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公开(公告)号:US4339201A
公开(公告)日:1982-07-13
申请号:US136285
申请日:1980-04-01
申请人: Makoto Yasuda , Seiichi Murayama , Masaru Ito
发明人: Makoto Yasuda , Seiichi Murayama , Masaru Ito
CPC分类号: G01N21/74
摘要: Disclosed is a system for controlling the temperature of an atomizer for an element analyzer, said system comprising a birefringent prism arranged on the optical axis of radiant light emitted out of the atomizer, and a light sensor for detecting the radiant light which passes through said birefringent prism.
摘要翻译: 公开了一种用于控制元件分析仪的雾化器的温度的系统,所述系统包括布置在从雾化器发射的辐射光的光轴上的双折射棱镜和用于检测通过所述双折射的辐射光的光传感器 棱镜
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公开(公告)号:US4298284A
公开(公告)日:1981-11-03
申请号:US969268
申请日:1978-12-14
申请人: Manabu Yamamoto , Seiichi Murayama , Masaru Ito , Kounosuke Oishi
发明人: Manabu Yamamoto , Seiichi Murayama , Masaru Ito , Kounosuke Oishi
IPC分类号: G01N21/21
CPC分类号: G01N21/21 , G01N2021/218
摘要: In measuring a change in the polarization state of light attributed to magnetooptic anisotropy, a means for generating optic anisotropy is added to a light source or onto an optical path extending from the light source to a polarization analyzer. This allows high precision analysis of the polarization state of light emergent from the polarization analyzer.
摘要翻译: 在测量归因于磁光各向异性的光的偏振态的变化时,将光学各向异性的装置添加到光源或从光源延伸到偏振分析器的光路上。 这允许从偏振分析仪出射的光的偏振状态的高精度分析。
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公开(公告)号:US4171912A
公开(公告)日:1979-10-23
申请号:US837802
申请日:1977-09-29
申请人: Masaru Ito , Seiichi Murayama
发明人: Masaru Ito , Seiichi Murayama
CPC分类号: G01N21/3103
摘要: In an element analyzer exploiting a magneto-optic effect, when a concentration of the element in a sample material to be detected is high, two peaks are produced in the wave form of the signal obtained during the measurement. The present invention provides a discriminating technique to indicate whether two peaks appear in the wave form of the signal, with the object of reducing the error produced in the element analysis exploiting a magneto-optic effect.
摘要翻译: 在利用磁光效应的元件分析仪中,当要检测的样品材料中的元素的浓度高时,在测量期间获得的信号的波形中产生两个峰。 本发明提供一种鉴别技术,用于指示信号的波形中是否出现两个峰值,目的是减少利用磁光效应的元素分析中产生的误差。
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