摘要:
A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.
摘要:
A rail fastening apparatus fastens an inner stock rail in a railway slide chair assembly. The apparatus includes a base plate. The base plate has on one face a rail seat region on which the inner stock rail sits when the slide chair assembly is in use. A resilient rail fastening clip restrains the inner stock rail. A locating means locates the rail fastening clip in a first position. A loading means vertically deflects the clip so as to produce a load in a toe portion of the clip. A second locating means holds the rail fastening clip in a second position different from the first position such that the toe portion of the clip sits on a ramp of the loading means in a preload condition in which the clip does not bear on the rail
摘要:
A control unit can be in communication with a plurality of displaced duct sensors. Sensors can be placed in supply and return ducts of an HVAC-type fluid delivery system. The unit can communicate status information as well as sensor sensitivity or other parameter values, on a per sensor basis, to a remote accessory unit via a communication protocol. The units can communicate via a wired or wireless medium.
摘要:
A multi-stage verification system including a first and second identification device to verify the identity of the user and to determine if the user is under duress. When a user approaches an entrance to a building, a first identifier is detected by the first identification device, the identifier is compared to a pre-stored identifier. If there is a match, the user inputs at least one biometric input into the second identification device. The biometric input is compares with pre-stored information in two different databases, a biometric template database and a duress indicator database. If there is a match with the duress indicator database, a silent alarm signal is transmitted to a central monitoring station and the security system is disarmed. If there is a match with the biometric template database, the security system is controlled in the intended manner.
摘要:
There is provided a non-volatile memory which enables high accuracy threshold control in a writing operation. In the present invention, a drain voltage and a drain current of a memory transistor are controlled to carry out a writing operation of a hot electron injection system, which is wherein a charge injection speed does not depend on a threshold voltage. FIGS. 1A and 1B are views of a circuit structure for controlling the writing. In FIGS. 1A and 1B, an output of an operational amplifier 103 is connected to a control gate of a memory transistor 101, a constant current source 102 is connected to a drain electrode, and a source electrode is grounded. The constant current source 102 and a voltage Vpgm are respectively connected to two input terminals of the operational amplifier 103.
摘要:
A method and apparatus are provided for monitoring a time that an agent of an organization spends responding to an e-mail directed to the organization. The method includes the steps of downloading the e-mail and a monitoring servlet to the agent of the organization and the servlet automatically measuring and reporting to a server of the organization an elapsed time that the agent spends on the e-mail.
摘要:
An identification system combines RF identification tags with ambient condition detectors of a monitoring system. The tags could be carried by individuals in the region(s) being monitored to provide occupancy feedback to first responders in the event of an alarm condition.
摘要:
Provided is a nonvolatile memory that realizes a high-speed verify operation. During verify writing/erasing, the writing/erasing and reading are performed at the same time. As to a circuit that performs a verify operation, for instance, there is obtained a construction where the output from a sense amplifier (102) that performs reading is connected to a switch which switches an operation voltage applied to a memory cell in accordance with a verify signal Sv, and the verify operation is finished concurrently with having the verify signal Sv switched. By obtaining such circuit construction and simultaneously performing writing/erasing and reading, it becomes possible to perform high-speed verify writing/erasing.
摘要:
The invention relates to an apparatus and processes for optical measurement and detection with real-time closed-loop controls, which enable higher levels of performance. The invention is especially suitable for applications such as spectroscopy; microscopy; biochemical assays; processes and reactions on miniaturized formats (such as those involving micro-/nano-plates, micro-formats & micro-arrays, chemistry-on-chip, lab-on-chip, micro-channels and micro-fluidics, where dimensions are on micron scale and columns are in the sub-nanoliter range). Such “intelligent sensing” allows higher data quality and reliability, higher measurement and analysis throughput and lower cost. The invention uses fast real-time adaptive digital signal processing and controls directly at the point where data is sensed. Through real-time adaptive control of sensors, chemical/opto-mechanical/opto-electronic processes and other components during the measurement process, consistently higher quality results and higher reliability are achieved. This invention furthermore includes an improved image sensor architecture that enables very intra-array dynamic range at fast frame rates and low noise performance.
摘要:
It is the primary object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. The testing circuit including a NAND circuit connected in series is mounted on the image display device. A broken wiring on a data signal line and a defect in a data latch circuit can be detected by observing an output waveform from the testing circuit. Accordingly, a broken wiring or the like on the data signal line and a scanning line and a defect in the latch circuit can be tested simply and accurately without an expensive testing apparatus and a great deal of time while occupying as small space as possible.