Touch-enabled plasmonic reflective display
    1.
    发明授权
    Touch-enabled plasmonic reflective display 有权
    触摸式等离子体反射显示屏

    公开(公告)号:US08503064B2

    公开(公告)日:2013-08-06

    申请号:US13157225

    申请日:2011-06-09

    IPC分类号: G02B26/00

    摘要: An electrical pressure-sensitive reflective display includes an array of display pixels, each with a transparent top surface, first electrode, second electrode, an elastic polymer medium, and metallic nanoparticles distributed in the elastic polymer medium. When a first voltage potential is applied between the first and second electrodes of each display pixel, a first color is reflected from the incident spectrum of light, assuming no pressure is applied on the top surface of each display pixel. When the top surface of a first display pixel is deformed in response to an applied pressure, the elastic polymer medium in the first display pixel is compressed, decreasing the metallic nanoparticle-to-metallic nanoparticle mean distance in the first display pixel. In response to decreasing the metallic nanoparticle-to-metallic nanoparticle mean distance, the color reflected from the incident spectrum of light by the second display pixel is changed from the first color to second color.

    摘要翻译: 电压敏反射显示器包括显示像素阵列,每个显示像素具有分布在弹性聚合物介质中的透明顶表面,第一电极,第二电极,弹性聚合物介质和金属纳米颗粒。 当在每个显示像素的第一和第二电极之间施加第一电压电位时,假设在每个显示像素的顶表面上没有施加压力,第一颜色从光的入射光谱反射。 当第一显示像素的顶表面响应于所施加的压力而变形时,第一显示像素中的弹性聚合物介质被压缩,从而降低第一显示像素中金属纳米颗粒与金属纳米颗粒的平均距离。 响应于减少金属纳米颗粒 - 金属纳米颗粒平均距离,由第二显示像素的入射光谱反射的颜色从第一颜色变为第二颜色。

    Four-transistor Schmitt trigger inverter with hysteresis
    2.
    发明授权
    Four-transistor Schmitt trigger inverter with hysteresis 有权
    具有迟滞的四晶体管施密特触发器

    公开(公告)号:US08236631B2

    公开(公告)日:2012-08-07

    申请号:US12644061

    申请日:2009-12-22

    IPC分类号: H01L21/00 H01L29/76

    摘要: A four-transistor Schmitt trigger inverter is provided. The Schmitt trigger inverter is made from an n-channel MOS (NMOS) dual-gate thin-film transistor (DG-TFT) and a p-channel MOS (PMOS) DG-TFT, both DG-TFTs having a top gate, a back gate, and source/drain regions. A (conventional) NMOS TFT has a gate connected to an NMOS DG-TFT first S/D region and a PMOS DG-TFT first S/D region. The NMOS TFT also has a first S/D region connected to the NMOS DG-TFT back gate and the PMOS DG-TFT back gate. A (conventional) PMOS TFT has a gate connected to the NMOS TFT gate, and a first S/D region connected to the NMOS TFT first S/D region.

    摘要翻译: 提供了一个四晶体管施密特触发器。 施密特触发逆变器由n沟道MOS(NMOS)双栅极薄膜晶体管(DG-TFT)和p沟道MOS(PMOS)DG-TFT制成,两个DG-TFT都具有顶栅极, 背栅极和源极/漏极区域。 (常规)NMOS TFT具有连接到NMOS DG-TFT第一S / D区和PMOS DG-TFT第一S / D区的栅极。 NMOS TFT还具有连接到NMOS DG-TFT背栅和PMOS DG-TFT后栅的第一S / D区。 (传统)PMOS TFT具有连接到NMOS TFT栅极的栅极和连接到NMOS TFT第一S / D区域的第一S / D区域。

    Solution Process for Fabricating a Textured Transparent Conductive Oxide (TCO)
    3.
    发明申请
    Solution Process for Fabricating a Textured Transparent Conductive Oxide (TCO) 失效
    用于制造纹理透明导电氧化物(TCO)的溶液工艺

    公开(公告)号:US20120015147A1

    公开(公告)日:2012-01-19

    申请号:US12836300

    申请日:2010-07-14

    摘要: A solution process is provided for forming a textured transparent conductive oxide (TCO) film. The process provides a substrate, and forms a first layer on the substrate of metal oxide nanoparticles such as ZnO, In2O3, or SnO2. The metal oxide nanoparticles have a faceted structure with an average size greater than 100 nanometers (nm). Voids between the metal oxide nanoparticles have a size about equal to the size of the metal oxide nanoparticles. Then, a second layer is formed overlaying the first layer, filling the voids between the nanoparticles of the first layer, and completely covering the substrate. The result is a continuous TCO film having an average surface roughness that is created by the combination of first and second layers.

