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公开(公告)号:US08332641B2
公开(公告)日:2012-12-11
申请号:US12363259
申请日:2009-01-30
申请人: Lawrence L. Case , Asaf Ashkenazi , Ruchir Chhabra , Carlin R. Covey , David H. Hartley , Troy E. Mackie , Alistair N. Muir , Mark D. Redman , Thomas E. Tkacik , John J. Vaglica , Rodney D. Ziolkowski
发明人: Lawrence L. Case , Asaf Ashkenazi , Ruchir Chhabra , Carlin R. Covey , David H. Hartley , Troy E. Mackie , Alistair N. Muir , Mark D. Redman , Thomas E. Tkacik , John J. Vaglica , Rodney D. Ziolkowski
IPC分类号: G06F9/00
CPC分类号: G06F11/3656 , H04L9/3247 , H04L9/3271
摘要: Under the direction of a first party, an integrated circuit (IC) device is configured to temporarily enable access to a debug interface of the IC device via authentication of the first party by a challenge/response process using a key of the IC device and a challenge value generated at the IC device. The first party then may conduct a software evaluation of the IC device via the debug interface. In response to failing to identify an issue with the IC device from the software evaluation, the first party can permanently enable open access to the debug interface while authenticated and provide the IC device to a second party. Under the direction of the second party, a hardware evaluation of the IC device is conducted via the debug interface that was permanently opened by the first party.
摘要翻译: 在第一方的指导下,集成电路(IC)装置被配置为通过使用IC装置的密钥的询问/响应处理来暂时使能通过第一方的认证访问IC设备的调试接口,以及 在IC器件产生的挑战值。 第一方然后可以通过调试接口对IC设备进行软件评估。 响应于从软件评估中未能识别IC设备的问题,第一方可以在认证时永久地启用对调试接口的开放访问,并将IC设备提供给第二方。 在第二方的指导下,通过由第一方永久打开的调试接口进行IC设备的硬件评估。
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公开(公告)号:US20100199077A1
公开(公告)日:2010-08-05
申请号:US12363259
申请日:2009-01-30
申请人: Lawrence L. Case , Asaf Ashkenazi , Ruchir Chhabra , Carlin R. Covey , David H. Hartley , Troy E. Mackie , Alistair N. Muir , Mark D. Redman , Thomas E. Tkacik , John J. Vaglica , Rodney D. Ziolkowski
发明人: Lawrence L. Case , Asaf Ashkenazi , Ruchir Chhabra , Carlin R. Covey , David H. Hartley , Troy E. Mackie , Alistair N. Muir , Mark D. Redman , Thomas E. Tkacik , John J. Vaglica , Rodney D. Ziolkowski
CPC分类号: G06F11/3656 , H04L9/3247 , H04L9/3271
摘要: Under the direction of a first party, an integrated circuit (IC) device is configured to temporarily enable access to a debug interface of the IC device via authentication of the first party by a challenge/response process using a key of the IC device and a challenge value generated at the IC device. The first party then may conduct a software evaluation of the IC device via the debug interface. In response to failing to identify an issue with the IC device from the software evaluation, the first party can permanently enable open access to the debug interface while authenticated and provide the IC device to a second party. Under the direction of the second party, a hardware evaluation of the IC device is conducted via the debug interface that was permanently opened by the first party.
摘要翻译: 在第一方的指导下,集成电路(IC)装置被配置为通过使用IC装置的密钥的询问/响应处理来暂时使能通过第一方的认证访问IC设备的调试接口,以及 在IC器件产生的挑战值。 第一方然后可以通过调试接口对IC设备进行软件评估。 响应于从软件评估中未能识别IC设备的问题,第一方可以在认证时永久地启用对调试接口的打开访问,并将IC设备提供给第二方。 在第二方的指导下,通过由第一方永久打开的调试接口进行IC设备的硬件评估。
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