Optical wave interference measuring apparatus
    1.
    发明授权
    Optical wave interference measuring apparatus 有权
    光波干涉测量仪

    公开(公告)号:US07982882B2

    公开(公告)日:2011-07-19

    申请号:US12571993

    申请日:2009-10-01

    IPC分类号: G01B11/02

    摘要: The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light that travels while being converged by a Mirau objective interference optical system is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

    摘要翻译: 测试表面的相对位置从表面中心轴与测量光轴对准的参考位置顺序地改变,使得测量光轴顺序地移动到通过将测试表面分成直径而获得的多个环形区域 方向。 每当相对位置改变时,测试表面都会在旋转轴上旋转。 在由Mirau物镜干涉光学系统会聚的同时行进的测量光被照射到旋转测试表面,并且一维图像传感器在多个旋转位置的每一个处捕获干涉条纹。 基于每个旋转位置处的捕获的干涉条纹来计算每个环形区域的形状信息,并且形状信息被连接以计算整个测量区域的形状信息。

    OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
    2.
    发明申请
    OPTICAL WAVE INTERFERENCE MEASURING APPARATUS 失效
    光波干扰测量装置

    公开(公告)号:US20100091299A1

    公开(公告)日:2010-04-15

    申请号:US12578997

    申请日:2009-10-14

    IPC分类号: G01B11/24

    CPC分类号: G01M11/0271 G01M11/025

    摘要: The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light composed of a plane wave is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

    摘要翻译: 测试表面的相对位置从表面中心轴与测量光轴对准的参考位置顺序地改变,使得测量光轴顺序地移动到通过将测试表面分成直径而获得的多个环形区域 方向。 每当相对位置改变时,测试表面都会在旋转轴上旋转。 由平面波构成的测量光被照射到旋转测试表面,并且一维图像传感器在多个旋转位置中的每一个处捕获干涉条纹。 基于每个旋转位置处的捕获的干涉条纹来计算每个环形区域的形状信息,并且形状信息被连接以计算整个测量区域的形状信息。

    Eyepiece lens for a display image observation device
    3.
    发明授权
    Eyepiece lens for a display image observation device 有权
    用于显示图像观察装置的目镜

    公开(公告)号:US06181479B2

    公开(公告)日:2001-01-30

    申请号:US09391043

    申请日:1999-09-16

    申请人: Noboru Koizumi

    发明人: Noboru Koizumi

    IPC分类号: G02B2500

    CPC分类号: G02B25/001

    摘要: An eyepiece lens for a display image observation device is disclosed that has only six lens elements with refractive power, in the order from the eye side, as follows: a first lens group G1 formed of two lens elements L1 and L2, both of positive refractive power, with the lens element L1 on the eye side being of positive meniscus shape with its convex surface on the eye side; a second lens group G2 formed of two lens elements L3 and L4 which are either separated by air or cemented together, the first of the lens elements on the eye side (i.e., L3) having negative refractive power and the other having positive refractive power; and a third lens group G3 formed of two lens elements which are either separated by air or cemented together, the first of the lens elements on the eye side (i.e., L5) having positive refractive power and the other having negative refractive power. Preferably, one of the surfaces of the lens elements in the first lens group G1 is aspherical, and specified conditions are satisfied in order to achieve favorable aberration correction in an eyepiece lens that is compact.

    摘要翻译: 公开了一种用于显示图像观察装置的目镜透镜,其具有如下从眼睛的顺序具有屈光力的六个透镜元件:由两个透镜元件L1和L2形成的第一透镜组G1,正折射率 功率,眼睛侧的透镜元件L1具有正的弯月面形状,其凸面在眼睛侧; 由空气分离或粘合在一起的两个透镜元件L3和L4形成的第二透镜组G2,眼睛侧的第一透镜元件(即,L3)具有负折射光焦度,另一个具有正折射光焦度; 以及由空气分离或粘合在一起的两个透镜元件形成的第三透镜组G3,眼睛侧的第一透镜元件(即,L5)具有正的折射光焦度,另一个具有负折光力。 优选地,第一透镜组G1中的透镜元件的一个表面是非球面的,并且为了在紧凑的目镜中实现良好的像差校正,满足特定条件。

