Computer security threat data collection and aggregation with user privacy protection
    1.
    发明授权
    Computer security threat data collection and aggregation with user privacy protection 有权
    计算机安全威胁数据采集和聚合与用户隐私保护

    公开(公告)号:US09043587B1

    公开(公告)日:2015-05-26

    申请号:US13542445

    申请日:2012-07-05

    Abstract: An endpoint computer in an enterprise network is configured to detect computer security threat events, such as presence of a computer virus. Upon detection of a threat event, the endpoint computer generates computer security threat data for the threat event. The threat data may include user identifiable data that can be used to identify a user in the enterprise network. The endpoint computer encrypts the user identifiable data prior to sending the threat data to a smart protection network or to an enterprise server where threat data from various enterprise networks are collected for analysis. The endpoint computer may also encrypt an identifier for the threat data and provide the encrypted identifier to the smart protection network and to an enterprise server in the enterprise network. The enterprise server may use the encrypted identifier to retrieve the threat data from the smart protection network to generate user-specific reports.

    Abstract translation: 企业网络中的端点计算机被配置为检测计算机安全威胁事件,例如计算机病毒的存在。 在检测到威胁事件后,端点计算机生成威胁事件的计算机安全威胁数据。 威胁数据可以包括可用于识别企业网络中的用户的用户可识别数据。 端点计算机在将威胁数据发送到智能保护网络或收集来自各种企业网络的威胁数据用于分析的企业服务器之前对用户可识别数据进行加密。 端点计算机还可以加密威胁数据的标识符,并将加密的标识符提供给智能保护网络和企业网络中的企业服务器。 企业服务器可以使用加密的标识符来从智能保护网络检索威胁数据,以生成用户特定的报告。

    On-chip poly-to-contact process monitoring and reliability evaluation system and method of use
    2.
    发明授权
    On-chip poly-to-contact process monitoring and reliability evaluation system and method of use 有权
    片上多点接触过程监控与可靠性评估系统及使用方法

    公开(公告)号:US09029172B2

    公开(公告)日:2015-05-12

    申请号:US13354547

    申请日:2012-01-20

    CPC classification number: H01L22/34 H01L22/12 H01L2924/00 H01L2924/0002

    Abstract: An on-chip poly-to-contact process monitoring and reliability evaluation system and method of use are provided. A method includes determining a breakdown electrical field of each of one or more shallow trench isolation (STI) measurement structures corresponding to respective one or more original semiconductor structures. The method further includes determining a breakdown voltage of each of one or more substrate measurement structures corresponding to the respective one or more original semiconductor structures. The method further includes determining a space between a gate and a contact of each of the one or more original semiconductor structures based on the determined breakdown electrical field and the determined breakdown voltage.

    Abstract translation: 提供片上多点接触式过程监测和可靠性评估系统及其使用方法。 一种方法包括确定与相应的一个或多个原始半导体结构相对应的一个或多个浅沟槽隔离(STI)测量结构中的每一个的击穿电场。 该方法还包括确定与相应的一个或多个原始半导体结构相对应的一个或多个衬底测量结构中的每一个的击穿电压。 该方法还包括基于所确定的击穿电场和所确定的击穿电压,确定一个或多个原始半导体结构中的每一个的栅极和触点之间的空间。

    Stackable programmable passive device and a testing method
    5.
    发明授权
    Stackable programmable passive device and a testing method 失效
    可堆叠可编程无源器件和测试方法

    公开(公告)号:US08749293B2

    公开(公告)日:2014-06-10

    申请号:US13529557

    申请日:2012-06-21

    Abstract: A programmable passive device comprising a first node and a second node. A plurality of passive device elements electrically coupled to the first node. A plurality of switches are electrically coupled to at least the second node and selectively coupled to a number of the plurality of passive device elements to provide the programmable passive device with a pre-determined value.

    Abstract translation: 一种包括第一节点和第二节点的可编程无源设备。 电耦合到第一节点的多个无源器件元件。 多个开关电耦合到至少第二节点并且选择性地耦合到多个无源器件元件,以向可编程无源器件提供预定值。

    Switching module of adjusting a visual angle and related backlight system
    6.
    发明授权
    Switching module of adjusting a visual angle and related backlight system 有权
    调整视角切换模块及相关背光系统

    公开(公告)号:US08729804B2

    公开(公告)日:2014-05-20

    申请号:US13589198

    申请日:2012-08-20

    Abstract: A switching module capable of adjusting a visual angle is disclosed. The switching module includes an edge-type optical substrate, a light source disposed by a side of the edge-type optical substrate, and an optical modulating component disposed between the light source and the edge-type optical substrate. The edge-type optical substrate has an emitting surface. The light source includes a plurality of light units. Each light unit can emit a beam to the edge-type optical substrate according to a predetermined angle. The optical modulating component can modulate divergence of the beam emitted from the light unit, so that the beam can be guided out of the edge-type optical substrate via the emitting surface according to the predetermined angle.

    Abstract translation: 公开了一种能够调节视角的开关模块。 开关模块包括边缘型光学基板,由边缘型光学基板侧设置的光源和设置在光源和边缘型光学基板之间的光学调制部件。 边缘型光学基板具有发光面。 光源包括多个光单元。 每个光单元可以根据预定角度向边缘型光学基板发射光束。 光调制部件可以调制从光单元发射的光束的发散度,使得光束可以根据预定角度经由发射表面被引导出边缘型光学基板。

    Migration of computer security modules in a virtual machine environment
    7.
    发明授权
    Migration of computer security modules in a virtual machine environment 有权
    在虚拟机环境中迁移计算机安全模块

    公开(公告)号:US08661434B1

    公开(公告)日:2014-02-25

    申请号:US12536222

    申请日:2009-08-05

    CPC classification number: G06F9/45558

    Abstract: A machine in the form of a computer is configured to run virtual machines. A virtual machine migrated from another computer is run in the computer. A security profile of the migrated virtual machine in the computer indicates a configuration setting of another network component in another computer network. A network profile in the computer indicates a configuration setting of a network component in the current computer network. The security profile of the migrated virtual machine is automatically updated to reflect the configuration setting of the network component in the current computer network to provide computer security function in the current computer network.

