公开(公告)号：US08129703B2

公开(公告)日：2012-03-06

申请号：US12401668

申请日：2009-03-11

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： G01N21/86 ,  H01L27/00 ,  G03H1/00

CPC分类号： G03H1/0493 ,  A61B5/0088 ,  A61B5/1077 ,  A61B5/682 ,  A61C9/0073 ,  A61C13/0004 ,  G03H1/0866 ,  G03H2222/36 ,  G06T17/00

摘要： A conoscopic holographic system and a method for imaging a scene characterized by a surface having a three-dimensional shape. The system utilizes an optical source, which illuminates the scene with substantially linear distributions of light, and independent register of a plurality of elementary conoscopic holograms in the image plane. Each elementary conoscopic hologram represents the imaging of a single emitting point of the illuminated scene. The optical source is translated relative to the scene to generate a sequence of optical holograms, and a weighted reconstruction of the holograms is performed, in a computer process, at a median plane to devise the three-dimensional shape of the imaged scene.

摘要翻译： 一种全息全景照相系统和一种以具有三维形状的表面为特征的场景成像方法。 该系统利用光源，其以基本线性分布的光照亮场景，并且在图像平面中使用多个基本圆锥视点全息图的独立寄存器。 每个基本圆锥全息图表示照明场景的单个发射点的成像。 光源相对于场景平移以产生一系列光学全息图，并且在计算机处理中，在中值平面处执行全息图的加权重建，以设计成像场景的三维形状。

公开(公告)号：US06169634A

公开(公告)日：2001-01-02

申请号：US09312448

申请日：1999-05-14

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： G02B2730

CPC分类号： G02B27/48

摘要： A method and apparatus for converting a beam of light that is substantially coherent and has a coherence length into substantially incoherent radiation. The method has the steps of collimating the beam, delaying a first portion of the beam by a first optical delay by ballistic passage through a first cell of an optical element, and delaying each of a plurality of other portions of the beam by an optical delay different from the first optical delay by an amount exceeding the coherence length of the beam.

摘要翻译： 一种用于将基本上相干并且具有相干长度的光束转换成基本上不相干的辐射的方法和装置。 该方法具有对光束进行准直的步骤，通过弹射通过光学元件的第一单元将光束的第一部分延迟第一光学延迟，并延迟光束的多个其它部分中的每一个光延迟 与第一光学延迟不同，其量超过光束的相干长度。

公开(公告)号：US6134013A

公开(公告)日：2000-10-17

申请号：US149399

申请日：1998-09-08

申请人： Gabriel Y. Sirat ,  Yann Malet

发明人： Gabriel Y. Sirat ,  Yann Malet

IPC分类号： G01B11/24

CPC分类号： G01B11/24

摘要： A method and apparatus for inspecting a three dimensional structure, such as an electronic component, using collimated light for accurately measuring the three-dimensional structure of members protruding above the surface of the component. Collimated light illuminates the surface, and spherical or other three-dimensional structure on the surface is analyzed, using stereoscopic, holographic, Moire, or conoscopic analysis of light reflected or scattered by the structure, using an array of optical detectors in a detector plane.

摘要翻译： 一种用于使用准直光检查诸如电子部件的三维结构的方法和装置，用于精确测量突出在部件表面上的部件的三维结构。 准直光照亮表面，并且使用在检测器平面中的光学检测器阵列，利用由结构反射或散射的光的立体，全息，莫尔或圆锥镜分析来分析表面上的球形或其它三维结构。

公开(公告)号：US09250185B2

公开(公告)日：2016-02-02

申请号：US13822355

申请日：2011-10-14

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： G01B11/02 ,  G01N21/64 ,  G02B21/00 ,  G01B11/25

CPC分类号： G01B11/14 ,  G01B11/25 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/6458 ,  G01N2201/06113 ,  G01N2201/12 ,  G02B21/0056 ,  G02B21/0072 ,  G02B21/0076 ,  G02B21/16

摘要： The invention proposes an optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous nanoemitter of a sample, the method comprising: the projection of a sequence of at least two compact luminous distributions of different topological families onto the sample, the detection of the light reemitted by said at least one luminous nanoemitter of the sample; the generation of at least one optical image for each luminous distribution, on the basis of the light detected; and the algorithmic analysis of the optical images to obtain information regarding the location of said at least one luminous nanoemitter. The invention further relates to an optical method of measurement and an optical apparatus for determining the spatial position of a plurality of point light sources, the method comprising the detection of the light emitted by the plurality of point light sources; and the separation of the light emitted on a plurality of detectors for simultaneous or sequential detections; the proportion of the light emitted by a point light source, channeled to a specific detector, being dependent on the spatial position of said point light source; and the generation of the optical images on the basis of the light detected; and the algorithmic analysis of the optical images to obtain an item of information regarding the location of the plurality of point light sources.

