High Performance Semiconductor Device

    公开(公告)号:US20230010770A1

    公开(公告)日:2023-01-12

    申请号:US17371410

    申请日:2021-07-09

    申请人: Cree, Inc.

    摘要: A semiconductor device comprises a lead, a board, and an electrically conductive layer on the board. The lead comprises a longitudinal axis and is soldered to the electrically conductive layer. The semiconductor device further comprises a first solder dam edge and a second solder dam edge, each positioned on the lead not more than 10 mils apart from each other along the longitudinal axis.

    SEMICONDUCTOR DEVICES HAVING GATE RESISTORS WITH LOW VARIATION IN RESISTANCE VALUES

    公开(公告)号:US20220278212A1

    公开(公告)日:2022-09-01

    申请号:US17188329

    申请日:2021-03-01

    申请人: Cree, Inc.

    IPC分类号: H01L29/423 H01L29/40

    摘要: Power semiconductor devices include a semiconductor layer structure comprising an active area with a plurality of unit cell transistors and an inactive gate pad area, a gate resistor layer on an upper side of the semiconductor layer structure, an inner contact that is directly on the upper side of the gate resistor layer, and an outer contact that is directly on the upper side of the gate resistor layer. The outer contact encloses the inner contact within the inactive gate pad area of the semiconductor device.

    PIXELATED-LED CHIPS WITH INTER-PIXEL UNDERFILL MATERIALS, AND FABRICATION METHODS

    公开(公告)号:US20220131048A1

    公开(公告)日:2022-04-28

    申请号:US17078733

    申请日:2020-10-23

    申请人: Cree, Inc.

    摘要: Pixelated-LED chips including a plurality of independently electrically accessible active layer portions supported by a plurality of discontinuous substrate portions to form a plurality of pixels, with underfill material of varying composition provided between sidewalls of adjacent pixels. Underfill materials having different reflection, scattering, absorption, filtering, etch-resistance, and/or light refraction properties may be provided in multiple layers. A method for fabricating a pixelated-LED chip includes defining streets through an active layer and portions of a substrate to form active layer portions, thinning an entire upper portion of a substrate to create openings into the streets and form discontinuous substrate portions bounding the streets, and supplying underfill material through the openings into the streets.

    GATE TRENCH POWER SEMICONDUCTOR DEVICES HAVING IMPROVED DEEP SHIELD CONNECTION PATTERNS

    公开(公告)号:US20220130996A1

    公开(公告)日:2022-04-28

    申请号:US17082647

    申请日:2020-10-28

    申请人: Cree, Inc

    IPC分类号: H01L29/78 H01L29/16 H01L29/66

    摘要: A power semiconductor device comprises a semiconductor layer structure having a wide band-gap drift region having a first conductivity type, a gate trench having first and second opposed sidewalls that extend in a first direction in an upper portion of the semiconductor layer structure, first and second well regions having a second conductivity type in the upper portion of the semiconductor layer structure, the first well region comprising part of the first sidewall and the second well region comprising part of the second sidewall. A deep shielding region having the second conductivity type is provided underneath the gate trench, and a plurality of deep shielding connection patterns that have the second conductivity type are provided that electrically connect the deep shielding region to the first and second well regions. The deep shielding connection patterns are spaced apart from each other along the first direction.