    Abstract translation: 计算机形式的机器配置为运行虚拟机。 从另一台计算机迁移的虚拟机在计算机中运行。 计算机中迁移的虚拟机的安全配置文件指示另一个计算机网络中另一个网络组件的配置设置。 计算机中的网络配置文件指示当前计算机网络中的网络组件的配置设置。 迁移的虚拟机的安全配置文件将自动更新,以反映当前计算机网络中网络组件的配置设置,以便在当前计算机网络中提供计算机安全功能。

    Multichip package structure and light bulb of using the same
    8.
    发明授权
    Multichip package structure and light bulb of using the same 失效
    Multichip封装结构和灯泡使用相同

    公开(公告)号:US08633639B2

    公开(公告)日:2014-01-21

    申请号:US13344503

    申请日:2012-01-05

    Abstract: A light bulb includes a base unit, an electrical connecting unit, a light-emitting unit, and a lamp cover unit. The base unit includes a base body connected with the electrical connecting unit. The light-emitting unit includes a substrate body disposed on the base body, a plurality of blue and red light emitting groups disposed on the substrate body and electrically connected with the substrate body, and a phosphor resin body formed on the substrate body to cover the blue and red light emitting groups. Each blue light emitting group includes a plurality of blue light emitting elements electrically connected with each other in series, and each red light emitting group includes a plurality of red light emitting elements electrically connected with each other in series. The lamp cover unit includes a light-permitting cover disposed on the top side of the base body to cover the light-emitting unit.

    Abstract translation: 灯泡包括基座单元,电连接单元,发光单元和灯罩单元。 基座单元包括与电连接单元连接的基体。 所述发光单元包括设置在所述基体上的基板主体,设置在所述基板主体上并与所述基板主体电连接的多个蓝色和红色发光组,以及形成在所述基板主体上以覆盖所述基板主体的荧光体树脂体 蓝色和红色发光组。 每个蓝色发光组包括彼此串联电连接的多个蓝色发光元件,并且每个红色发光组包括串联电连接的多个红色发光元件。 灯罩单元包括设置在基体的顶侧以覆盖发光单元的允许光的盖。

    TESTING STRUCTURE AND METHOD OF USING THE TESTING STRUCTURE
    9.
    发明申请
    TESTING STRUCTURE AND METHOD OF USING THE TESTING STRUCTURE 有权
    测试结构和使用测试结构的方法

    公开(公告)号:US20130314119A1

    公开(公告)日:2013-11-28

    申请号:US13478137

    申请日:2012-05-23

    CPC classification number: H01L22/34 H01L2924/00 H01L2924/0002

    Abstract: A metal-to-metal leakage and breakdown testing structure for semiconductor structures and method of using the testing structure is disclosed. The testing structure includes plurality of resistor bridges connected to respective two terminal devices. The testing structure further includes a plurality of switches each having a voltage node provided between resistors of a respective one of the plurality of resistor bridges. The voltage node is read at a circuit pad when a respective one of the plurality of switches is in an on state. The testing structure further includes a device turning on and off each of the plurality of switches, individually.

    Abstract translation: 公开了一种用于半导体结构的金属 - 金属泄漏和击穿测试结构以及使用该测试结构的方法。 测试结构包括连接到相应的两个终端设备的多个电阻桥。 测试结构还包括多个开关,每个开关具有设置在多个电阻器桥中的相应一个的电阻器之间的电压节点。 当多个开关中的相应一个开关处于导通状态时,在电路板处读取电压节点。 测试结构还包括单独地打开和关闭多个开关中的每一个的装置。

    Wiring structure and method of forming the structure
    10.
    发明授权
    Wiring structure and method of forming the structure 有权
    布线结构及形成方法

    公开(公告)号:US08569888B2

    公开(公告)日:2013-10-29

    申请号:US13114079

    申请日:2011-05-24

    Abstract: Disclosed is a wiring structure and method of forming the structure with a conductive diffusion barrier layer having a thick upper portion and thin lower portion. The thicker upper portion is located at the junction between the wiring structure and the adjacent dielectric materials. The thicker upper portion: (1) minimizes metal ion diffusion and, thereby TDDB; (2) allows a wire width to dielectric space width ratio that is optimal for low TDDB to be achieved at the top of the wiring structure; and (3) provides a greater surface area for via landing. The thinner lower portion: (1) allows a different wire width to dielectric space width ratio to be maintained in the rest of the wiring structure in order to balance other competing factors; (2) allows a larger cross-section of wire to reduce current density and, thereby reduce EM; and (3) avoids an increase in wiring structure resistivity.

    Abstract translation: 公开了一种具有导电扩散阻挡层的结构的布线结构和方法,所述导电扩散阻挡层具有较厚的上部和较薄的下部。 较厚的上部位于布线结构和相邻电介质材料之间的接合处。 较厚的上部:(1)最小化金属离子扩散,从而使TDDB; (2)允许在布线结构的顶部实现对于低TDDB最佳的电线宽度与电介质空间宽度比; 和(3)为通孔着陆提供更大的表面积。 较薄的下部:(1)允许在布线结构的其余部分中保持不同的导线宽度与电介质空间宽度比,以平衡其他竞争因素; (2)允许更大的导线截面减小电流密度,从而减少EM; 和(3)避免了布线结构电阻率的增加。

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