摘要:
A pusher 30 is composed of a pusher base 31 and a pressing body 32 attached to the pusher base 31 in a removable way. Specifically, a base portion of the pressing body 32 is provided with a flange portion 321, and the pusher base 31 is provided with a plate 33 having a U-shape when seen two-dimensionally. By sliding the pressing body 32 with respect to the pusher base 31 with the flange portion 321 of the pressing body 32 supported by the plate 33, the pressing body 32 can be attached to and removed from the pusher 30 without using any tools.
摘要:
A customer tray storing apparatus which is capable of storing customer trays in a stocker by moving them in the horizontal direction as well as removing them from the stocker in the horizontal direction. The customer tray storing apparatus comprises a generally rectangular bottom frame for resting thereon customer trays, guide pins attached to the bottom frame adjacent the opposite ends of one of the minor sides of the frame, a pair of door posts attached to the bottom frame adjacent the opposite ends of the other minor side of the bottom frame, a pair of guide rails attached to the bottom frame along the opposed major sides of the bottom frame, and a door pivotally supported by the pair of door posts at their lower ends. The door comprises a generally square or rectangular door member and a pair of reinforcing beams supporting the door member along the opposite lateral side portions thereof. The reinforcing beams are provided at their lower ends with pivot shafts. The door is pivotally supported by the pivot shafts fitted in corresponding bearings provided in the pair of door posts adjacent their lower ends.
摘要:
A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.
摘要:
A pusher 30 is composed of a pusher base 31 and a pressing body 32 attached to the pusher base 31 in a removable way. Specifically, a base portion of the pressing body 32 is provided with a flange portion 321, and the pusher base 31 is provided with a plate 33 having a U-shape when seen two-dimensionally. By sliding the pressing body 32 with respect to the pusher base 31 with the flange portion 321 of the pressing body 32 supported by the plate 33, the pressing body 32 can be attached to and removed from the pusher 30 without using any tools.
摘要:
An automatic handler for an IC test system is disclosed which is capable of reducing a time for transferring IC devices to be tested from a supply area to a test head area and from the test head area to a discharge area. The automatic handler includes a test tray for loading the IC devices to be tested in which the IC devices to be tested are aligned in the test tray with a shorter distance with one another than a distance between test contactors in the test head area, a pair of positioning stoppers provided in the test head area along a moving direction of the test tray in which the positioning stoppers are spaced by the distance equal to the distance of the IC devices to be tested in the test tray. In the automatic handler, the distance of the contactors is adjusted to an integer multiple of the distance of the IC devices to be tested in the test tray. One of the positioning stoppers contacts the test tray to determine a first position for testing the IC devices in a first line in the test tray, and then the test tray is transferred until other positioning stoppers contacts the test tray in a second position for testing the IC devices in a second line in the test tray. The test tray is then transferred to the discharge area. Another aspect of the automatic handler is provided with a groove on the test tray to increase a number of test position for the test tray. The groove includes an end surface which engages with the positioning stoppers.
摘要:
A tray transfer arm which is widely used regardless of kinds of customer trays and capable of maintaining the stability of holding ICs to be tested. The tray transfer arm for transferring customer trays KST loaded with a plurality of ICs to be tested comprises a cover plate for covering the opening surface of a pocket of the tray.