Polarized illumination and detection for metrological applications
    1.
    发明授权
    Polarized illumination and detection for metrological applications 失效
    极化照明和测量应用的检测

    公开(公告)号:US06590654B1

    公开(公告)日:2003-07-08

    申请号:US09788325

    申请日:2001-02-16

    IPC分类号: G01J400

    摘要: An apparatus and method for enhancing the proportion of detected light that has been diffusely scattered by a surface light to light specularly reflected from the surface. A beam of light having a direction of predominant polarization is directed through a wedge module so as to illuminate the scene. The wedge module has two optically anisotropic wedges and an optical compensation plate. The polarization axes of the first and second wedges are substantially parallel to the direction of predominant polarization of the illuminating beam. Light scattered by the surface is detected through a polarizer.

    摘要翻译: 一种用于增强被表面光漫反射的检测光的比例的表面上镜面反射的光的装置和方法。 具有主要极化方向的光束被引导通过楔形模块以照亮场景。 楔形模块具有两个光学各向异性楔块和光学补偿板。 第一和第二楔形物的偏振轴基本上平行于照明光束的主要偏振方向。 通过偏振器检测由表面散射的光。