    摘要翻译: 提供了一种用于形成织构化的透明导电氧化物(TCO)膜的溶液方法。 该方法提供了一种衬底,并在诸如ZnO,In 2 O 3或SnO 2的金属氧化物纳米颗粒的衬底上形成第一层。 金属氧化物纳米颗粒具有平均尺寸大于100纳米(nm)的刻面结构。 金属氧化物纳米颗粒之间的空隙的尺寸大约等于金属氧化物纳米颗粒的尺寸。 然后,形成覆盖第一层的第二层,填充第一层的纳米颗粒之间的空隙,并完全覆盖基底。 结果是具有由第一层和第二层的组合产生的平均表面粗糙度的连续的TCO膜。

    Color-tunable plasmonic device with a partially modulated refractive index
    4.
    发明授权
    Color-tunable plasmonic device with a partially modulated refractive index 有权
    具有部分调制折射率的可调谐等离子体激元器件

    公开(公告)号:US08045107B2

    公开(公告)日:2011-10-25

    申请号:US12614368

    申请日:2009-11-06

    CPC分类号: G02F1/195 G02F2203/10

    摘要: A color-tunable plasmonic device is provided with a partially modulated refractive index. A first dielectric layer overlies a bottom electrode, and has a refractive index non-responsive to an electric field. A second dielectric layer overlies the first dielectric layer, having a refractive index responsive to an electric field. An electrically conductive top electrode overlies the second dielectric layer. A plasmonic layer including a plurality of discrete plasmonic particles is interposed between the top and bottom electrodes. In one aspect, the plasmonic layer is interposed between the first and second dielectric layers. In a second aspect, the plasmonic layer is interposed between the first dielectric layer and the bottom electrode. In a third aspect, a first plasmonic layer is interposed between the first dielectric layer and the bottom electrode, and a second plasmonic layer of discrete plasmonic particles is interposed between the first dielectric layer and the second dielectric layer.

    摘要翻译: 彩色等离子体激元器件具有部分调制的折射率。 第一电介质层覆盖在底部电极上,并且具有对电场无响应的折射率。 第二电介质层覆盖第一电介质层,具有响应于电场的折射率。 导电顶电极覆盖在第二电介质层上。 包括多个离散等离子体激元的等离子体激元层插入在顶部和底部电极之间。 在一个方面,等离子体激元层介于第一和第二电介质层之间。 在第二方面,等离子体激元层介于第一介电层和底电极之间。 在第三方面中,在第一介电层和底电极之间插入第一等离子体激元层,并且在第一介电层和第二电介质层之间插入离散等离子体激元的第二等离子体层。

    Plasmonic Device Tuned using Liquid Crystal Molecule Dipole Control
    5.
    发明申请
    Plasmonic Device Tuned using Liquid Crystal Molecule Dipole Control 有权
    使用液晶分子偶极子控制调谐的等离子体装置

    公开(公告)号:US20110109821A1

    公开(公告)日:2011-05-12

    申请号:US12635349

    申请日:2009-12-10

    IPC分类号: G02F1/133

    摘要: A plasmonic display device is provided with liquid crystal dipole molecule control. The device is made from a first set of electrodes including at least one electrically conductive top electrode and at least one electrically conductive bottom electrode capable of generating a first electric field in a first direction. A second set of electrodes, including an electrically conductive right electrode and an electrically conductive left electrode, is capable of generating a second electric field in a second first direction. A dielectric layer overlies the bottom electrode, made from a liquid crystal material with molecules having dipoles responsive to an electric field. A plasmonic layer, including a plurality of discrete plasmonic particles, is interposed between the first and second set of electrodes and in contact with the dielectric layer. In one aspect, the plasmonic layer is embedded in the dielectric layer.

    摘要翻译: 具有液晶偶极子分子控制的等离子体显示装置。 该装置由第一组电极制成,其包括至少一个导电顶电极和能够沿第一方向产生第一电场的至少一个导电底电极。 包括导电右电极和导电左电极的第二组电极能够在第二第一方向上产生第二电场。 电介质层覆盖在液晶材料制成的底部电极上,分子具有响应于电场的偶极子。 包括多个离散等离子体激元的等离子体激元层介于第一和第二组电极之间并与电介质层接触。 在一个方面,等离子体激元层嵌入电介质层。

    Self-aligned lightly doped drain recessed-gate thin-film transistor
    6.
    发明授权
    Self-aligned lightly doped drain recessed-gate thin-film transistor 有权
    自对准轻掺杂漏极栅极薄膜晶体管

    公开(公告)号:US07872309B2

    公开(公告)日:2011-01-18

    申请号:US12140017

    申请日:2008-06-16

    IPC分类号: H01L27/12 H01L29/786

    摘要: A recessed-gate thin-film transistor (RG-TFT) with a self-aligned lightly doped drain (LDD) is provided, along with a corresponding fabrication method. The method deposits an insulator overlying a substrate and etches a trench in the insulator. The trench has a bottom and sidewalls. An active silicon (Si) layer is formed overlying the insulator and trench, with a gate oxide layer over the active Si layer. A recessed gate electrode is then formed in the trench. The TFT is doped and LDD regions are formed in the active Si layer overlying the trench sidewalls. The LDD regions have a length that extends from a top of the trench sidewall, to the trench bottom, with a doping density that decreases in response to the LDD length. Alternately stated, the LDD length is directly related to the depth of the trench.

