Method for producing semiconductor device
    9.
    发明授权
    Method for producing semiconductor device 有权
    半导体器件的制造方法

    公开(公告)号:US07824957B2

    公开(公告)日:2010-11-02

    申请号:US12475104

    申请日:2009-05-29

    IPC分类号: H01L21/423

    摘要: During a process of forming an active layer of a semiconductor device using a ZnO film, the ZnO film is laser-annealed with an ultraviolet pulsed laser to reduce the resistance of the film, and then oxidation treatment is applied to increase the specific resistance value at a channel portion of the ZnO film, which once has excessively low resistance after the laser annealing, to 103Ω·cm or more.

    摘要翻译: 在使用ZnO膜形成半导体器件的有源层的过程中,用紫外脉冲激光对ZnO膜进行激光退火,以降低膜的电阻,然后进行氧化处理以提高电阻率 在激光退火后一次具有过低电阻的ZnO膜的通道部分为103Ω·cm·cm以上。