SELF-ALIGNED 3-D EPITAXIAL STRUCTURES FOR MOS DEVICE FABRICATION
    4.
    发明申请
    SELF-ALIGNED 3-D EPITAXIAL STRUCTURES FOR MOS DEVICE FABRICATION 有权
    用于MOS器件制造的自对准3-D外延结构

    公开(公告)号:US20140027860A1

    公开(公告)日:2014-01-30

    申请号:US13560513

    申请日:2012-07-27

    IPC分类号: H01L27/088 H01L21/336

    摘要: Techniques are disclosed for customization of fin-based transistor devices to provide a diverse range of channel configurations and/or material systems within the same integrated circuit die. In accordance with one example embodiment, sacrificial fins are removed and replaced with custom semiconductor material of arbitrary composition and strain suitable for a given application. In one such case, each of a first set of the sacrificial fins is recessed or otherwise removed and replaced with a p-type material, and each of a second set of the sacrificial fins is recessed or otherwise removed and replaced with an n-type material. The p-type material can be completely independent of the process for the n-type material, and vice-versa. Numerous other circuit configurations and device variations are enabled using the techniques provided herein.

    摘要翻译: 公开了用于定制鳍式晶体管器件以提供同一集成电路管芯内的不同范围的通道配置和/或材料系统的技术。 根据一个示例性实施例,除去牺牲翅片并用适合于给定应用的任意组合和应变的定制半导体材料代替。 在一种这样的情况下,第一组牺牲翅片中的每一个凹陷或以其它方式移除并用p型材料代替,并且第二组牺牲翅片中的每一个凹入或以其它方式移除并且用n型 材料。 p型材料可以完全独立于n型材料的工艺,反之亦然。 使用本文提供的技术可实现许多其它电路配置和设备变化。