    摘要翻译: 提供了具有自对准轻掺杂漏极(LDD)的凹入栅极薄膜晶体管(RG-TFT)以及相应的制造方法。 该方法沉积覆盖衬底的绝缘体并蚀刻绝缘体中的沟槽。 沟槽有一个底部和侧壁。 在绝缘体和沟槽上形成有源硅(Si)层,在有源Si层上方形成栅极氧化层。 然后在沟槽中形成凹陷栅电极。 TFT是掺杂的,并且LDD区域形成在覆盖沟槽侧壁的有源Si层中。 LDD区域具有从沟槽侧壁的顶部延伸到沟槽底部的长度,其掺杂密度响应于LDD长度而减小。 替代地,LDD长度与沟槽的深度直接相关。

    High density plasma non-stoichiometric SiOxNy films
    7.
    发明授权
    High density plasma non-stoichiometric SiOxNy films 有权
    高密度等离子体非化学计量的SiOxNy薄膜

    公开(公告)号:US07807225B2

    公开(公告)日:2010-10-05

    申请号:US11698623

    申请日:2007-01-26

    IPC分类号: C23C16/00

    摘要: A high-density plasma method is provided for forming a SiOXNY thin-film. The method provides a substrate and introduces a silicon (Si) precursor. A thin-film is deposited overlying the substrate, using a high density (HD) plasma-enhanced chemical vapor deposition (PECVD) process. As a result, a SiOXNY thin-film is formed, where (X+Y 0). The SiOXNY thin-film can be stoichiometric or non-stoichiometric. The SiOXNY thin-film can be graded, meaning the values of X and Y vary with the thickness of the SiOXNY thin-film. Further, the process enables the in-situ deposition of a SiOXNY thin-film multilayer structure, where the different layers may be stoichiometric, non-stoichiometric, graded, and combinations of the above-mentioned types of SiOXNY thin-films.

    摘要翻译: 提供了用于形成SiOXNY薄膜的高密度等离子体方法。 该方法提供衬底并引入硅(Si)前体。 使用高密度(HD)等离子体增强化学气相沉积(PECVD)工艺将薄膜沉积在衬底上。 结果,形成SiOXNY薄膜,其中(X + Y <2和Y> 0)。 SiOXNY薄膜可以是化学计量的或非化学计量的。 SiOXNY薄膜可以分级,这意味着X和Y的值随SiOXNY薄膜的厚度而变化。 此外,该方法能够实现SiOXNY薄膜多层结构的原位沉积,其中不同的层可以是化学计量的,非化学计量的,分级的,以及上述类型的SiOXNY薄膜的组合。

    Graded junction silicon nanocrystal embedded silicon oxide electroluminescence device
    8.
    发明授权
    Graded junction silicon nanocrystal embedded silicon oxide electroluminescence device 有权
    分级结硅纳米晶体嵌入式氧化硅电致发光器件

    公开(公告)号:US07723913B2

    公开(公告)日:2010-05-25

    申请号:US12168771

    申请日:2008-07-07

    摘要: A silicon (Si) nanocrystal embedded Si oxide electroluminescence (EL) device and associated fabrication process are presented. The method provides a substrate bottom electrode, and forms a plurality of Si nanocrystal embedded SiOx film layers overlying the bottom electrode, where X is less than 2. Each SiOx film layer has a Si excess concentration in a range of about 5 to 30%. The outside film layers sandwich an inner film layer having a lower concentration of Si nanocrystals. Alternately stated, the outside Si nanocrystal embedded SiOx film layers have a higher electrical conductivity than a sandwiched inner film layer. A transparent top electrode is formed over the plurality of Si nanocrystal embedded SiOx film layers. The plurality of Si nanocrystal embedded SiOx film layers are deposited using a high density plasma-enhanced chemical vapor deposition (HD PECVD) process. The HD PECVD process initially deposits SiOx film layers, which are subsequently annealed.

