摘要:
An input device for an electronic device is provided that includes a base, a frame pivotally connected to the base, a roller member rotatably supported by the frame, and at least one button pivotally connected at a side of the base. An electronic device is also provided that includes a first body, a second body pivotally attached to the first body, and an input device located in the first body.
摘要:
The instant pulse filter according to the present invention, which may cause a malfunction or a short life span of a semiconductor device, is made using an aluminum anodic oxidation, comprising—a first step for forming an aluminum thin film layer on an upper side of an insulator substrate; a second step for forming an aluminum oxide thin film layer having a pore by oxidizing the aluminum thin film layer by means of an anodic oxidation; a third step for depositing a metallic material on an upper side of the aluminum thin film layer for filling the pore; a fourth step for forming a nano rod in the interior of the aluminum oxide thin film layer by eliminating the metallic material deposited except in the pore; a fifth step for forming an internal electrode on an upper side of the aluminum oxide thin film layer having the nano rod; a sixth step for forming a protective film layer on an upper side of the same in order to protect the aluminum oxide thin film layer and the internal electrode from the external environment; and a seventh step for forming an external electrode on both sides of the substrate in which the protective film layer is formed.
摘要:
An input device for an electronic device is provided that includes a base, a frame pivotally connected to the base, a roller member rotatably supported by the frame, and at least one button pivotally connected at a side of the base. An electronic device is also provided that includes a first body, a second body pivotally attached to the first body, and an input device located in the first body.
摘要:
Disclosed herein is a semiconductor memory device having a pair of local data lines with a delayed precharge voltage application point. The semiconductor memory device of the present invention includes a delay block for delaying the activation time of a block write control signal, thus lengthening the interval starting from the time when data on a pair of bit lines are amplified to the time when a supply voltage is applied to a pair of local data lines. Therefore, according to the semiconductor memory device of the present invention, the time when the supply voltage is applied to the pair of local data lines is the time after data have sufficiently stabilized on the pair of bit lines. Therefore, the semiconductor memory device of the present invention prevents the stabilization speed of the pair of bit lines and the pair of local data lines from decreasing, thus consequently improving the operating speed of the semiconductor memory device.
摘要:
An on-die termination (ODT) circuit may include an ODT synchronous buffer and/or an ODT gate. The ODT synchronous buffer may be configured to generate a synchronous ODT command from an external ODT command in synchronization with a first clock signal delay-locked to an external clock signal. The ODT gate may be configured to generate signals for controlling ODT based on a second clock signal delay-locked to the external clock signal and the synchronous ODT command. The synchronous ODT command may be generated in a disabled period of the second clock signal.
摘要:
In an embodiment, a device controls an internal power voltage in a semiconductor device. The device uses internal and external power voltages during a power-up period, and includes a power-up flag signal generator and a control circuit. The power-up flag signal generator generates a power-up flag signal based on the external power voltage. The control circuit provides a first internal power voltage to a peripheral circuit of the semiconductor device. During power-up the first internal power voltage varies according to a level of the external power voltage in response to the power-up flag signal having a first logic level. Accordingly, an internal power voltage may have a linear power-up slope during the power-up period and an initialization failure of any latch circuits in the peripheral circuit may be avoided. Also, power consumption of the latch circuits is reduced.
摘要:
The instant pulse filter according to the present invention, which may cause a malfunction or a short life span of a semiconductor device, is made using an aluminum anodic oxidation, comprising—a first step for forming an aluminum thin film layer on an upper side of an insulator substrate; a second step for forming an aluminum oxide thin film layer having a pore by oxidizing the aluminum thin film layer by means of an anodic oxidation; a third step for depositing a metallic material on an upper side of the aluminum thin film layer for filling the pore; a fourth step for forming a nano rod in the interior of the aluminum oxide thin film layer by eliminating the metallic material deposited except in the pore; a fifth step for forming an internal electrode on an upper side of the aluminum oxide thin film layer having the nano rod; a sixth step for forming a protective film layer on an upper side of the same in order to protect the aluminum oxide thin film layer and the internal electrode from the external environment; and a seventh step for forming an external electrode on both sides of the substrate in which the protective film layer is formed.
摘要:
A buffer has an amplifier that receives an external signal, a reference voltage, and outputs an amplified signal. The amplified signal is responsive to the difference between the external signal and the reference voltage. An inverter receives the amplified signal and generates an inverted signal. A voltage supply circuit is configured to provide an adjusted power supply voltage to the inverter responsive to the reference voltage. A ground voltage supply circuit is configured to provide an adjusted ground voltage to the inverter responsive to the reference voltage.
摘要:
A semiconductor device for generating a test voltage for a wafer burn-in test and method thereof is disclosed. To generate the test voltage for a wafer burn-in test, a control signal may be generated in response to a supply voltage from an external wafer burn-in test device. A supplementary voltage may be generated in response to the control signal by using an internal voltage driving circuit. The test voltage may be generated by combining the supply voltage and the supplementary voltage.
摘要:
Disclosed herein is a semiconductor memory device having a pair of local data lines with a delayed precharge voltage application point. The semiconductor memory device of the present invention includes a delay block for delaying the activation time of a block write control signal, thus lengthening the interval starting from the time when data on a pair of bit lines are amplified to the time when a supply voltage is applied to a pair of local data lines. Therefore, according to the semiconductor memory device of the present invention, the time when the supply voltage is applied to the pair of local data lines is the time after data have sufficiently stabilized on the pair of bit lines. Therefore, the semiconductor memory device of the present invention prevents the stabilization speed of the pair of bit lines and the pair of local data lines from decreasing, thus consequently improving the operating speed of the semiconductor memory device.