SAMPLE ANALYZING CHIP AND MEASUREMENT SYSTEM USING SAME
    1.
    发明申请
    SAMPLE ANALYZING CHIP AND MEASUREMENT SYSTEM USING SAME 审中-公开
    样品分析芯片和使用相同的测量系统

    公开(公告)号:US20120156766A1

    公开(公告)日:2012-06-21

    申请号:US13379696

    申请日:2010-06-15

    IPC分类号: C12M1/40 G01N21/76

    CPC分类号: G01N21/76 G01N33/54373

    摘要: Temperature of a sensor chip itself rises with the supply of power owing to temperature dependence of the sensor chip as its basic characteristics. When a chemiluminescence reagent is added at the point of time at which the temperature rise reaches a steady state and a sensor chip photodiode dark current becomes constant, a drastic shift occurs in the sensor chip temperature. Remarkable dispersion occurs at this time in the sensor chip photodiode dark current Variance (unstability) of the sensor chip photodiode dark current can be decreased by reducing the temperature fluctuation of the sensor chip to minimum by using an exothermal effect of a thermal diffusion medium.

    摘要翻译: 由于传感器芯片的温度依赖性,传感器芯片本身的温度随着功率的供给而上升。 当在温度上升达到稳定的时间点和传感器芯片光电二极管暗电流恒定的时间点添加化学发光试剂时,传感器芯片温度发生急剧的偏移。 传感器芯片光电二极管此时发生明显的色散通过使用热扩散介质的放热效应,传感器芯片的光电二极管暗电流的差异(不稳定性)可以通过将传感器芯片的温度波动降至最低来降低。