11C7/00 G11C11/4096

    摘要: A semiconductor memory device comprises a memory cell array, a row decoder, a column decoder, registers and a control unit. The control unit allows the write operational mode of the column decoder to switch. In the ordinary write operational mode, data in the n registers are written into the active memory cells of the n memory cell columns in on column block selected by the column decoder, respectively. In the block write mode, data in the n registers are written into active memory cells of the n memory cell columns in the 2.sup.N column blocks selected by the column decoder, respectively. Another semiconductor memory device comprises N memory units. Each memory unit comprises a memory cell array, a row decoder, a first column decoder, a second column decoder, a data input terminal, registers and a control circuit. The control circuit is operative to allow the operational mode. When the device is in the ordinary mode, data latched in the register is written into one memory cell connected to one word line selected by the row decoder of one column selected by the first column decoder of column blocks selected by the second decoder. While when the device is in the block write mode, data latched in the register is written at the same time into j memory cells connected to one word line selected by the row decoder of column blocks selected by the second column decoder.