Thin loudspeaker
    1.
    发明授权

    公开(公告)号:US12133059B2

    公开(公告)日:2024-10-29

    申请号:US17952918

    申请日:2022-09-26

    CPC分类号: H04R7/04 H04R7/22 H04R9/025

    摘要: A thin loudspeaker is provided. The thin loudspeaker includes a small magnet and a thin coil diaphragm. The coil diaphragm has a plurality of planar coils and a membrane. The membrane has a plurality of laminated substrates. The planar coils are interconnected, stacked, and respectively formed on the substrates. The magnet is disposed to contact the underside of the coil diaphragm along the common central axis of the planar coils.

    WIDE-FIELD SPECTRAL IMAGING SYSTEM
    5.
    发明公开

    公开(公告)号:US20240230406A1

    公开(公告)日:2024-07-11

    申请号:US18393636

    申请日:2023-12-21

    摘要: The present invention provides a wide-filed spectral imaging system including a laser generator, a wavelength adjustment module, an objective lens, and a single-pixel imaging and a spectral separating module. The laser generator is configured to generate a laser excitation beam. The wavelength adjustment module is configured to disperse the laser excitation beam into a plurality of beams of different wavelengths. The objective lens is configured to focus the plurality of beams of different wavelengths on a sample to excite molecules under test in the sample and generate an emission light. The single-pixel imaging and spectral separating module is configured to generate a series of patterns and modulate the emission light with the series of patterns to generate a diffracted beam. The single-pixel imaging and spectral separating module further disperses the wavelength of the diffracted beam, collects light signals of the expanded diffracted beam, and performs a spectral image reconstruction.

    DETECTION METHOD FOR LOW-CONCENTRATION METAL IONS IN SOLUTION

    公开(公告)号:US20240085367A1

    公开(公告)日:2024-03-14

    申请号:US18238518

    申请日:2023-08-27

    发明人: WEN-YIH CHEN

    IPC分类号: G01N27/414 G01N1/28

    摘要: The present invention discloses a detection method for low-concentration metal ions in solution, which avoids damage of strong acids and strong alkalis to the field effect transistors (FET) while using a control solution as a reference for calibration. By adjusting the electronic signals (resistance, inductance, current, voltage, etc.) generated by the solution to be tested and the control solution to be the same, the voltage difference therebetween is employed to quantitively infer the metal ions concentration of the solution to be tested.

    OPTICAL WAVEFRONT MEASURING DEVICE AND MEASURING METHOD THEREOF

    公开(公告)号:US20240085268A1

    公开(公告)日:2024-03-14

    申请号:US18368004

    申请日:2023-09-13

    发明人: Chao-Wen Liang

    IPC分类号: G01M11/02

    CPC分类号: G01M11/0214

    摘要: A device and method for measuring the decentration of optics under test is provided. The device comprises a rotational spindle for loading and rotating the optics under test, a light source module for providing incident light beam to the optics under test, and a wavefront sensor for receiving testing light beams with different exposures from the optics under test at a plurality of azimuthal directions.