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公开(公告)号:US20110149298A1
公开(公告)日:2011-06-23
申请号:US12553927
申请日:2009-09-03
Applicant: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
Inventor: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
CPC classification number: G01J9/02 , G01B9/02087 , G11B7/005 , G11B7/0051 , G11B7/24088
Abstract: A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
Abstract translation: 一种波前(100)分析的方法,包括将变换应用于波前,将多个不同的相位变化(110,112,114)应用于变换的波阵面(108),获得多个强度图(130,132,134 ),其中所述多个不同相位变化被应用于对应于所述光源的形状的所述经变换波前的区域。
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2.
公开(公告)号:US5587664A
公开(公告)日:1996-12-24
申请号:US501685
申请日:1995-07-12
Applicant: David Banitt , Moshe B. Shlomo
Inventor: David Banitt , Moshe B. Shlomo
IPC: G01R1/07 , G01R31/308 , G01R31/302
CPC classification number: G01R31/308
Abstract: An apparatus for testing an electrical part having a number of conductive paths. The apparatus includes a mechanism for directing a laser pulse to impinge upon a conductor of the part under test so as to form a metallic plasma and one or more pairs of probes which, along with the conductor and the plasma, form a part of an electrical circuit. Finally, the apparatus includes a detector which is responsive to the amount of conduction via the plasma between the conductor and the probes.
Abstract translation: 一种用于测试具有多个导电路径的电气部件的装置。 该装置包括用于引导激光脉冲撞击被测试部件的导体以便形成金属等离子体和一对或多对探针的机构,该对探针与导体和等离子体一起形成电气的一部分 电路。 最后,该装置包括一个检测器,该检测器响应于导体和探针之间的等离子体的导电量。
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公开(公告)号:US07609388B2
公开(公告)日:2009-10-27
申请号:US10499758
申请日:2002-10-16
Applicant: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
Inventor: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
IPC: G01B9/02
CPC classification number: G01J9/02 , G01B9/02087 , G11B7/005 , G11B7/0051 , G11B7/24088
Abstract: A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
Abstract translation: 一种波前(100)分析的方法,包括将变换应用于波前,将多个不同的相位变化(110,112,114)应用于变换的波阵面(108),获得多个强度图(130,132,134 ),其中所述多个不同相位变化被应用于对应于所述光源的形状的所述经变换波前的区域。
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公开(公告)号:US20050007603A1
公开(公告)日:2005-01-13
申请号:US10499758
申请日:2002-10-16
Applicant: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
Inventor: Yoel Arieli , Shay Wolfling , David Banitt , Yosi Weitzman , Yoram Saban , Emmanuel Lanzmann , Shay Levavi
CPC classification number: G01J9/02 , G01B9/02087 , G11B7/005 , G11B7/0051 , G11B7/24088
Abstract: A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
Abstract translation: 一种波前(100)分析的方法,包括将变换应用于波前,将多个不同的相位变化(110,112,114)应用于变换的波阵面(108),获得多个强度图(130,132,134 ),其中所述多个不同相位变化被应用于对应于所述光源的形状的所述经变换波前的区域。