摘要:
A memory array is provided that includes a transistor having two active gates sharing a source, a drain, and a channel of the transistor. One of the active gates may be coupled to a volatile memory portion of a memory cell, such as a DRAM cell, and the other active gate may be coupled to a non-volatile memory portion, for example, a charge storage node such as a SONOS cell. Methods of operating the memory array are provided that include transferring data from the volatile memory portions to the non-volatile memory portions, transferring data from the non-volatile memory portions to the volatile memory portions, and erasing the non-volatile memory portions of a row of memory cells.
摘要:
Embodiments are described for a voltage compensated sense amplifier. One such sense amplifier includes a pair of digit line nodes respectively coupled to a pair of transistors. A first pair of switches are adapted to cross-couple the gates of the transistors to the respective digit line node and a second pair of switches are adapted to couple the gates of the transistors to a voltage supply. The first and second pair of switches are coupled to respective gates of the transistors independent of the pair of transistors being respectively coupled to the digit line nodes.
摘要:
Sense amplifiers and methods for precharging are disclosed, including a sense amplifier having a pair of cross-coupled complementary transistor inverters, and a pair of transistors, each one of the pair of transistors coupled to a respective one of the complementary transistor inverters and a voltage. The sense amplifier further includes a capacitance coupled between the pair of transistors. One method for precharging includes coupling input nodes of the sense amplifier to a precharge voltage, coupling the input nodes of the sense amplifier together, and coupling a resistance to each transistor of a cross-coupled pair to set a voltage threshold (VT) mismatch compensation voltage for each transistor. The voltage difference between the VT mismatch compensation voltage of each transistor is stored.
摘要:
A memory array is provided that includes a transistor having two active gates sharing a source, a drain, and a channel of the transistor. One of the active gates may be coupled to a volatile memory portion of a memory cell, such as a DRAM cell, and the other active gate may be coupled to a non-volatile memory portion, for example, a charge storage node such as a SONOS cell. Methods of operating the memory array are provided that include transferring data from the volatile memory portions to the non-volatile memory portions, transferring data from the non-volatile memory portions to the volatile memory portions, and erasing the non-volatile memory portions of a row of memory cells.
摘要:
A system and method for sensing a data state stored by a memory cell that includes coupling a first digit line and a second digit line to a precharge voltage and further coupling a memory cell to the first digit line. At least one digit line other than the first and second digit lines is driven to a reference voltage level and the at least one digit line is coupled to the second digit line to establish a reference voltage in the second digit line. A voltage differential is sensed between the first digit line and the second digit line, and a data state based on the voltage differential is latched in response.
摘要:
A system and method for sensing a data state stored by a memory cell that includes coupling a first digit line and a second digit line to a precharge voltage and further coupling a memory cell to the first digit line. At least one digit line other than the first and second digit lines is driven to a reference voltage level and the at least one digit line is coupled to the second digit line to establish a reference voltage in the second digit line. A voltage differential is sensed between the first digit line and the second digit line, and a data state based on the voltage differential is latched in response.
摘要:
A memory device includes isolation trenches that are formed generally parallel to and along associated strips of active area. A conductive bit line is recessed within each isolation trench such that the uppermost surface of the bit line is recessed below the uppermost surface of the base substrate. A bit line contact strap electrically couples the bit line to the active area both along a vertical dimension of the bit line strap and along a horizontal dimension across the uppermost surface of the base substrate.
摘要:
A synchronous mirror delay includes a ring oscillator that generates a plurality of tap clock signals with one tap clock signal being designated an oscillator clock signal. In response to an input clock signal, a model delay line generates a model delayed clock signal having a model delay relative to the input clock signal. A coarse delay circuit generates a coarse delay count responsive to the oscillator, input, and model delayed clock signals, and activates a coarse delay enable signal responsive to the delay count being equal to a reference count value. A fine delay circuit latches the tap clock signals and develops a fine delay from the latched signals, and activates a fine delay enable signal having the fine delay in response to the coarse delay enable signal. An output circuit generates a delayed clock signal responsive to the coarse and fine delay enable signals going active.
摘要:
A synchronous mirror delay (SMD)includes a model delay line that is coupled to a bi-directional delay line. In operation, an initial edge an input clock signal is applied through the model delay line to the bi-directional delay line. The SMD thereafter operates in a forward delay mode to alternately operate the bi-directional delay line in a forward mode and a backward mode to propagate the initial edge of the input clock signal through the bi-directional delay line and delay the initial edge of the input clock signal by a forward delay. In response to a subsequent edge of the input clock signal, the SMD mirrors the propagation of the input clock signal through the bi-directional delay line during the forward mode and further delay the initial edge of the input clock signal by a backward delay that is substantially equal to the forward delay.
摘要:
A switch level simulation system includes a netlister, a cross-coupled device detector, a cross-coupled device transformer and a switch level simulator. The user provides a circuit a design to the netlister, which generates a netlist of the circuit. The cross-coupled device detector searches the netlist to find all of the cross-coupled devices in the circuit design. The cross-coupled device detector also determines whether the cross-coupled device has a “rail” node directly connected an external voltage source line. The cross-coupled device transformer transforms each cross-coupled device having a rail node into a transformed cross-coupled device by inserting in the netlist a device at the rail node mirroring the enable device. The mirror device allows the transformed cross-coupled device to provide a high impedance state to emulate the meta-stable state of the cross-coupled device during switch level simulation. The switch level simulator then performs simulations using the netlist with the transformed cross-coupled devices. This technique avoids the need to construct behavioral models of the cross-coupled devices, significantly reducing the engineering resources needed to model cross-coupled devices, while maintaining the accuracy of the switch level simulation.