摘要翻译： 本发明提出了一种测量光学方法和一种用于确定样品的至少一个发光纳米发射体的空间位置的光学装置，所述方法包括：将不同拓扑族的至少两个紧密发光分布的序列投影到样品上 检测由所述样品的所述至少一个发光纳米发射体重发的光; 基于检测到的光，生成用于每个发光分布的至少一个光学图像; 以及光学图像的算法分析以获得关于所述至少一个发光纳米发射器的位置的信息。 本发明还涉及一种测量光学方法和用于确定多个点光源的空间位置的光学装置，该方法包括检测由多个点光源发出的光; 以及在多个检测器上发射的光的分离，用于同时或顺序检测; 被引导到特定检测器的点光源发射的光的比例取决于所述点光源的空间位置; 并根据检测到的光产生光学图像; 以及光学图像的算法分析以获得关于多个点光源的位置的信息项。

公开(公告)号：US20130176574A1

公开(公告)日：2013-07-11

申请号：US13822355

申请日：2011-10-14

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： G01N21/64

CPC分类号： G01B11/14 ,  G01B11/25 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/6458 ,  G01N2201/06113 ,  G01N2201/12 ,  G02B21/0056 ,  G02B21/0072 ,  G02B21/0076 ,  G02B21/16

摘要： The invention proposes an optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous nanoemitter of a sample, the method comprising: the projection of a sequence of at least two compact luminous distributions of different topological families onto the sample, the detection of the light reemitted by said at least one luminous nanoemitter of the sample; the generation of at least one optical image for each luminous distribution, on the basis of the light detected; and the algorithmic analysis of the optical images to obtain information regarding the location of said at least one luminous nanoemitter. The invention further relates to an optical method of measurement and an optical apparatus for determining the spatial position of a plurality of point light sources, the method comprising the detection of the light emitted by the plurality of point light sources; and the separation of the light emitted on a plurality of detectors for simultaneous or sequential detections; the proportion of the light emitted by a point light source, channeled to a specific detector, being dependent on the spatial position of said point light source; and the generation of the optical images on the basis of the light detected; and the algorithmic analysis of the optical images to obtain an item of information regarding the location of the plurality of point light sources.

摘要翻译： 本发明提出了一种测量光学方法和一种用于确定样品的至少一个发光纳米发射体的空间位置的光学装置，所述方法包括：将不同拓扑族的至少两个紧密发光分布的序列投影到样品上 检测由所述样品的所述至少一个发光纳米发射体重发的光; 基于检测到的光，生成用于每个发光分布的至少一个光学图像; 以及光学图像的算法分析以获得关于所述至少一个发光纳米发射器的位置的信息。 本发明还涉及一种测量光学方法和用于确定多个点光源的空间位置的光学装置，该方法包括检测由多个点光源发出的光; 以及在多个检测器上发射的光的分离，用于同时或顺序检测; 被引导到特定检测器的点光源发射的光的比例取决于所述点光源的空间位置; 并根据检测到的光产生光学图像; 以及光学图像的算法分析以获得关于多个点光源的位置的信息项。

公开(公告)号：US06590654B1

公开(公告)日：2003-07-08

申请号：US09788325

申请日：2001-02-16

申请人： Gabriel Y. Sirat ,  Yaacov Zerem ,  Meny Shy ,  Valery Deich

发明人： Gabriel Y. Sirat ,  Yaacov Zerem ,  Meny Shy ,  Valery Deich

IPC分类号： G01J400

CPC分类号： G02B27/48 ,  G01B11/00 ,  G02B7/32 ,  G02B27/283

摘要： An apparatus and method for enhancing the proportion of detected light that has been diffusely scattered by a surface light to light specularly reflected from the surface. A beam of light having a direction of predominant polarization is directed through a wedge module so as to illuminate the scene. The wedge module has two optically anisotropic wedges and an optical compensation plate. The polarization axes of the first and second wedges are substantially parallel to the direction of predominant polarization of the illuminating beam. Light scattered by the surface is detected through a polarizer.

摘要翻译： 一种用于增强被表面光漫反射的检测光的比例的表面上镜面反射的光的装置和方法。 具有主要极化方向的光束被引导通过楔形模块以照亮场景。 楔形模块具有两个光学各向异性楔块和光学补偿板。 第一和第二楔形物的偏振轴基本上平行于照明光束的主要偏振方向。 通过偏振器检测由表面散射的光。

公开(公告)号：US07728989B2

公开(公告)日：2010-06-01

申请号：US11829471

申请日：2007-07-27

申请人： Michael Doherty ,  Yitzhak Daniel ,  Eli Zeitlin ,  Karol Sanilevici ,  Gabriel Y. Sirat ,  Gregory Agronik

发明人： Michael Doherty ,  Yitzhak Daniel ,  Eli Zeitlin ,  Karol Sanilevici ,  Gabriel Y. Sirat ,  Gregory Agronik

