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166 条记录 (耗时 0.035 秒)

    Plasma display panel
    71.
    发明授权
    Plasma display panel 失效
    等离子显示面板

    公开(公告)号：US08179041B2

    公开(公告)日：2012-05-15

    申请号：US12863679

    申请日：2008-09-04

    申请人： Hideaki Yanagita ,  Masahiro Watabe ,  Takahiko Kato ,  Takashi Naito

    发明人： Hideaki Yanagita ,  Masahiro Watabe ,  Takahiko Kato ,  Takashi Naito

    IPC分类号： H01J1/62

    CPC分类号： H01J11/26 ,  H01J11/14 ,  H01J2211/225

    摘要： A plasma display panel (PDP) includes a first plate, and a second plate disposed to face the first plate via a discharge space and providing barrier ribs. A plurality of first electrodes and a plurality of second electrodes extending in a first direction, and a dielectric layer covering the first electrodes and the second electrodes are provided on the first plate. A plurality of address electrodes extending in a second direction, and a protective layer covering the dielectric layer and the address electrodes and exposing at least a part of the protective layer to the discharge space are provided on the dielectric layer. The address electrodes are made up by including a conductive layer formed by either one of aluminum and an alloy containing aluminum and copper and by not including a layer of a simple substance of copper.

    摘要翻译： 等离子体显示面板（PDP）包括第一板和设置成经由放电空间与第一板对置并提供阻挡肋的第二板。 多个第一电极和沿第一方向延伸的多个第二电极以及覆盖第一电极和第二电极的电介质层设置在第一板上。 在电介质层上设置有沿第二方向延伸的多个寻址电极以及覆盖电介质层和寻址电极并将至少一部分保护层暴露于放电空间的保护层。 地址电极通过包括由铝和含有铝和铜的合金中的任一种形成的导电层并且不包括铜的单质的材料构成。

    SEMICONDUCTOR WAFER TEST APPARATUS
    74.
    发明申请
    SEMICONDUCTOR WAFER TEST APPARATUS 有权
    半导体波长测试仪

    公开(公告)号：US20110316571A1

    公开(公告)日：2011-12-29

    申请号：US13148971

    申请日：2009-02-12

    申请人： Toshiyuki Kiyokawa ,  Takashi Naito

    发明人： Toshiyuki Kiyokawa ,  Takashi Naito

    IPC分类号： G01R31/00

    CPC分类号： G01R31/2893 ,  G01R31/2886 ,  G01R31/2887 ,  G01R31/2891 ,  H01L21/683

    摘要： An apparatus includes a plurality of test heads to which probe cards are electrically connected; a wafer tray which is able to hold a semiconductor wafer; and an alignment apparatus which positions the semiconductor wafer held on the wafer tray relatively with respect to the probe card so as to make the wafer tray face the probe card. The wafer tray has a pressure reducing mechanism which pulls the wafer tray toward the probe card. The alignment apparatus is configured to be able to move along the array direction of the test heads.

    摘要翻译： 一种装置包括多个测试头，探针卡电连接到该测试头上; 能够保持半导体晶片的晶片托盘; 以及对准装置，其将保持在晶片托盘上的半导体晶片相对于探针卡相对定位，以使晶片托盘面向探针卡。 晶片托盘具有将晶片托盘朝向探针卡拉动的减压机构。 对准装置被构造成能够沿着测试头的排列方向移动。

    IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND COMPUTER READABLE STORAGE MEDIUM
    77.
    发明申请
    IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND COMPUTER READABLE STORAGE MEDIUM 有权
    图像处理设备，图像处理方法和计算机可读存储介质

    公开(公告)号：US20110052050A1

    公开(公告)日：2011-03-03

    申请号：US12858705

    申请日：2010-08-18

    申请人： Hui CAO ,  Takashi Naito

    发明人： Hui CAO ,  Takashi Naito

    IPC分类号： G06K9/46 ,  G06K9/00

    CPC分类号： G06K9/4642 ,  G06K9/6857 ,  G06T7/44 ,  G06T2207/20016 ,  G06T2207/20021 ,  G06T2207/30196

    摘要： A feature vector computation section 24 of an image processing apparatus computes a feature vector expressing gradient histograms for each of plural child regions that have been further partitioned from plural parent regions partitioned from a discrimination-subject image. A feature relative vector computation section 26 of the image processing apparatus computes for each parent region a feature relative vector expressing relative values computed from respective combinations of the same or different elements across feature vectors computed for each child region, and relative values computed from respective combinations of the same or different elements within one of the feature vectors. A discrimination section 30 of the image processing apparatus, based on the feature relative vector computed for each parent region, discriminates whether or not the image subject to processing is an image in which a processing target object appears.

    摘要翻译： 图像处理装置的特征矢量计算部分24计算对于从分辨对象图像分割的多个母区域进一步分割的多个子区域中的每一个的表达梯度直方图的特征向量。 图像处理装置的特征相对矢量计算部分26针对每个父区域计算表示从针对每个子区域计算的特征向量的相同或不同元素的相应组合计算的相对值的特征相对向量，以及根据各个组合计算的相对值 在特征向量之一内的相同或不同的元素。 图像处理装置的识别部分30基于针对每个父区域计算的特征相对向量，判别出处理对象的图像是否是处理目标对象出现的图像。