    Permanent magnet type demagnetizing head
    5.
    发明授权
    Permanent magnet type demagnetizing head 失效
    永磁式消磁头

    公开(公告)号:US4882559A

    公开(公告)日:1989-11-21

    申请号:US131392

    申请日:1987-12-10

    IPC分类号: G11B5/325

    摘要: A permanent magnet type demagnetizing head has a first magnetic part disposed on a front part(21a.sup.1, 21a.sup.2, 21a.sup.3) of a tape running surface of a magnetic material, a second magnetic part (21c) disposed on a rear part of the tape running surface and a non-magnetic part or a feeble magnetic part (21b) disposed between the first and the second magnetic parts in the tape running direction; and the first magnetic part is magnetized in a magnetic pattern having plural magnetized regions of one or more N-pole and S-pole; the second magnetic part is magnetized in a magnetic pattern of alternating stripes of N-pole regions and S-pole regions, the boundaries between neighboring N-pole regions and S-pole regions are inclined, and the intensity of magnetization are gradually reduced in the tape running direction.

    摘要翻译: 永久磁铁型退磁头具有设置在磁性材料的带子运行表面的前部(21a1,21a2,21a3a)上的第一磁性部分,设置在磁带运行表面的后部的第二磁性部分(21c) 以及设置在带运行方向上的第一和第二磁性部分之间的非磁性部分或微弱磁性部分(21b) 并且第一磁性部件以具有一个或多个N极和S极的多个磁化区域的磁性图案磁化; 第二磁性部分以N极区域和S极区域的交替条纹的磁性图案被磁化,相邻的N极区域和S极区域之间的边界是倾斜的,并且磁化强度逐渐减小 磁带运行方向。

    THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE
    6.
    发明申请
    THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE 审中-公开
    三维形状测量方法和装置

    公开(公告)号:US20100231923A1

    公开(公告)日:2010-09-16

    申请号:US12721084

    申请日:2010-03-10

    IPC分类号: G01B11/25

    摘要: A process of measuring a shape while changing the relative posture of an microscopic interferometer to a sample lens which is rotated about a rotation axis is divided into a process of measuring a top surface in a state where the sample lens is supported from a back surface and a process of measuring a back surface in a state where the sample lens is supported from the top surface. By combining first shape information of a flange side surface acquired by the process of measuring the top surface and second shape information of the flange side surface acquired by the process of measuring the back surface, the relative positional relation between the sample top surface and the sample back surface is calculated.

    摘要翻译: 在将微型干涉仪相对于相对于旋转轴线旋转的样本透镜的相对姿势变化的同时测量形状的处理被划分为从背面支撑样本透镜的状态下测量顶面的处理, 在从上表面支撑样本透镜的状态下测量背面的处理。 通过组合通过测量上表面获得的凸缘侧表面的第一形状信息和通过测量背面的处理获得的凸缘侧表面的第二形状信息,样本顶表面和样本之间的相对位置关系 计算背面。

    OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
    7.
    发明申请
    OPTICAL WAVE INTERFERENCE MEASURING APPARATUS 有权
    光波干扰测量装置

    公开(公告)号:US20100097619A1

    公开(公告)日:2010-04-22

    申请号:US12571993

    申请日:2009-10-01

    IPC分类号: G01B11/02

    摘要: The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light that travels while being converged by a Mirau objective interference optical system is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

    摘要翻译: 测试表面的相对位置从表面中心轴与测量光轴对准的参考位置顺序地改变,使得测量光轴顺序地移动到通过将测试表面分成直径而获得的多个环形区域 方向。 每当相对位置改变时,测试表面都会在旋转轴上旋转。 在由Mirau物镜干涉光学系统会聚的同时行进的测量光被照射到旋转测试表面,并且一维图像传感器在多个旋转位置的每一个处捕获干涉条纹。 基于每个旋转位置处的捕获的干涉条纹来计算每个环形区域的形状信息,并且形状信息被连接以计算整个测量区域的形状信息。

    Eyepiece for picture display device
    8.
    发明授权
    Eyepiece for picture display device 失效
    目镜用于图像显示装置

