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    Method and apparatus for determining in real-time the fatigue life of a structure
    3.
    发明授权
    Method and apparatus for determining in real-time the fatigue life of a structure 有权
    实时确定结构的疲劳寿命的方法和装置

    公开(公告)号：US06449565B1

    公开(公告)日：2002-09-10

    申请号：US09286378

    申请日：1999-04-05

    申请人： Steven E. Budrow ,  Jeffrey R. Davis ,  Kurt A. Plotts

    发明人： Steven E. Budrow ,  Jeffrey R. Davis ,  Kurt A. Plotts

    IPC分类号： G01L100

    CPC分类号： G07C3/00 ,  F05D2220/323

    摘要： A method and apparatus for determining the fatigue life of a structure calculate, in real time, the values for the magnitudes of the stress forces imposed at a particular location on the structure, from one or more sensed structural parameters. Also, the associated temperature values of the structure may be calculated or measured. The calculated stress data are continuously examined, in real time, to determine if the direction of their magnitude is increasing or decreasing. If a change in direction is indicated, the previously stored peak data point in the increasing direction is paired with the previously determined peak data point in the decreasing direction to form a cycle pair. The structural fatigue life is then determined, in real time, from this cycle pair.

    摘要翻译： 用于确定结构的疲劳寿命的方法和装置实时地计算从一个或多个感测结构参数施加在结构上的特定位置处的应力的大小的值。 此外，可以计算或测量结构的相关温度值。 计算的应力数据被实时连续检查，以确定其幅度的方向是增加还是减小。 如果指示方向改变，则增加方向上先前存储的峰值数据点与先前确定的峰值数据点在减小方向上配对以形成周期对。 然后，实时地从该循环对中确定结构疲劳寿命。

    Infrared temperature probe for high pressure use
    4.
    发明授权
    Infrared temperature probe for high pressure use 失效
    红外温度探头用于高压使用

    公开(公告)号：US4444516A

    公开(公告)日：1984-04-24

    申请号：US345130

    申请日：1982-02-02

    申请人： Ashod S. Dostoomian ,  Joseph S. Lord ,  Jeffrey R. Davis

    发明人： Ashod S. Dostoomian ,  Joseph S. Lord ,  Jeffrey R. Davis

    IPC分类号： G01J5/08 ,  G01J5/00 ,  G01J5/04 ,  G02B5/16

    CPC分类号： G01J5/08 ,  G01J5/0037 ,  G01J5/004 ,  G01J5/041 ,  G01J5/0818 ,  G01J5/0821 ,  G01J5/084 ,  G01J5/0862 ,  G01J5/0875 ,  G01J5/046

    摘要： An infrared temperature probe for high pressure use is in the form of a hollow bolt adapted to be threaded into a complementary threaded aperture in the wall of a pressure vessel with the end thereof disposed flush with the internal surface of the pressure vessel wall. An infrared transparent window is secured in the end of the hollow bolt with one surface thereof disposed flush with the end of the bolt. A bundle of optical fibers is secured within the opposite end of the hollow bolt and a glass rod is mounted within the hollow bolt in operative relation to the window and the optical fiber bundle for transmitting infrared radiation from the window to the optical fiber bundle. The interior of the hollow bolt may be supplied with a circulating cooling liquid or gas. An infrared temperature probe can also be used with a mold having an aperture for receiving an ejector pin wherein the hollow ejector pin is provided with an impact surface at one end and an infrared transparent window in the opposite end for receiving infrared radiation from a hot molded article within the mold when the ejector pin is located within the aperture in the mold. A bundle of optical fibers extends through the hollow ejector pin and is disposed in optical transmitting engagement with the window.

    摘要翻译： 用于高压使用的红外温度探头是中空螺栓的形式，其适于在压力容器的壁中螺纹连接到互补的螺纹孔中，其端部与压力容器壁的内表面齐平。 红外透明窗被固定在中空螺栓的端部，其一个表面设置成与螺栓的端部齐平。 一束光纤被固定在中空螺栓的相对端内，并且玻璃杆安装在中空螺栓内，与窗口和光纤束有效连接，用于将红外辐射从窗口传输到光纤束。 中空螺栓的内部可以供应循环冷却液体或气体。 红外温度探测器还可以与具有用于接收顶针的孔的模具一起使用，其中中空顶针在一端设置有冲击表面，在相对端设有红外透明窗，用于接收来自热模制件的红外辐射 当顶针位于模具的孔内时，模具内的物品。 一束光纤延伸穿过中空推顶销并设置成与窗口发生光学传递接合。

    Infrared microscope adapter for viewing at an angle
    5.
    发明授权
    Infrared microscope adapter for viewing at an angle 有权
    红外显微镜适配器，以一角度观看

    公开(公告)号：US06661573B1

    公开(公告)日：2003-12-09

    申请号：US09956259

    申请日：2001-09-17

    申请人： Jeffrey R. Davis

    发明人： Jeffrey R. Davis

    IPC分类号： G02B2100

    CPC分类号： G02B21/24

    摘要： An adapter is interposed between the objective and the microscope. The adapter has a support structure to which are mounted an objective-engaging structure, a microscope-engaging structure, and a reflecting element. The objective-engaging structure and the microscope-engaging structure, when mounted to the support structure, are characterized by respective axes that are non-collinear, and the reflecting element is positioned and oriented so that light incident along the objective-engaging structure's axis is reflected to travel along the microscope-engaging structure's axis. The relative angle between the axes is preferably 90 degrees. A user mounts the adapter to the microscope and the objective to the adapter, at which point, the microscope is capable of viewing a sample at an angle displaced from the vertical. In the specific example of a 90-degree angle, a sample of any size can be viewed merely by bringing the sample beside the microscope and in front of the objective.

    摘要翻译： 物镜和显微镜之间插入适配器。 适配器具有支撑结构，安装有物镜接合结构，显微镜接合结构和反射元件。 目标接合结构和显微镜接合结构在安装到支撑结构时的特征在于各轴是非共线的，并且反射元件被定位和定向成使得沿物体接合结构的轴入射的光是 反射以沿着显微镜接合结构的轴线行进。 轴之间的相对角度优选为90度。 用户将适配器安装到显微镜上，将目标物安装到适配器上，此时显微镜能够以与垂直方向偏离的角度观察样品。 在90度角的具体示例中，可以仅通过将样品放置在显微镜旁边和目标前方来观察任何尺寸的样品。