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    Scanning probe microscopy system and method of measurement by the same
    2.
    发明授权
    Scanning probe microscopy system and method of measurement by the same 有权
    扫描探针显微镜系统和测量方法相同

    公开(公告)号：US07098453B2

    公开(公告)日：2006-08-29

    申请号：US11054504

    申请日：2005-02-09

    申请人： Kazunori Ando ,  Amiko Nihei

    发明人： Kazunori Ando ,  Amiko Nihei

    IPC分类号： H01J37/28

    CPC分类号： G01Q30/18 ,  G01Q30/20

    摘要： A scanning probe microscopy system has a cantilever having a probe at a distal end thereof and a heating unit for heating the sample. A moving unit effects relative movement between the cantilever probe and the sample to bring the cantilever probe into contact with a surface of the sample for measuring a property of the sample. A shielding unit shields between the cantilever probe and the sample during heating of the sample by the heating unit.

    摘要翻译： 扫描探针显微镜系统具有在其远端具有探针的悬臂和用于加热样品的加热单元。 移动单元影响悬臂探头和样品之间的相对运动，使悬臂探头与样品表面接触，以测量样品的性质。 屏蔽单元在通过加热单元加热样品期间在悬臂探头和样品之间屏蔽。

    Scanning probe microscope and scanning method
    3.
    发明授权
    Scanning probe microscope and scanning method 有权
    扫描探针显微镜和扫描方法

    公开(公告)号：US07456400B2

    公开(公告)日：2008-11-25

    申请号：US11235458

    申请日：2005-09-26

    申请人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    发明人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    IPC分类号： G12B21/00

    CPC分类号： G01Q60/32 ,  G01Q10/06 ,  Y10S977/849 ,  Y10S977/851 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/872

    摘要： A scanning probe microscope has a probe needle and a control section that controls relative scanning movement between the probe needle and a surface of a sample in at least one direction parallel to the sample surface and controls relative movement between the probe needle and the sample surface in a direction perpendicular to the sample surface. A vibration source vibrates the probe needle at a vibrating frequency relative to the sample surface. An approach/separation drive section causes the probe needle to relatively approach to and separate from the sample surface at a predetermined distance while the probe needle is vibrated at the vibrating frequency relative to the sample surface by the vibration source. A detection section detects a rate of change in a vibration state of the probe needle in accordance with a distance between the probe needle and the sample surface. An observation section gathers observation data from the sample surface when the rate of change in the vibration state of the probe needle detected by the detection section has exceeded a preselected threshold value.

    摘要翻译： 扫描探针显微镜具有探针和控制部，其控制探针和样品表面之间的平行于样品表面的至少一个方向上的相对扫描运动，并且控制探针与样品表面之间的相对运动 垂直于样品表面的方向。 振动源以相对于样品表面的振动频率振动探针。 接近/分离驱动部分使得探针相对于样品表面以预定距离相对接近和分离，同时探针以振动源相对于样品表面的振动频率振动。 检测部根据探针与样本面的距离来检测探针的振动状态的变化率。 当由检测部检测到的探针的振动状态的变化率超过预选阈值时，观察部分从样本表面收集观察数据。

    Scanning probe microscopy and method of measurement by the same
    4.
    发明申请
    Scanning probe microscopy and method of measurement by the same 有权
    扫描探针显微镜和测量方法相同

    公开(公告)号：US20050189490A1

    公开(公告)日：2005-09-01

    申请号：US11054504

    申请日：2005-02-09

    申请人： Kazunori Ando ,  Amiko Nihei

    发明人： Kazunori Ando ,  Amiko Nihei

    IPC分类号： G01Q30/08 ,  G01Q30/10 ,  G01Q30/20 ,  G01Q60/24 ,  G21K7/00

    CPC分类号： G01Q30/18 ,  G01Q30/20

    摘要： The present invention provides a scanning probe microscopy which can measure and keep the shape of a sample surface and the physical properties of the sample at high resolution even when an evaporable component is evaporated from a substance to be heated when the sample is heated, and can measure variations in physical properties at every heated temperature without causing thermal history on the sample. The scanning probe microscopy includes a cantilever having a probe at the distal end thereof; a heating unit for heating the sample; a sample moving unit for moving the sample; and a shielding unit for shielding between the cantilever and the sample, and when heating the sample, the shielding unit is interposed between the cantilever and the sample, and when measuring the sample, the shielding unit is not interposed between the cantilever and the sample.

    摘要翻译： 本发明提供一种扫描探针显微镜，其可以在样品被加热时从被加热物质蒸发出可蒸发成分时，以高分辨率测量和保持样品表面的形状和样品的物理性能，并且可以 在每个加热温度下测量物理性能的变化，而不会对样品造成热历史。 扫描探针显微镜包括在其远端具有探针的悬臂; 用于加热样品的加热单元; 用于移动样品的样品移动单元; 以及用于屏蔽悬臂与样品之间的屏蔽单元，当加热样品时，屏蔽单元介于悬臂与样品之间，测量样品时，屏蔽单元不会夹在悬臂与样品之间。

    Cell detachment method
    5.
    发明授权
    Cell detachment method 有权
    细胞分离法

    公开(公告)号：US08859279B2

    公开(公告)日：2014-10-14

    申请号：US11810768

    申请日：2007-06-07

    申请人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    发明人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    IPC分类号： C12N5/00 ,  C12M1/00

    CPC分类号： C12M47/04 ,  C12M33/00

    摘要： A cell detachment method for detaching only a desired cell from a plurality of cells cultured on a substrate under predetermined culture environment conditions by using a scanning probe microscope having a probe, comprising: observing the plural cells; specifying the cell to be detached; moving the probe onto the specified cell; and pressing the prove against the specified cell with a predetermined force so as to detach the cell from the substrate.

