VARIABLE LATCH
    2.
    发明申请
    VARIABLE LATCH 审中-公开
    可变锁

    公开(公告)号:US20070093103A1

    公开(公告)日:2007-04-26

    申请号:US11561684

    申请日:2006-11-20

    申请人: Jason Brand

    发明人: Jason Brand

    IPC分类号: H01R29/00

    CPC分类号: G01R1/07314

    摘要: Numerous embodiments of variable latch and a method of formation are disclosed. One or more embodiments of the claimed subject matter may comprise a latch with a plurality of contact points formed thereon, and method of fabrication. The plurality of contact points may allow adequate socketing of microelectronic packages of varying sizes in a socket assembly, without the need to modify the latch when the microelectronic package size varies.

    摘要翻译: 公开了可变锁存器和形成方法的许多实施例。 所要求保护的主题的一个或多个实施例可以包括其上形成有多个接触点的闩锁和制造方法。 多个接触点可以允许在插座组件中适当地插入具有不同尺寸的微电子封装,而不需要在微电子封装尺寸变化时修改闩锁。

    Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure
    6.
    发明授权
    Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure 有权
    用于感测相变测试电池并确定由于热暴露引起的测试电池电阻变化的装置和方法

    公开(公告)号:US08351289B1

    公开(公告)日:2013-01-08

    申请号:US12655377

    申请日:2009-12-30

    IPC分类号: G11C7/04

    摘要: A phase change memory array may include at least one cell used to determine whether the array has been altered by thermal exposure over time. The cell may be the same or different from the other cells. In some embodiments, the cell is only read in response to an event. If, in response to that reading, it is determined that the cell has changed state or resistance, it may deduce whether the change is a result of thermal exposure. Corrective measures may then be taken.

    摘要翻译: 相变存储器阵列可以包括用于确定阵列是否随时间被热暴露改变的至少一个小区。 细胞可以与其它细胞相同或不同。 在一些实施例中,仅响应于事件读取单元。 如果响应于该读数确定单元格已经改变状态或电阻,则可以推断出该变化是否是热暴露的结果。 然后可采取纠正措施。