Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    1.
    发明授权
    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same 失效
    被配置为检测其温度传感器的故障的存储器件及其操作和测试方法

    公开(公告)号:US07324398B2

    公开(公告)日:2008-01-29

    申请号:US11236372

    申请日:2005-09-27

    IPC分类号: G11C7/04

    摘要: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

    摘要翻译: 存储器装置包括:温度传感器,被配置为响应于存储器件的温度产生温度检测信号;以及自刷新控制电路,被配置为根据温度检测信号控制存储器件的刷新。 该装置还包括温度检测误差感测电路,其配置为响应温度检测信号的误差来声明温度检测误差信号。 温度检测误差感测电路可以被配置为在被配置为耦合到外部设备的温度检测误差感测板处提供断言的温度检测误差信号,和/或该设备还可以包括温度传感器控制 配置为响应于温度检测误差信号来控制温度检测信号的电路。 可以提供相关的操作和测试方法。

    SMART DESIGN SYSTEM PROVIDING MOBILE APPLICATION DESIGN AND SIMULATION FUNCTION, BUSINESS MODEL HAVING THE SAME, AND OPERATING METHOD OF SMART DESIGN SYSTEM
    2.
    发明申请
    SMART DESIGN SYSTEM PROVIDING MOBILE APPLICATION DESIGN AND SIMULATION FUNCTION, BUSINESS MODEL HAVING THE SAME, AND OPERATING METHOD OF SMART DESIGN SYSTEM 审中-公开
    智能设计系统提供移动应用设计和仿真功能,具有相同功能的业务模型以及智能设计系统的操作方法

    公开(公告)号:US20140297367A1

    公开(公告)日:2014-10-02

    申请号:US14199138

    申请日:2014-03-06

    IPC分类号: G06Q30/06 G06Q30/02

    CPC分类号: G06Q30/0621 G06Q30/0204

    摘要: A smart design system provides a mobile application design and a simulation function, a business model including the smart design system, and a method of operating the smart design system. A method of operating a smart design system includes selecting at least one product of a plurality of products by searching a database storing information related to the plurality of products. The method includes designing an application that includes the selected at least one product. The designing may be used to produce the application. The method includes providing at least one recommended product of the plurality of products. The recommended product is applicable to the application. The method includes providing a market trend analysis. The market trend analysis is generated by searching for information related to a market trend of at least one of the plurality of products applicable to the application.

    摘要翻译: 智能设计系统提供移动应用设计和仿真功能,包括智能设计系统的业务模型以及操作智能设计系统的方法。 操作智能设计系统的方法包括通过搜索存储与多个产品相关的信息的数据库来选择多个产品中的至少一个产品。 该方法包括设计包括所选择的至少一个产品的应用。 该设计可用于生产应用程序。 该方法包括提供多个产品中的至少一个推荐产品。 推荐的产品适用于该应用。 该方法包括提供市场趋势分析。 通过搜索与适用于该应用的多个产品中的至少一个的市场趋势相关的信息来产生市场趋势分析。

    Semiconductor memory device having internal circuits responsive to temperature data and method thereof
    3.
    发明授权
    Semiconductor memory device having internal circuits responsive to temperature data and method thereof 失效
    具有响应于温度数据的内部电路的半导体存储器件及其方法

    公开(公告)号:US07554869B2

    公开(公告)日:2009-06-30

    申请号:US10981652

    申请日:2004-11-05

    IPC分类号: G11C7/04

    摘要: A semiconductor memory device having internal circuits responsive to temperature data, in order to compensate an output characteristic change of the internal circuits and reduce power consumption depending on temperature change, and method thereof are disclosed. The semiconductor memory device may include a temperature sensing circuit and an internal circuit. The temperature sensing circuit may generate and output temperature data in response to ambient temperature of the semiconductor memory device. The internal circuit may adjust an output level of an output signal in response to the temperature data from the temperature sensing circuit.

    摘要翻译: 具有响应于温度数据的内部电路的半导体存储器件及其方法被公开,以便补偿内部电路的输出特性变化并降低根据温度变化的功耗。 半导体存储器件可以包括温度检测电路和内部电路。 温度检测电路可以响应于半导体存储器件的环境温度产生和输出温度数据。 内部电路可以响应于来自温度感测电路的温度数据来调节输出信号的输出电平。

    Apparatus for controlling operation of reciprocating compressor and method thereof
    4.
    发明授权
    Apparatus for controlling operation of reciprocating compressor and method thereof 有权
    用于控制往复式压缩机的操作的装置及其方法

    公开(公告)号:US07459868B2

    公开(公告)日:2008-12-02

    申请号:US11269691

    申请日:2005-11-09

    IPC分类号: H02P1/00

    摘要: An apparatus and method are disclosed to control an operation of a reciprocating compressor capable of precisely controlling an operation (stroke) of a reciprocating compressor regardless of a parameter of an internal motor of the reciprocating compressor and a mechanical error of the reciprocating compressor. The apparatus for controlling an operation of a reciprocating compressor which determines a stroke estimate value corresponding to a point when a discharge valve of the reciprocating compressor is opened as a stroke reference value, and controls a voltage applied to the reciprocating compressor according to the determined stroke reference value.

    摘要翻译: 公开了一种用于控制能够精确地控制往复式压缩机的操作(行程)的往复式压缩机的操作的装置和方法,而与往复式压缩机的内部电动机的参数以及往复式压缩机的机械误差无关。 用于控制往复式压缩机的操作的装置,其确定对应于往复式压缩机的排出阀打开的点作为行程参考值的行程估计值,并且根据确定的行程来控制施加到往复式压缩机的电压 参考值。

    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    5.
    发明申请
    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same 失效
    被配置为检测其温度传感器的故障的存储器件及其操作和测试方法

    公开(公告)号:US20060077742A1

    公开(公告)日:2006-04-13

    申请号:US11236372

    申请日:2005-09-27

    IPC分类号: G11C7/00

    摘要: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

    摘要翻译: 存储装置包括:温度传感器,被配置为响应于存储器件的温度产生温度检测信号;以及自刷新控制电路,被配置为根据温度检测信号控制存储器件的刷新。 该装置还包括温度检测误差感测电路,其配置为响应温度检测信号的误差来声明温度检测误差信号。 温度检测误差感测电路可以被配置为在被配置为耦合到外部设备的温度检测误差感测板处提供断言的温度检测误差信号,和/或该设备还可以包括温度传感器控制 配置为响应于温度检测误差信号来控制温度检测信号的电路。 可以提供相关的操作和测试方法。