公开(公告)号：US07894925B1

公开(公告)日：2011-02-22

申请号：US12038043

申请日：2008-02-27

申请人： Christopher W. Peters

发明人： Christopher W. Peters

IPC分类号： G06F19/00 ,  G05B13/02 ,  G06F15/18 ,  H01Q1/42

CPC分类号： H01Q1/422

摘要： A method for determining the seam location for each layer of a multilayer radome for use with an array antenna includes the steps of quantizing the radome thickness, and forming an image of the quantized thickness vs. line array position. Seam locations are assigned for an original population, and a genetic algorithm is iterated to optimize a cost function. The cost function is the level of all sidelobes other than the main lobe. The result of the genetic algorithm is an optimized set of seam locations. The radome is built with the seam locations corresponding to the optimized locations.

摘要翻译： 用于确定用于阵列天线的多层天线罩的每层的接缝位置的方法包括量化天线罩厚度以及形成量化的厚度对线阵列位置的图像的步骤。 为原始人口分配接缝位置，迭代遗传算法以优化成本函数。 成本函数是除主瓣以外的所有旁瓣的水平。 遗传算法的结果是一组优化的接缝位置。 雷达罩内置有与优化位置相对应的接缝位置。

公开(公告)号：US08587496B1

公开(公告)日：2013-11-19

申请号：US13007170

申请日：2011-01-14

申请人： Christopher W. Peters

发明人： Christopher W. Peters

IPC分类号： H01Q1/42

CPC分类号： H01Q1/422

摘要： A method for determining the seam location for each layer of a multilayer radome for use with an array antenna includes the steps of quantizing the radome thickness, and forming an image of the quantized thickness vs. line array position. Seam locations are assigned for an original population, and a genetic algorithm is iterated to optimize a cost function. The cost function is the level of all sidelobes other than the main lobe. The result of the genetic algorithm is an optimized set of seam locations. The radome is built with the seam locations corresponding to the optimized locations.

摘要翻译： 用于确定用于阵列天线的多层天线罩的每层的接缝位置的方法包括量化天线罩厚度以及形成量化的厚度对线阵列位置的图像的步骤。 为原始人口分配接缝位置，迭代遗传算法以优化成本函数。 成本函数是除主瓣以外的所有旁瓣的水平。 遗传算法的结果是一组优化的接缝位置。 雷达罩内置有与优化位置相对应的接缝位置。

公开(公告)号：US07750753B1

公开(公告)日：2010-07-06

申请号：US12174990

申请日：2008-07-17

申请人： Roland Cadotte, Jr. ,  William G. Trueheart, Jr. ,  Christopher W. Peters

发明人： Roland Cadotte, Jr. ,  William G. Trueheart, Jr. ,  Christopher W. Peters

IPC分类号： H03G11/00 ,  H03H7/38

CPC分类号： H01P3/08 ,  H01L31/162

摘要： A system includes a source of electromagnetic energy or power and an amplitude-sensitive circuit. An amplitude-limiting transmission line couples the source to the circuit. The transmission line includes a semiconductor in the field of the transmission line and a light source for illuminating the semiconductor with light responsive to the amplitude from the source. Application of energy or power to the light source illuminates the semiconductor, which produces a plasma. The plasma tends to attenuate the energy or power reaching the circuit.

摘要翻译： 一种系统包括电磁能量或功率源以及幅度敏感电路。 限幅传输线将源耦合到电路。 传输线包括传输线领域的半导体和用于根据来自源的振幅来用光照射半导体的光源。 将能量或功率施加到光源照射产生等离子体的半导体。 等离子体倾向于衰减到达电路的能量或功率。

公开(公告)号：US20090052762A1

公开(公告)日：2009-02-26

申请号：US12129371

申请日：2008-05-29

申请人： Peter Dugan ,  Robert L. Finch ,  John M. Munley ,  David M. Asner ,  Christopher W. Peters ,  Kenei Suntarat ,  David M. Brown ,  Shawn Locke

发明人： Peter Dugan ,  Robert L. Finch ,  John M. Munley ,  David M. Asner ,  Christopher W. Peters ,  Kenei Suntarat ,  David M. Brown ,  Shawn Locke

IPC分类号： G06K9/00

CPC分类号： G01N23/06 ,  G06K9/6263

摘要： A method of determining an effective atomic number, Zeff, of an object may include obtaining a plurality of radiographic images of the object. Each radiographic image can be obtained using a different independent X-ray energy level. An intensity value for each pixel in a region of interest in each radiographic image can be determined. A plurality of measured ratios, R, can be formed using attenuation coefficients from a pair of different radiographic images. At least one adjusted measured ratio, Rm, can be calculated based on the plurality of measured ratios, R, and at least one corresponding estimation coefficient, α. Zeff values can be assigned based on a comparison of the at least one adjusted measured ratio, Rm to a material attenuation database.

摘要翻译： 确定对象的有效原子序数Zeff的方法可以包括获得对象的多个放射照相图像。 可以使用不同的独立X射线能量水平获得每个放射照相图像。 可以确定每个放射线照相图像中的感兴趣区域中的每个像素的强度值。 可以使用来自一对不同放射照相图像的衰减系数来形成多个测量的比率R。 可以基于多个测量的比率R和至少一个对应的估计系数αα来计算至少一个调整的测量比率R m。 可以基于至少一个经调整的测量比率Rm与材料衰减数据库的比较来分配Zeff值。