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公开(公告)号:US11355443B2
公开(公告)日:2022-06-07
申请号:US16515417
申请日:2019-07-18
申请人: Invensas Corporation
发明人: Shaowu Huang , Javier A. Delacruz
IPC分类号: H01L23/538 , H01L21/48 , H01L23/498 , H01L23/00 , H01L25/065
摘要: Dielets on flexible and stretchable packaging for microelectronics are provided. Configurations of flexible, stretchable, and twistable microelectronic packages are achieved by rendering chip layouts, including processors and memories, in distributed collections of dielets implemented on flexible and/or stretchable media. High-density communication between the dielets is achieved with various direct-bonding or hybrid bonding techniques that achieve high conductor count and very fine pitch on flexible substrates. An example process uses high-density interconnects direct-bonded or hybrid bonded between standard interfaces of dielets to create a flexible microelectronics package. In another example, a process uses high-density interconnections direct-bonded between native interconnects of the dielets to create the flexible microelectronics packages, without the standard interfaces.
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公开(公告)号:US20220150184A1
公开(公告)日:2022-05-12
申请号:US17583872
申请日:2022-01-25
申请人: Invensas Corporation
发明人: Javier A. DeLaCruz , Belgacem Haba , Rajesh Katkar
IPC分类号: H04L49/109
摘要: The technology relates to a system on chip (SoC). The SoC may include a plurality of network layers which may assist electrical communications either horizontally or vertically among components from different device layers. In one embodiment, a system on chip (SoC) includes a plurality of network layers, each network layer including one or more routers, and more than one device layers, each of the plurality of network layers respectively bonded to one of the device layers. In another embodiment, a method for forming a system on chip (SoC) includes forming a plurality of network layers in an interconnect, wherein each network layer is bonded to an active surface of a respective device layer in a plurality of device layer.
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公开(公告)号:US11189595B2
公开(公告)日:2021-11-30
申请号:US16999601
申请日:2020-08-21
申请人: Invensas Corporation
发明人: Ellis Chau , Reynaldo Co , Roseann Alatorre , Philip Damberg , Wei-Shun Wang , Se Young Yang
IPC分类号: H01L23/00 , H01L23/31 , H01L23/498 , H01L21/56 , H01L25/10 , H01L25/00 , H01L23/495 , H01L21/48 , H01L23/367 , H01L23/433 , H01L25/065 , H05K3/34
摘要: A microelectronic package includes a substrate having a first surface. A microelectronic element overlies the first surface. Electrically conductive elements are exposed at the first surface of the substrate, at least some of which are electrically connected to the microelectronic element. The package includes wire bonds having bases bonded to respective ones of the conductive elements and ends remote from the substrate and remote from the bases. The ends of the wire bonds are defined on tips of the wire bonds, and the wire bonds define respective first diameters between the bases and the tips thereof. The tips have at least one dimension that is smaller than the respective first diameters of the wire bonds. A dielectric encapsulation layer covers portions of the wire bonds, and unencapsulated portions of the wire bonds are defined by portions of the wire bonds, including the ends, are uncovered by the encapsulation layer.
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公开(公告)号:US20210193624A1
公开(公告)日:2021-06-24
申请号:US17122149
申请日:2020-12-15
申请人: Invensas Corporation
IPC分类号: H01L25/065 , H01L25/18 , H01L23/00
摘要: A memory structure is provided, including a NAND block comprising a plurality of oxide layers, the plurality of layers forming a staircase structure at a first edge of the NAND block, a plurality of vias disposed on the staircase structure of NAND block, two or more of plurality of vias terminating along a same plane, a plurality of first bonding interconnects disposed on the plurality of vias, a plurality of bitlines extending across the NAND block, and a plurality of second bonding interconnects disposed along the bitlines. The memory structure may be stacked on another of the memory structure to form a stacked memory device.
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公开(公告)号:US20210118864A1
公开(公告)日:2021-04-22
申请号:US17070253
申请日:2020-10-14
申请人: Invensas Corporation
IPC分类号: H01L25/18 , H01L25/065 , H01L23/00
摘要: The present disclosure provides for a stacked memory combining RAM and one or more layers of NVM, such as NAND. For example, a first layer of RAM, such as DRAM, is coupled to multiple consecutive layers of NAND using direct bonding interconnect (DBI®). Serialization and overhead that exists in periphery of the NVM may be stripped to manage the data stored therein. The resulting connections between the RAM and the NVM are high bandwidth, high pincount interconnects. Interconnects between each of the one or more layers of NVM are also very dense.
