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219 条记录 (耗时 0.034 秒)

    Fluid-impermeable composite hose
    71.
    发明授权
    Fluid-impermeable composite hose 失效
    流体不可渗透复合软管

    公开(公告)号：US06390140B2

    公开(公告)日：2002-05-21

    申请号：US09781321

    申请日：2001-02-13

    申请人： Nobuaki Niki ,  Kunihiro Noba ,  Yuji Takagi

    发明人： Nobuaki Niki ,  Kunihiro Noba ,  Yuji Takagi

    IPC分类号： F16L1110

    CPC分类号： F16L11/085

    摘要： A fluid-impermeable composite hose has a wall including a laminated layer formed by longitudinally lapping a laminated sheet which contains a metallic foil, or a metallic layer formed by vapor deposition. The laminated layer is bound with thread wound about it at a density not exceeding 20%, and bound to an extent forming constrictions therein if required. The thread prevents the deformation in cross section of the hose and the separation of the overlapping edge portions of the laminated sheet which might otherwise be caused by the bending resistance of the laminated sheet. The constrictions improve the flexibility of the hose.

    摘要翻译： 流体不可渗透的复合软管具有壁，其包括通过纵向研磨包含金属箔的层叠片或通过气相沉积形成的金属层而形成的层叠层。 层压层以不超过20％的密度缠绕在其周围，并且如果需要则结合到其中形成收缩的程度。 螺纹防止软管的横截面变形，层压片的重叠边缘部的分离，否则可能由层压片的抗弯曲性引起。 收缩提高了软管的灵活性。

    Information recording/reproducing apparatus for handling defective sectors on an optical disk
    77.
    发明授权
    Information recording/reproducing apparatus for handling defective sectors on an optical disk 失效
    用于处理光盘上的缺陷扇区的信息记录/再现装置

    公开(公告)号：US4833663A

    公开(公告)日：1989-05-23

    申请号：US3820

    申请日：1987-01-16

    申请人： Isao Satoh ,  Makoto Ichinose ,  Yoshihisa Fukushima ,  Yuzuru Kuroki ,  Yuji Takagi

    发明人： Isao Satoh ,  Makoto Ichinose ,  Yoshihisa Fukushima ,  Yuzuru Kuroki ,  Yuji Takagi

    IPC分类号： G11B19/04 ,  G11B27/034 ,  G11B27/036 ,  G11B27/30

    CPC分类号： G11B27/30 ,  G11B19/04 ,  G11B27/036 ,  G11B2220/20 ,  G11B2220/216 ,  G11B27/034

    摘要： Disclosed is an information recording/reproducing apparatus which uses a rewritable recording medium having a sector structure, and in which a data writing gate signal and a data erasing gate signal are reproduced on the basis of an ID detection signal of a target sector, while a data reading gate signal and a marking gate signal are produced on the basis of the ID detection signal of the target sector or on the basis of an ID detection signal of a sector located N sectors before the target one, so that when data is to be renewed in a specific sector from which no ID detection signal can be obtained, marking is performed in the specific sector on the basis of an ID detection signal of a sector located N sectors before the specific sector and new data are rewritten into a substitutive sector, whereby it is possible to perform data erasing and data recording in a target sector with high reliability and high positional accuracy and it is possible to shorten gaps respectively in front and rear of a data field to thereby make it possible to efficiently use a data area.

    摘要翻译： 公开了一种使用具有扇区结构的可重写记录介质的信息记录/再现装置，其中基于目标扇区的ID检测信号再现数据写入门信号和数据擦除门信号，而 基于目标扇区的ID检测信号或基于在目标扇区之前的N个扇区的扇区的ID检测信号生成数据读取门信号和标记门信号，使得当数据为 在特定扇区中被更新，在该特定扇区中不能获得ID检测信号，基于位于特定扇区之前的N个扇区的扇区的ID检测信号和新数据被重写为替代扇区，在特定扇区中执行标记， 从而可以以高可靠性和高位置精度在目标扇区中执行数据擦除和数据记录，并且可以分别缩短前端和 从而能够有效地使用数据区域。

    Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review tool
    78.
    发明授权
    Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review tool 有权
    审查缺陷选择处理方法，缺陷审查方法，审查缺陷选择处理工具和缺陷审查工具