    公开(公告)号:US06414798B1

    公开(公告)日:2002-07-02

    申请号:US09638064

    申请日:2000-08-15

    申请人: Noboru Koizumi

    发明人: Noboru Koizumi

    IPC分类号: G02B300

    摘要: An eyepiece, consisting of two lens groups, is lighter in weight and more compact than known previously, yet has aberrations that are favorably corrected despite the eyepiece having a large exit pupil diameter. This is accomplished by including a predetermined diffraction optical element (DOE) surface on one of the optical elements in order to minimize the number of lens elements that are required, while simultaneously ensuring the image is of high quality. Thus, a high quality image may be observed even while walking, riding in a vehicle, or the like. In order from the eye side, the first lens group has positive refractive power with its surface nearest the eye side being convex and its surface farthest from the eye side being concave. The first lens group may be formed of a single lens element or a pair of lens elements that are cemented together. Among the two lens groups, the eyepiece includes at least one negative lens element and at least two positive lens elements. Preferably, specified conditions are satisfied to ensure that the eyepiece is compact, yet well-corrected for aberrations.

    摘要翻译: 由两个透镜组组成的目镜比以前更重,更紧凑,但是尽管目镜具有大的出射光瞳直径,但是具有有利地校正的像差。 这通过在光学元件之一上包括预定的衍射光学元件(DOE)表面来实现,以便最小化所需的透镜元件的数量,同时确保图像具有高质量。 因此,即使在行走,搭乘车辆等时也可以观察到高质量的图像。 从眼睛侧起,第一透镜组具有正折射力,其最靠近眼睛侧的表面是凸的,并且其距离眼睛侧最远的表面是凹形的。 第一透镜组可以由单个透镜元件或一对胶合在一起的透镜元件形成。 在两个透镜组中,目镜包括至少一个负透镜元件和至少两个正透镜元件。 优选地,满足特定条件以确保目镜紧凑,但是对于像差进行了良好的校正。

    Optical wave interference measuring apparatus
    9.
    发明授权
    Optical wave interference measuring apparatus 失效
    光波干涉测量仪

    公开(公告)号:US08059278B2

    公开(公告)日:2011-11-15

    申请号:US12578997

    申请日:2009-10-14

    IPC分类号: G01B11/02

    CPC分类号: G01M11/0271 G01M11/025

    摘要: The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light composed of a plane wave is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

    摘要翻译: 测试表面的相对位置从表面中心轴与测量光轴对准的参考位置顺序地改变,使得测量光轴顺序地移动到通过将测试表面分成直径而获得的多个环形区域 方向。 每当相对位置改变时,测试表面都会在旋转轴上旋转。 由平面波构成的测量光被照射到旋转测试表面,并且一维图像传感器在多个旋转位置中的每一个处捕获干涉条纹。 基于每个旋转位置处的捕获的干涉条纹来计算每个环形区域的形状信息,并且形状信息被连接以计算整个测量区域的形状信息。

    Image forming apparatus with neighboring pixel processing
    10.
    发明授权
    Image forming apparatus with neighboring pixel processing 失效
    具有相邻像素处理的图像形成装置

    公开(公告)号:US5467422A

    公开(公告)日:1995-11-14

    申请号:US920852

    申请日:1992-07-28

    IPC分类号: H04N1/405 H04N1/40 G01D15/14

    CPC分类号: H04N1/4056

    摘要: An apparatus for forming an electrostatic latent image for each pixel on a photoreceptor, wherein each pixel has an imaging unit area and the dot is formed in the imaging unit area. There are provided types of reference wave signals to provide plural different modulating image signals for each pixel so that the dot can be exposed at different positions in the imaging unit area in accordance with position information obtained by processing image signals of pixels neighboring a target pixel.

    摘要翻译: 一种用于在感光体上形成每个像素的静电潜像的装置,其中每个像素具有成像单元区域,并且点形成在成像单元区域中。 提供了各种参考波信号,以便为每个像素提供多个不同的调制图像信号,以便根据通过处理邻近目标像素的像素的图像信号获得的位置信息,可以在成像单元区域的不同位置曝光点。