Method of making high dielectric constant insulators and capacitors
using same
    1.
    发明授权
    Method of making high dielectric constant insulators and capacitors using same 失效
    制造高介电常数绝缘体和使用其的电容器的方法

    公开(公告)号:US4432035A

    公开(公告)日:1984-02-14

    申请号:US387315

    申请日:1982-06-11

    CPC分类号: H01G2/12

    摘要: An improved method of fabricating a stable high dielectric constant and low leakage dielectric material includes oxidizing at a temperature of about 400.degree. C. or higher a layer of a transition metal-silicon alloy having 40% to 90% transition metal by atomic weight to produce a silicate or homogeneous mixture. The mixture includes an oxide of the transition metal and silicon dioxide. The alloy may be deposited on, e.g., a semiconductor or an electrically conductive layer that is oxidation resistant, and the thickness of the mixture or oxidized alloy should be within the range of 5 to 50 nanometers. By depositing an electrically conductive layer on the homogeneous mixture, a capacitor having a high dielectric, low leakage dielectric medium is provided.

    摘要翻译: 制造稳定的高介电常数和低泄漏介电材料的改进方法包括在约400℃或更高的温度下氧化具有40%至90%过渡金属的过渡金属 - 硅合金的原子量以产生 硅酸盐或均质混合物。 该混合物包括过渡金属和二氧化硅的氧化物。 合金可以沉积在例如耐氧化的半导体或导电层上,并且混合物或氧化合金的厚度应在5至50纳米的范围内。 通过在均匀混合物上沉积导电层,提供具有高电介质,低漏电介质的电容器。