Abstract:
An endoscopic suture tool is provided to minimize extra-corporeal exposure of the suture to bacteria and to minimize the possibility of suture entanglement with external trocars and other instruments. The suture tool has a holder with a protrubing hub for accepting a standard suture reel and an orifice through which the suture feeds into and through the lumen of an extension member releasably carried by the holder. Adjacent the distal end of the extension member, a slot is located in the extension member for captively and releasably holding the free end of the suture.
Abstract:
The invention relates to a instrument for laparoscopic surgery which permits the operating surgeon to irrigate or suction the operative area while performing electrocautery or laser hemostasis and dissection of body tissue with the same instrument.The invention also relates to a laparoscopic tool for evacuating free stones or blood clots from the operating area which are to large to be suctioned from the body cavity or to remove gallstones from a gallbladder which has been distended by stones and cannot be retrieved through an umbillical sheath.
Abstract:
A tachometer particularly adapted for operation as a rotational velocity feedback transducer is provided. First and second proximity detectors are used to monitor orthogonal positions of an irregular surface portion of a rotating shaft and provide x and y signals that are substantially in quadrature. The x and y signals are differentiated with respect to time to provide differential signals that are representative of dx/dt and dy/dt, respectively. Signals representative of products x dy/dt and y dx/dt are generated from the x signal and the differential signal dy/dt, and the y signal and the differential signal dx/dt, respectively. A signal representative of algebraic sum x dy/dt-y dx/dt is generated from the signals representative of products x dy/dt and y dx/dt. A signal representative of quotient of (x dy/dt-y dx/dt) divided by the square of the displacement r.sup.2 of the irregular surface portion is generated from the signal representative of algebraic sum (x dy/dt-y dx/dt) which signal is representative of the rotational velocity of the rotating shaft.
Abstract translation:提供特别适合作为旋转速度反馈换能器操作的转速计。 第一和第二接近检测器用于监测旋转轴的不规则表面部分的正交位置,并提供基本上正交的x和y信号。 x和y信号相对于时间差分,以分别提供代表dx / dt和dy / dt的差分信号。 产生代表x dy / dt和y dx / dt的信号分别由x信号和差分信号dy / dt以及y信号和差分信号dx / dt产生。 从代表乘积x dy / dt和y dx / dt的信号产生代表代数和x dy / dt-y dx / dt的信号。 代表代数和(x dy / dt-y dx / dt)的信号代表(x dy / dt-y dx / dt)的商除以不规则表面部分的位移r2的平方的信号, 该信号代表旋转轴的旋转速度。
Abstract:
In an X-Y addressable workpiece positioner the workpiece to be positioned, such as a semiconductive wafer to be aligned with a mask image, is coupled to move with a work stage moveable in X and Y direction and having a two-dimensional array of positioning indicia affixed thereto for movement therewith. An enlarged image of a portion of the positioning array is projected onto a relatively stationary sensor stage to derive an output determinative of the X and Y coordinates of the positioning array relative to the position of the sensor. The sensed X and Y coordinates of the positioning array are compared with the X and Y coordinates of a reference positioning address to derive an error output. The work stage is moved in response to the error output for causing the workpiece to be positioned to the reference address. In a preferred embodiment of a mask aligner, the approximately stationary sensing stage is moved relative to the enlarged image of the positioning array for interpolating the X and Y coordinates of the sensed address. A viewing system is arranged for permitting the operator to superimpose the image of a pattern on the reference addressed position of the semiconductive wafer with a mask image. The sensing stage is moved by the operator to obtain precise registration of the images, thereby zeroing the reference position address to the interpolated value. The machine then sequentially steps the interpolated (zeroed) reference position address by predetermined increments, related to the size mask pattern to be projected onto the wafer, to cause the wafer to be sequentially exposed to the mask pattern in different regions thereof.
Abstract:
A steering assembly for multiplying steering torque and motion applied from a steering wheel of a vehicle by fixed and selectively varying ratios, respectively. The applied steering torque and motion are coupled via an input shaft to a sun gear of a planetary gear set. Supplementary torque and steering motion are generated by a servo motor which is coupled to a ring gear of the planetary gear set via an irreversible differential planetary gear set. Rotational motion of the input shaft is determined and rotational motion of the servo motor is controlled as a selected function of the rotational motion of the input shaft. Actual rotational motion of the servo motor is measured and additional rotational motion of the servo motor is terminated if the actual rotational motion of the servo motor does not substantially match the selected rotational motion. A set of planetary gears mounted in a planetary carrier receives combined output torque and rotational motion from both the sun and ring gears. The planetary carrier is coupled to an output shaft which delivers the output torque and rotational position to a steering gear.
