Abstract:
Methods of forming a semiconductor device include forming a dielectric layer on a Group III-nitride semiconductor layer, selectively removing portions of the dielectric layer over spaced apart source and drain regions of the semiconductor layer, implanting ions having a first conductivity type directly into the source and drain regions of the semiconductor layer, annealing the semiconductor layer and the dielectric layer to activate the implanted ions, and forming metal contacts on the source and drain regions of the semiconductor layer.
Abstract:
High electron mobility transistors and/or methods of fabricating high electron mobility transistors that include a first Group III-nitride layer having vertically grown regions, laterally grown regions and a coalescence region are provided. A Group III-nitride channel layer is provided on the first Group III-nitride layer and a Group III-nitride barrier layer is provided on the Group III-nitride channel layer. A drain contact, a source contact and a gate contact are provided on the barrier layer. The gate contact is disposed on a portion of the barrier layer on a laterally grown region of the first Group III-nitride layer and at least a portion of one of the source contact and/or the drain contact is disposed on a portion of the barrier layer on a vertically grown region of the first Group III-nitride layer.
Abstract:
Group III Nitride based field effect transistor (FETs) are provided having a power degradation of less than about 3.0 dB when operated at a drain-to-source voltage (VDS) of about from about 28 to about 70 volts, a gate to source voltage (Vgs) of from about −3.3 to about −14 volts and a normal operating temperature for at least about 10 hours.
Abstract:
The present invention is directed to systems, apparatus, methods and procedures for the noninvasive treatment of tissue using microwave energy. In one embodiment of the invention a medical device and associated apparatus and procedures are used to treat dermatological conditions using microwave energy.
Abstract:
This application discloses active movement based and other video games which may be played over the internet as well in the home or elsewhere. One or two or more persons can play, generally using one or more cameras to determine the relation of an object or a part of a person to a video display on which game related graphics are displayed. Determination of object position and orientation in up to 6 degrees of freedom is disclosed, at data rates sufficient to make game play rewarding.
Abstract:
A teething device comprising a shield connected to a gum soothing portion formed from a frame is disclosed. The frame is configured to locate underneath a lip and against a gum of an infant when in use. Furthermore, the frame is shaped so as to conform to an infant's gumso as to produce a massaging effect on said gum.
Abstract:
A conditioned vestibule, control system, and method are disclosed for use with a cold storage doorway that separates warm and cold sides. A heater warms an air stream discharged across the doorway by the vestibule. A control unit operates the heater to maintain an air stream temperature. The control unit continuously monitors the air stream temperature and operates the heater to maintain the air stream temperature in a non-saturated state based on a humidity ratio. One embodiment calculates first and second temperatures based, respectively, warm and cold side tangent lines to a psychrometric saturation curve and based on the humidity ratio. The tangent lines are based on humidity and temperature sensed on the warm and cold sides. The air stream is warmed to at least the greater of the first and second temperatures. One embodiment controls air flow to adjust the humidity ratio to more efficiently operate the vestibule.
Abstract:
Group III Nitride based field effect transistor (FETs) are provided having a power degradation of less than about 3.0 dB when operated at a drain-to-source voltage (VDS) of about from about 28 to about 70 volts, a gate to source voltage (Vgs) of from about −3.3 to about −14 volts and a normal operating temperature for at least about 10 hours.