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公开(公告)号：US08166446B2
公开(公告)日：2012-04-24
申请号：US12173463
申请日：2008-07-15
CPC分类号： G01R1/07371 , G01R31/2808
摘要： A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate. The lower probe plate includes a plurality of openings associated with the openings in the upper probe plate. The test fixture also includes a plurality of probes extending through the associated openings in the upper and the lower probe plates, contacting one of the contact pads, and guided to test points of the ECB by the associated openings.
摘要翻译： 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板（ECB）的系统，包括：接口固定装置，具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源，其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。 下探针板包括与上探针板中的开口相关联的多个开口。 测试夹具还包括多个探针，其延伸穿过上和下探针板中的相关联的开口，接触其中一个接触垫，并通过相关的开口被引导到ECB的测试点。
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公开(公告)号：US08407657B2
公开(公告)日：2013-03-26
申请号：US13427532
申请日：2012-03-22
IPC分类号： G06F11/22 , G06F17/50 , G01R31/304 , G01R31/306 , G01R31/309
CPC分类号： G01R1/07371 , G01R31/2808
摘要： A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate. The lower probe plate includes a plurality of openings associated with the openings in the upper probe plate.
摘要翻译： 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板（ECB）的系统，包括：接口固定装置，具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源，其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。 下探针板包括与上探针板中的开口相关联的多个开口。
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公开(公告)号：US20120217988A1
公开(公告)日：2012-08-30
申请号：US13427532
申请日：2012-03-22
IPC分类号： G01R31/00
CPC分类号： G01R1/07371 , G01R31/2808
摘要： A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate.
摘要翻译： 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板（ECB）的系统，包括：接口固定装置，具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源，其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。
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公开(公告)号：US20090072849A1
公开(公告)日：2009-03-19
申请号：US12173463
申请日：2008-07-15
IPC分类号： G01R31/28
CPC分类号： G01R1/07371 , G01R31/2808
摘要： A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate. The lower probe plate includes a plurality of openings associated with the openings in the upper probe plate. The test fixture also includes a plurality of probes extending through the associated openings in the upper and the lower probe plates, contacting one of the contact pads, and guided to test points of the ECB by the associated openings.
摘要翻译： 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板（ECB）的系统，包括：接口固定装置，具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源，其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。 下探针板包括与上探针板中的开口相关联的多个开口。 测试夹具还包括多个探针，其延伸穿过上和下探针板中的相关联的开口，接触其中一个接触垫，并通过相关的开口被引导到ECB的测试点。
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