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公开(公告)号:US20210111161A1
公开(公告)日:2021-04-15
申请号:US17107710
申请日:2020-11-30
申请人: Invensas Corporation
发明人: Stephen MOREIN
IPC分类号: H01L25/065 , H01L29/08 , H01L23/528 , H01L29/45 , H01L21/8234 , H01L25/00 , H01L21/02 , H01L29/66 , H01L21/768 , H01L21/321 , H01L27/105
摘要: Techniques are disclosed herein for creating metal BLs in stacked wafer memory. Using techniques described herein, metal BLs are created on a bottom surface of a wafer. The metal BLs can be created using different processes. In some configurations, a salicide process is utilized. In other configurations, a damascene process is utilized. Using metal reduces the resistance of the BLs as compared to using non-metal diffused BLs. In some configurations, wafers are stacked and bonded together to form three-dimensional memory structures.
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公开(公告)号:US10818629B2
公开(公告)日:2020-10-27
申请号:US16127696
申请日:2018-09-11
申请人: Invensas Corporation
发明人: Cyprian Emeka Uzoh , Rajesh Katkar
IPC分类号: H01L23/48 , H01L23/00 , H01L25/00 , H01L21/683 , H01L25/065 , H05K3/34
摘要: Representative implementations of devices and techniques provide interconnect structures and components for coupling various carriers, printed circuit board (PCB) components, integrated circuit (IC) dice, and the like, using tall and/or fine pitch physical connections. Multiple layers of conductive structures or materials are arranged to form the interconnect structures and components. Nonwettable barriers may be used with one or more of the layers to form a shape, including a pitch of one or more of the layers.
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公开(公告)号:US10790222B2
公开(公告)日:2020-09-29
申请号:US16361116
申请日:2019-03-21
申请人: Invensas Corporation
发明人: Javier A. Delacruz , Belgacem Haba , Wael Zohni , Liang Wang , Akash Agrawal
IPC分类号: H01L21/48 , H01L23/498 , H01L23/00
摘要: A microelectronic assembly including first and second laminated microelectronic elements is provided. A patterned bonding layer is disposed on a face of each of the first and second laminated microelectronic elements. The patterned bonding layers are mechanically and electrically bonded to form the microelectronic assembly.
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公开(公告)号:US20200212013A1
公开(公告)日:2020-07-02
申请号:US16814175
申请日:2020-03-10
申请人: Invensas Corporation
IPC分类号: H01L25/065 , H01L23/00 , H01L25/00 , H01L21/78
摘要: A three-dimensional stacking technique performed in a wafer-to-wafer fashion reducing the machine movement in production. The wafers are processed with metallic traces and stacked before dicing into separate die stacks. The traces of each layer of the stacks are interconnected via electroless plating.
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公开(公告)号:US10692842B2
公开(公告)日:2020-06-23
申请号:US16148325
申请日:2018-10-01
申请人: Invensas Corporation
IPC分类号: H01L25/065 , H01L25/07 , H01L23/00 , H01L23/498 , H01L25/10 , H05K1/18 , H01L23/31 , G11C5/06 , H01L25/075 , G06F1/18 , H01L23/367 , H01L23/538 , H01L23/50 , H05K1/02 , H01L23/36 , H01L23/48 , H01L23/525 , H01L21/56
摘要: A microelectronic assembly (300) or system (1500) includes at least one microelectronic package (100) having a microelectronic element (130) mounted face up above a first surface (108) of a substrate (102), one or more columns (138, 140) of contacts (132) extending in a first direction (142) along the microelectronic element front face. Columns (104A, 105B, 107A, 107B) of terminals (105 107) exposed at a second surface (110) of the substrate extend in the first direction. First terminals (105) exposed at surface (110) in a central region (112) thereof having width (152) not more than three and one-half times a minimum pitch (150) of the columns of terminals can be configured to carry address information usable to determine an addressable memory location. An axial plane of the microelectronic element can intersect the central region.
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