OPTICAL PULSE TRAIN GENERATION DEVICE AND OPTICAL PULSE TRAIN GENERATION METHOD

    公开(公告)号:US20240361664A1

    公开(公告)日:2024-10-31

    申请号:US18637686

    申请日:2024-04-17

    IPC分类号: G02F1/35

    摘要: An optical pulse train generation device includes a storage unit and a characteristic setting unit. The storage unit stores a plurality of phase patterns in advance. The plurality of phase patterns are phase patterns for forming, from a first optical pulse, an optical pulse train including a plurality of second optical pulses having time differences therebetween and having different center wavelengths. Between the plurality of phase patterns, one or both of a first characteristic regarding the first optical pulse and a second characteristic regarding the optical pulse train are different. The characteristic setting unit sets the first characteristic and the second characteristic in response to the user's input. The storage unit stores the plurality of phase patterns in association with the first characteristic and the second characteristic. A spatial light modulator displays a phase pattern corresponding to the first characteristic and the second characteristic set by the characteristic setting unit.

    SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANALYSIS METHOD

    公开(公告)号:US20240361382A1

    公开(公告)日:2024-10-31

    申请号:US18579888

    申请日:2022-03-15

    IPC分类号: G01R31/311 G01R31/28

    CPC分类号: G01R31/311 G01R31/2879

    摘要: A semiconductor failure analysis device includes a first analysis unit that emits first irradiation light along a first path set on a first main surface of a semiconductor device, a second analysis unit that emits second irradiation light along a second path set on a second main surface that is a back side of the first main surface, an electric signal acquisition unit that receives an electric signal output from the semiconductor device irradiated with the first irradiation light and the second irradiation light, and a computer that controls the second analysis unit. A size of a first irradiation region is different from a size of a second irradiation region. The computer emits the first irradiation light and the second irradiation light while a state where the entire second irradiation region overlaps the first irradiation region is maintained.

    LASER MODULE
    3.
    发明公开
    LASER MODULE 审中-公开

    公开(公告)号:US20240356307A1

    公开(公告)日:2024-10-24

    申请号:US18630207

    申请日:2024-04-09

    摘要: A laser module according to an embodiment includes a QCL element, a diffraction grating portion configured to diffract and reflect first light emitted from a first end face of the QCL element and return second light as a part of the first light to the first end face, a lens member configured to be disposed between the first end face and the diffraction grating portion and allow the first light and the second light to pass therethrough, and a lens holder configured to support the lens member. The lens member includes a first portion configured to constitute a collimator lens collimating the first light, and a second portion configured to be connected to an outer edge portion of the first portion and not to constitute the collimator lens when viewed from an X-axis direction.

    DYE IMAGE ACQUISITION METHOD, DYE IMAGE ACQUISITION DEVICE, AND DYE IMAGE ACQUISITION PROGRAM

    公开(公告)号:US20240344985A1

    公开(公告)日:2024-10-17

    申请号:US18293518

    申请日:2022-07-25

    IPC分类号: G01N21/64 G06T7/00

    摘要: A dye image acquisition system includes an image acquisition device that irradiates a sample with each of excitation light beams having C wavelength distributions and acquires the C fluorescence images each including N pixels; and an image processing device that clusters the N pixels into L (L is an integer of 2 or more and N−1 or less) pixel groups based on fluorescence intensities of respective pixels of the C fluorescence images, generates L cluster matrices in which the C fluorescence images are arranged, calculates statistical values of the fluorescence intensities of the pixel groups configuring the C fluorescence images, and performs unmixing on the C fluorescence images by using the statistical values of the C fluorescence images, and generates K (K is an integer of 2 or more and C or less) dye images indicating a distribution for each K dyes.

    Semiconductor failure analysis device and semiconductor failure analysis method

    公开(公告)号:US12117480B2

    公开(公告)日:2024-10-15

    申请号:US17798980

    申请日:2020-11-17

    摘要: A semiconductor failure analysis device includes an analysis part that analyzes a failure place in a semiconductor device; a marking part that irradiates the semiconductor device with laser light; a device arrangement part in which a wafer chuck, which holds the semiconductor device and on which an alignment target is provided, moves relative to the analysis part and the marking part; and a control part that outputs commands. The control part moves the wafer chuck to a position at which the analysis part is capable of taking an image of the alignment target, then outputs an alignment command that causes the marking part to be aligned with the analysis part with the alignment target as a reference, and irradiates the semiconductor device with laser light in a state in which a positional relationship between the marking part and the analysis part is maintained.

    MIRROR APPARATUS
    7.
    发明公开
    MIRROR APPARATUS 审中-公开

    公开(公告)号:US20240329391A1

    公开(公告)日:2024-10-03

    申请号:US18623385

    申请日:2024-04-01

    发明人: Tomoyuki IDE

    IPC分类号: G02B26/10 G02B26/08

    CPC分类号: G02B26/101 G02B26/0816

    摘要: A mirror apparatus includes a base portion; a mirror unit; a frame member; and a window member. The frame member includes a first wall portion, a second wall portion, and a pair of standing wall portions. The window member is disposed on a top surface of the first wall portion and a top surface of the second wall portion, and is inclined with respect to a mirror surface. A top surface of each of the pair of standing wall portions includes a flat portion. A width of the top surface and a width of a bottom surface of each of the pair of standing wall portions are wider than a width of the first wall portion and a width of the second wall portion. At least a part of the bottom surface of each of the pair of standing wall portions is in contact with the base portion.

    Optical coherence tomography device

    公开(公告)号:US12098920B2

    公开(公告)日:2024-09-24

    申请号:US17798377

    申请日:2021-01-21

    摘要: An optical coherence tomography device includes a light source, a mirror device including a movable mirror configured to perform a reciprocating operation, a support part configured to support an object, a beam splitter configured to generate interfering light, an optical sensor configured to detect the interfering light, and a control unit. Each of the plurality of pixels included in the optical sensor includes a light receiving part, a plurality of transfer gates, and a discharge gate. The control unit applies an electric signal to the optical sensor so that the plurality of transfer gates are sequentially brought into a charge transfer state in at least three time ranges separated from each other and the discharge gate is brought into a charge discharge state in a time range other than the at least three time ranges for each period of an interferogram signal of the interfering light.