Abstract:
An improved solid state commutated linear motor with an ironless multiphase armature is disclosed which has a magnetic field array having periodic alternating polarity, an ironless multiphase armature, and a solid state commutating system for driving a moving element and positioning it with respect to a reference element. In one embodiment, the magnetic field array is elongated and fixedly located with respect to the reference element, and the ironless multiphase armature is fixedly located with respect to the moving element. In a second embodiment, the ironless multiphase armature is elongated and fixedly located with respect to the reference element, and the magnetic field array is fixedly located with respect to the moving element. The magnetic field array is generated by an array of spaced alternate north and south poled magnets having an inter-pole distance L. The ironless multiphase armature is comprised of coils having a center-line span equal to the inter-pole distance L, wherein the coils are interleaved and staggered to form the various phases. Solid state switches are used to commutate the phases by first faulting a phase as it approaches a space between magnetic poles and then reversing the connections of that phase as it leaves the space between the magnetic poles.
Abstract:
An improved gas bearing X-Y-.theta. stage assembly is disclosed which has a base, a stage element with three retroreflectors fixedly mounted thereto, and a control system for controlling the movement of the stage element. The control system is made up of three interferometer measuring systems for measuring parameters associated with changes in position of the three retroreflectors as the stage element moves. Also, the control system includes a transport system for moving the three interferometers to maintain optical coupling between the interferometers and retroreflectors. In addition, the control system includes control circuitry for causing the stage element to move to a preselected X-Y-.theta. position in response to signals from the interferometer measuring systems. In one embodiment, a first interferometer of a first one of the three interferometer measuring systems is moved linearly by the transport system on a gas bearing slide in a direction parallel to the Y-axis of the system, while second and third interferometers of the other two interferometer measuring systems are moved together on a second gas bearing slide parallel to the X-axis of the system.
Abstract:
An improved multi-axis gas bearing stage assembly is disclosed which has a base, an intermediate stage element, a stage, and a control system for controlling the movement of the intermediate stage element and the stage. The control system includes first and second Y-axes positioning sub-systems for differentially positioning first and second ends of the intermediate stage element along first and second Y-axes of motion, with respect to the base, and an X.sub.i -axis positioning sub-system for positioning the stage along an X.sub.i -axis of motion, with respect to the intermediate stage element. In one embodiment, the positioning sub-systems comprise motor-encoder driven leadscrews. In a second embodiment, the positioning sub-systems comprise linear motors, measuring scales, and read heads. In a third embodiment, the positioning sub-systems comprise linear motors and interferometer measuring systems. A method of achieving orthogonality between the Y- and X.sub.i -axes that features an orthogonality alignment standard is disclosed. In a another embodiment, the differential positioning capability of the first and second Y-axes is utilized for positioning the intermediate stage element along a .theta.-axis about a Z-direction orthogonal to both the Y- and X-axes, and a method of rotationally aligning a semiconductive wafer is disclosed. In other embodiments, two methods of kinematically positioning the improved multi-axis stage assembly within a utilization apparatus are disclosed. In another embodiment, three retroreflectors of an interferometer measuring system are mounted directly on a wafer chuck, located on the stage, and a transport system moves three interferometers rotationally, to maintain optical coupling between the interferometers and the retroreflectors. In still another embodiment, five retroreflectors are mounted directly on the wafer chuck and a five axis interferometer measuring system is utilized to eliminate all Abbe offset measurement errors in the position of a semiconductive wafer, placed upon the wafer chuck, along the X, Y, and .theta.-axes of motion.
Abstract:
A projection lens and a source of exposure light are employed for projecting an image of a reticle onto a first reference mark or a semiconductive wafer, both of which are movably supported in the image plane of the projection lens. Optical apparatus, including a source of nonexposure light and the projection lens, is provided for imaging a second adjustable reference mark onto the first reference mark or the semiconductive wafer to facilitate use of the projection lens in aligning a semiconductive wafer covered with a photoresist opaque to exposure light.
Abstract:
A flexible coupling is provided transmitting torque and thrust loads between parallel misaligned shafts, but does not permit any nonparallel misalignment between the shafts. The coupling comprises members that are attached to the shafts, each of which has two parallel bendable arms. The arms are nested and attached to a central rigid member located between the arms.