IPC分类号： G01B11/14

CPC分类号： A61C9/0053 ,  A61C13/0004 ,  G01B11/24

摘要： Methods for digitizing complex surfaces of dental objects such as impressions of dental surfaces and shapes. While an impression mold is being scanned by translation along a known trajectory, typically in a plane, the line of sight of a distance probe is directed toward successive positions on the surface of the impression mold, such as by a periodic series of reflecting surfaces characterized by normal vectors at distinct non-orthogonal angles with respect to their axis of symmetry. One or more reference objects are scanned using the same translation and mirror positioning systems. Gathered coordinate data are processed to apply angular corrections and combined to form a single distortion-corrected image of the impression mold. An apparatus and methods are provided for measuring both sides of a dental object separately, and then registering the two sides relative to each other in a digital representation of the object.

摘要翻译： 数字化牙科物体的复杂表面的方法，例如牙齿表面和形状的印模。 当通过沿着已知轨迹（通常在平面中）的平移扫描印模时，距离探头的视线指向压印模具表面上的连续位置，例如通过周期性的一系列反射表面 通过相对于其对称轴线的不同非正交角度的法向矢量。 使用相同的翻译和镜像定位系统扫描一个或多个参考对象。 处理收集的坐标数据以应用角度校正并组合以形成压印模具的单个失真校正图像。 提供了用于分别测量牙科物体的两侧，然后以对象的数字表示相对于彼此对准的装置和方法。

公开(公告)号：US20090168613A1

公开(公告)日：2009-07-02

申请号：US12255528

申请日：2008-10-21

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： G11B11/00 ,  G02B27/10 ,  G01J4/00 ,  G01B11/26

CPC分类号： G02B27/28 ,  G02B1/02 ,  G02B1/08

摘要： Optical devices based on internal conical refraction for developing new set-ups, methods and applications based on the specific properties of internal conical diffraction. The devices include several set-ups, methods and applications consisting of biaxial crystal(s)—one or more polarization elements and optical elements. The biaxial crystal is an optical crystal which may belong to the trigonal, orthorhombic or trigonal crystal classes.

摘要翻译： 基于内部锥形折射的光学装置，用于开发新的装置，基于内部圆锥衍射的具体特性的方法和应用。 这些器件包括由双轴晶体 - 一个或多个偏振元件和光学元件组成的几种设置，方法和应用。 双轴晶体是可能属于三角，斜方晶或三角晶体类的光学晶体。

公开(公告)号：US07541600B2

公开(公告)日：2009-06-02

申请号：US11488176

申请日：2006-07-14

申请人： Daniel Neuhauser ,  Gabriel Y. Sirat

发明人： Daniel Neuhauser ,  Gabriel Y. Sirat

IPC分类号： G01J1/00 ,  G01N21/00 ,  G01N23/00

CPC分类号： G03F7/70966 ,  G02B1/02 ,  G03F7/70633

摘要： A method and apparatus for accurately retrieving the position of an optical feature. The method uses the optical properties of biaxial crystals to conically refract the optical feature and transform the image of the optical feature to a circular ring structure. The position of the optical feature is then calculated by locating a center point associated with the circular ring structure.

摘要翻译： 一种用于准确地检索光学特征的位置的方法和装置。 该方法采用双轴晶体的光学特性，将光学特征圆锥折射，并将光学特征的图像转换为圆环结构。 然后通过定位与圆环结构相关联的中心点来计算光学特征的位置。

公开(公告)号：US06667458B1

公开(公告)日：2003-12-23

申请号：US09838536

申请日：2001-04-19

申请人： Gabriel Y. Sirat

发明人： Gabriel Y. Sirat

IPC分类号： B23K2600

CPC分类号： B23K26/04 ,  B23K26/043

摘要： A system and method for maintaining a specified distance between the focus of a laser tooling beam of a laser machining system and a workpiece. The system includes an optical assembly for focusing the tooling beam substantially onto a spot on the surface of the workpiece and a beam splitter for deflecting light retro-reflected from the workpiece and through the optical assembly. The system also includes a distance-measuring apparatus, such as a conoscope, for receiving the retro-reflected beam and for determining the distance to the spot on the surface of the workpiece relative to a fiducial reference as well as a controller for governing the location of the workpiece relative to the focus of the optical assembly based on the measured distance of the spot.

摘要翻译： 一种用于在激光加工系统的激光加工梁的焦点与工件之间保持指定距离的系统和方法。 该系统包括用于将工具束基本上聚焦到工件表面上的点上的光学组件和用于偏转从工件回射并通过光学组件的光的分束器。 该系统还包括距离测量装置，例如窥镜，用于接收反射光束并且用于确定相对于基准参考的距工件表面上的光斑的距离以及用于控制位置的控制器 相对于光学组件的焦点，基于测量的点的距离。