    摘要翻译： 一种细胞分离方法，其通过使用具有探针的扫描探针显微镜，在预定的培养环境条件下从仅在基质上培养的多个细胞中仅去除所需细胞，包括：观察所述多个细胞; 指定要分离的单元格; 将探针移动到指定的细胞上; 并用预定的力将证明压在指定的电池上，以将电池与基板分离。

    Cell detachment method
    6.
    发明申请
    Cell detachment method 有权
    细胞分离法

    公开(公告)号：US20070292946A1

    公开(公告)日：2007-12-20

    申请号：US11810768

    申请日：2007-06-07

    申请人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    发明人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    IPC分类号： C12M3/00 ,  C12N5/06

    CPC分类号： C12M47/04 ,  C12M33/00

    摘要： A cell detachment method for detaching only a desired cell from a plurality of cells cultured on a substrate under predetermined culture environment conditions by using a scanning probe microscope having a probe, comprising: observing the plural cells; specifying the cell to be detached; moving the probe onto the specified cell; and pressing the prove against the specified cell with a predetermined force so as to detach the cell from the substrate.

    摘要翻译： 一种细胞分离方法，其通过使用具有探针的扫描探针显微镜，在预定的培养环境条件下从仅在基质上培养的多个细胞中仅去除所需细胞，包括：观察所述多个细胞; 指定要分离的单元格; 将探针移动到指定的细胞上; 并用预定的力将证明压在指定的电池上，以将电池与基板分离。

    Living cell observing cell
    8.
    发明申请
    Living cell observing cell 审中-公开
    活细胞观察细胞

    公开(公告)号：US20070134787A1

    公开(公告)日：2007-06-14

    申请号：US11583197

    申请日：2006-10-19

    申请人： Yoshiharu Shirakawabe ,  Akira Inoue ,  Naoya Watanabe ,  Amiko Nihei

    发明人： Yoshiharu Shirakawabe ,  Akira Inoue ,  Naoya Watanabe ,  Amiko Nihei

    IPC分类号： C12M1/22 ,  C12M1/34

    CPC分类号： C12M25/00 ,  B01L3/5085 ,  C12M21/06 ,  C12M23/10 ,  C12M41/46

    摘要： A living cell observing cell capable of measuring a surface of a membrane of a living cell or a rear surface side thereof and accurately performing structural analysis is provided. The living cell observing cell is used to culture at least one cell in a culture solution and observe the cells. The living cell observing cell includes a container body which stores the culturing solution and a flat location plate which is detachably fixed in the container body and has a plurality of protrusions formed in a predetermined interval on a surface thereof, wherein the cells are located on a plurality of the protrusions.

    摘要翻译： 提供了能够测量活细胞膜或其背面侧的表面的活细胞观察池，并且精确地进行结构分析。 活细胞观察池用于培养培养液中的至少一个细胞并观察细胞。 活细胞观察单元包括存储培养液的容器主体和可拆卸地固定在容器主体中并且在其表面上以预定间隔形成的多个突起的平坦位置板，其中，所述单元位于 多个突起。

    Scanning probe microscope and scanning method
    9.
    发明申请
    Scanning probe microscope and scanning method 有权
    扫描探针显微镜和扫描方法

    公开(公告)号：US20060113472A1

    公开(公告)日：2006-06-01

    申请号：US11235458

    申请日：2005-09-26

    申请人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    发明人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    IPC分类号： G21K7/00

    CPC分类号： G01Q60/32 ,  G01Q10/06 ,  Y10S977/849 ,  Y10S977/851 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/872

    摘要： In order to provide a scanning probe microscope and a scanning method which are capable of accurately approaching or contacting a probe needle and a sample surface irrespective of an irregularities shape of the sample surface, it comprises a probe needle 2 for relatively performing, with respect to a sample surface S, scans in two directions parallel to the sample surface S and a movement in a perpendicular direction of the sample surface S, a detection means 4 for detecting a measurement amount changing in compliance with a distance between the probe needle 2 and the sample surface S, an observation means 6 for gathering an observation data in a point of time at which the probe needle 2 has approached to or contacted with the sample surface S, a control means 5 for controlling the sans in the two directions and the movement in the perpendicular direction and an approach/separation drive section 24 for causing the probe needle 2 to relatively approach to and separate from the sample surface S at a predetermined distance, wherein the detection means 4 detects a change rate of the measurement amount at an approach time and a separation time by the approach/separation drive section 24, and the observation means 6 gathers the observation data when the change rate of the observation amount exceeds a previously set threshold value.

    摘要翻译： 为了提供能够精确地接近或接触探针和样品表面的扫描探针显微镜和扫描方法，而与样品表面的不规则形状无关，其包括用于相对于相对于 样品表面S在平行于样品表面S的两个方向上扫描并沿着样品表面S的垂直方向移动;检测装置4，用于检测测量量根据探针2和 样本表面S，用于在探针2接近或接触样本表面S的时间点收集观察数据的观察装置6，用于控制两个方向上的无效的控制装置5和运动 以及用于使探针2相对于样品su相对接近和分离的接近/分离驱动部24 表面S在预定距离处，其中检测装置4通过接近/分离驱动部分24检测接近时间的测量量和分离时间的变化率，并且观察装置6在变化率 的观察量超过预先设定的阈值。