Abstract:
Wide band infrared spectroscopy of molecules in a variety of media is provided by apparatuses, materials and methods that allow real time spectroscopic view of molecules such as proteins in native environments. Precisely machined sample holders and algorithms are used to reduce spectroscopic effects of solvents such as water. Multiple samples can be analyzed simultaneously. Embodiments provide secondary and tertiary structure information of substances such as proteins based on molecular interactions that can be monitored and manipulated in real time.
Abstract:
A dual illumination system is disclosed for use with an imaging apparatus. The imaging apparatus defines a light-tight imaging compartment with an interior wall having a view port extending into the imaging compartment. This view port enables data acquisition of a biological specimen contained in the imaging compartment. The dual illumination system includes a first illumination assembly configured to direct structured light onto a first side of the specimen to enable structured light and surface topography measurements thereof. A second illumination assembly then directs light at the specimen wherein diffused fluorescent light emanates from a surface thereof for receipt through the view port to acquire fluorescence data of the specimen. The combination of structured light imaging and fluorescence imaging enables 3D diffuse tomographic reconstructions of fluorescent probe location and concentration.
Abstract:
Time efficient methodology for investigating a sample system using electromagnetic wavelengths which are not absorbed by oxygen and/or water vapor during evacuation or purging of a substantially enclosed space in which is present the sample system, followed by using wavelengths which are absorbed by oxygen and/or water vapor after the evacuation or purging is sufficiently completed.
Abstract:
A macroscopic fluorescence illumination assembly is provided for use with an a imaging apparatus with a light-tight imaging compartment. The imaging apparatus includes an interior wall defining a view port extending into the imaging compartment to enable viewing of a specimen contained therein. The illumination assembly includes a specimen support surface sized and dimensioned for receipt in the imaging compartment, and oriented to face toward the view port of the imaging apparatus. The support surface is substantially opaque and defines a window portion that enables the passage of light there through. The window portion is selectively sized and dimensioned such that the specimen, when supported atop the support surface, can be positioned and seated over the window portion in a manner forming a light-tight seal substantially there between. The illumination assembly further includes an excitation light source, and a bundle of fiber optic strands having proximal ends thereof in optical communication with the light source. The distal ends of the strands terminate proximate the window portion of the support surface. The distal ends each emit a respective beam of light originating from the light source which are then collectively directed toward the window portion and into a bottom side of the specimen wherein the diffused light passes there through and exits a topside thereof for receipt through the view port to view the fluorescence of the specimen.
Abstract:
A fluorescence illumination system is provided for use with an imaging apparatus that defines a light-tight imaging compartment. The fluorescence illumination system includes a trans-illumination component configured to direct excitation light into a first surface of the specimen wherein diffused light emanates from a second surface thereof for receipt through the view port to acquire fluorescence data of the specimen. Further, the fluorescence illumination system includes an epi-illumination component configured to direct excitation light onto a third surface of the specimen wherein the diffused light exits the third surface thereof for receipt through the view port to acquire fluorescence data of the specimen.
Abstract:
A system and method for detecting chamber leakage by measuring the reflectivity of an oxidized thin film. In a preferred embodiment, a method of detecting leaks in a chamber includes providing a first monitor workpiece, placing the first monitor workpiece in the chamber, and forming at least one film on the first monitor workpiece. The reflectivity of the least one film of the first monitor workpiece is measured, wherein the reflectivity indicates whether there are leaks in the at least one seal of the chamber. In another embodiment, the method includes providing a second monitor workpiece, placing the second monitor workpiece in the chamber, and forming at least one film on the second monitor workpiece. The reflectivity of the at least one film of the second monitor workpiece is measured, and the second monitor workpiece film reflectivity is compared to the first monitor workpiece film reflectivity.
Abstract:
A method for improving the measurement of semiconductor wafers is disclosed. In the past, the repeatability of measurements was adversely affected due to the unpredictable growth of a layer of contamination over the intentionally deposited dielectric layers. Repeatability can be enhanced by removing this contamination layer prior to measurement. This contamination layer can be effectively removed in a non-destructive fashion by subjecting the wafer to a cleaning step. In one embodiment, the cleaning is performed by exposing the wafer to microwave radiation. Alternatively, the wafer can be cleaned with a radiant heat source. These two cleaning modalities can be used alone or in combination with each other or in combination with other cleaning modalities. The cleaning step may be carried out in air, an inert atmosphere or a vacuum. Once the cleaning has been performed, the wafer can be measured using any number of known optical measurement systems.
Abstract:
A non-dispersive infrared (NDIR) multi-gas analyzer has an optical element that is positioned with respect to the axis of incident IR radiation such that it passes nearly all of the IR energy within a narrow band pass to one detector and reflects nearly all of the IR energy outside the narrow band pass to another detector. Thus, the optical element simultaneously functions both as a narrow band pass filter and a beam splitter, which transmits nearly all the IR energy within a band pass and reflects nearly all the IR energy outside the band pass. Additionally, the separation of the incoming energy can be achieved without an extended roll off. This allows using a reference transmission band that is very close to the absorption band of the gases of interest. It more specifically allows using a reference transmission band that is located between the absorption bands for hydrocarbons and carbon dioxide in an infrared analyzer that uses beam splitters.