Systems for interconnecting magnetic heads of storage devices in a test assembly
    1.
    发明授权
    Systems for interconnecting magnetic heads of storage devices in a test assembly 有权
    用于在测试组件中互连存储设备的磁头的系统

    公开(公告)号:US08514522B1

    公开(公告)日:2013-08-20

    申请号:US13013289

    申请日:2011-01-25

    CPC classification number: G11B5/4826 G11B5/3196 G11B5/4833 G11B5/4853

    Abstract: Systems for interconnecting magnetic heads of storage devices in a test assembly are provided. In one embodiment, the invention relates to a probe assembly for coupling a read head to a cavity gimbal assembly, the probe assembly including a plurality of conductive probes each including a body section including two substantially flat side surfaces and a bottom surface including a pad configured to be soldered to a corresponding pad of a laminated flexure of the cavity gimbal assembly, a spring section including an elongated arm extending away from the body section, the elongated arm shaped to make conductive contact with a pad on a trailing face of the read head, and a non-conductive adhesive layer attached to at least one of the two side surfaces, where each of the plurality of the conductive probes is attached to an adjacent one of the conductive probes by one of the adhesive layers.

    Abstract translation: 提供了用于在测试组件中互连存储设备的磁头的系统。 在一个实施例中,本发明涉及一种用于将读取头耦合到空腔万向节组件的探针组件,所述探针组件包括多个导电探针,每个导电探针包括主体部分,所述主体部分包括两个基本上平坦的侧表面,以及底表面, 被焊接到空腔万向节组件的层叠挠曲件的相应的垫上,弹簧部分包括远离主体部分延伸的细长臂,该细长臂成形为与读取头的后表面上的垫导电接触 以及附着到所述两个侧表面中的至少一个的非导电粘合剂层,其中所述多个导电探针中的每一个通过所述粘合剂层之一附接到相邻的所述导电探针。

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