    公开(公告)号：US08675949B2

    公开(公告)日：2014-03-18

    申请号：US13266800

    申请日：2010-03-25

    申请人： Yuji Takagi ,  Minoru Harada ,  Yuichi Hamamura

    发明人： Yuji Takagi ,  Minoru Harada ,  Yuichi Hamamura

    IPC分类号： G06K9/00

    CPC分类号： G01N21/9501 ,  G01N21/956 ,  G01N2021/8867 ,  H01L22/12 ,  H01L22/20

    摘要： The present invention relates to semiconductor inspection and provides a technology capable of efficiently detecting a systematic defect. In the present system, with regard to the process (S7, S8) of matching hot spot (HS) points that can be simulated in advance and defect points obtained as a result of a visual inspection each other and the unmatched defect points, a process (S6, S9) of classifying the defect points into groups based on similarity of pattern layout at the defect points to determine the defects belonging to a pattern layout where defects frequently occur, thereby reliably detecting the systematic defect. Also, with a process (S11) of acquiring an uneven distribution in a defect occurrence distribution on a wafer, the systematic defect occurring due to topography of the wafer can also be detected.

    摘要翻译： 本发明涉及半导体检查，并且提供能够有效地检测系统缺陷的技术。 在本系统中，关于可以预先模拟的热点（HS）点和作为目视检查的结果获得的缺陷点与不匹配的缺陷点的处理（S7，S8），处理 （S6，S9），根据缺陷点的图案布局的相似度将缺陷点分类成组，以确定属于频繁发生缺陷的图案布局的缺陷，从而可靠地检测系统缺陷。 此外，通过获取晶片上的缺陷发生分布中的不均匀分布的处理（S11），也可以检测由于晶片的形貌而发生的系统缺陷。

    DEFECT CLASSIFICATION METHOD, AND DEFECT CLASSIFICATION SYSTEM
    79.
    发明申请
    DEFECT CLASSIFICATION METHOD, AND DEFECT CLASSIFICATION SYSTEM 有权
    缺陷分类方法和缺陷分类系统

    公开(公告)号：US20140072204A1

    公开(公告)日：2014-03-13

    申请号：US14112105

    申请日：2012-04-16

    申请人： Yohei Minekawa ,  Yuji Takagi ,  Minoru Harada ,  Takehiro Hirai ,  Ryo Nakagaki

    发明人： Yohei Minekawa ,  Yuji Takagi ,  Minoru Harada ,  Takehiro Hirai ,  Ryo Nakagaki

    IPC分类号： G06T7/00 ,  G06K9/62

    CPC分类号： G06T7/001 ,  G01N21/9501 ,  G01N23/225 ,  G01N2223/421 ,  G01N2223/611 ,  G01N2223/646 ,  G06K9/6267 ,  G06T5/00 ,  G06T2207/10061 ,  G06T2207/30148 ,  H01L22/12 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

    摘要： In automatic defect classification, a classification recipe must be set for each defect observation device. If a plurality of devices operate at the same stage, the classification class in the classification recipes must be the same. Problems have arisen whereby differences occur in the classification class in different devices when a new classification recipe is created. This defect classification system has a classification recipe storage unit; an information specification unit, the stage of a stored image, and device information. A corresponding defect specification unit specifies images of the same type of defect from images obtained from different image pickup devices at the same stage. An image conversion unit converts the images obtained from the different image pickup devices at the same stage into comparable similar images; and a recipe update unit records the classification classes in the classification recipes corresponding to the specified images of the same type of defect.

    摘要翻译： 在自动缺陷分类中，必须为每个缺陷观察装置设定分类处方。 如果多个设备在同一阶段进行操作，则分类配方中的分类等级必须相同。 当创建新的分类配方时，出现了在不同装置中的分类等级中发生差异的问题。 该缺陷分类系统具有分类配方存储单元; 信息指定单元，存储图像的级和设备信息。 相应的缺陷指定单元从在相同阶段从不同图像拾取装置获得的图像中指定相同类型的缺陷的图像。 图像转换单元将从相同阶段的不同图像拾取装置获得的图像转换成可比较的相似图像; 并且配方更新单元将分类类别记录在与相同类型的缺陷的指定图像相对应的分类配方中。