    摘要翻译: 介绍了一种硅(Si)纳米晶体内置Si氧化物电致发光(EL)器件及其制造工艺。 该方法提供衬底底部电极,并且形成多个覆盖底部电极的Si纳米晶体的嵌入的SiO x膜层,其中X小于2.每个SiO x膜层的Si过量浓度在约5-30%的范围内。 外层膜层叠具有较低浓度的Si纳米晶体的内膜层。 或者说,外部Si纳米晶体埋入的SiOx膜层具有比夹层内膜层更高的导电性。 在多个Si纳米晶体嵌入的SiOx膜层上形成透明顶部电极。 使用高密度等离子体增强化学气相沉积(HD PECVD)工艺沉积多个Si纳米晶体嵌入的SiOx膜层。 HD PECVD工艺首先沉积SiO x膜层,随后退火。

    Vertical thin-film transistor with enhanced gate oxide
    9.
    发明授权
    Vertical thin-film transistor with enhanced gate oxide 有权
    具有增强栅极氧化物的垂直薄膜晶体管

    公开(公告)号:US07723781B2

    公开(公告)日:2010-05-25

    申请号:US12108333

    申请日:2008-04-23

    IPC分类号: H01L29/78

    摘要: A method is provided for forming a low-temperature vertical gate insulator in a vertical thin-film transistor (V-TFT) fabrication process. The method comprises: forming a gate, having vertical sidewalls and a top surface, overlying a substrate insulation layer; depositing a silicon oxide thin-film gate insulator overlying the gate; plasma oxidizing the gate insulator at a temperature of less than 400° C., using a high-density plasma source; forming a first source/drain region overlying the gate top surface; forming a second source/drain region overlying the substrate insulation layer, adjacent a first gate sidewall; and, forming a channel region overlying the first gate sidewall, in the gate insulator interposed between the first and second source/drain regions. When the silicon oxide thin-film gate insulator is deposited overlying the gate a Si oxide layer, a low temperature deposition process can be used, so that a step-coverage of greater than 65% can be obtained.

    摘要翻译: 提供一种用于在垂直薄膜晶体管(V-TFT)制造工艺中形成低温垂直栅极绝缘体的方法。 该方法包括:形成具有垂直侧壁和顶表面的栅极,覆盖衬底绝缘层; 沉积覆盖栅极的氧化硅薄膜栅极绝缘体; 使用高密度等离子体源在低于400℃的温度下等离子体氧化栅极绝缘体; 形成覆盖所述栅极顶表面的第一源极/漏极区域; 在第一栅极侧壁附近形成覆盖衬底绝缘层的第二源极/漏极区域; 以及在位于第一和第二源极/漏极区之间的栅极绝缘体中形成覆盖第一栅极侧壁的沟道区。 当氧化硅薄膜栅极绝缘体沉积在栅极上覆盖Si氧化物层时,可以使用低温沉积工艺,从而可以获得大于65%的阶梯覆盖率。

    Light Emitting Device with a Nanocrystalline Silicon Embedded Insulator Film
    10.
    发明申请
    Light Emitting Device with a Nanocrystalline Silicon Embedded Insulator Film 有权
    具有纳米晶硅嵌入式绝缘体膜的发光器件

    公开(公告)号:US20080224164A1

    公开(公告)日:2008-09-18

    申请号:US12126430

    申请日:2008-05-23

    IPC分类号: H01L33/00 H01L21/28 H01J1/63

    摘要: A light emitting device using a silicon (Si) nanocrystalline Si insulating film is presented with an associated fabrication method. The method provides a doped semiconductor or metal bottom electrode. Using a high density plasma-enhanced chemical vapor deposition (HDPECVD) process, a Si insulator film is deposited overlying the semiconductor electrode, having a thickness in a range of 30 to 200 nanometers (nm). For example, the film may be SiOx, where X is less than 2, Si3Nx, where X is less than 4, or SiCx, where X is less than 1. The Si insulating film is annealed, and as a result, Si nanocrystals are formed in the film. Then, a transparent metal electrode is formed overlying the Si insulator film. An annealed Si nanocrystalline SiOx film has a turn-on voltage of less than 20 volts, as defined with respect to a surface emission power of greater than 0.03 watt per square meter.

    摘要翻译: 使用硅(Si)纳米晶体Si绝缘膜的发光器件具有相关的制造方法。 该方法提供掺杂半导体或金属底电极。 使用高密度等离子体增强化学气相沉积(HDPECVD)工艺,淀积厚度在30至200纳米(nm)范围内的半导体电极上的Si绝缘体膜。 例如,膜可以是SiO x,其中X小于2,Si 3 N x,其中X小于4,或SiC x,其​​中X小于1.Si绝缘膜退火,结果Si纳米晶体为 在电影中形成。 然后,形成覆盖Si绝缘膜的透明金属电极。 退火的Si纳米晶SiO x膜具有小于20伏特的导通电压,如关于大于0.03瓦/平方米的表面发射功率所限定的。