摘要:
In an embodiment, a sense amplifier can perform a stable differential amplifying operation while having a high differential amplification gain. The sense amplifier comprises a current sense amplification unit, a voltage difference amplification unit, and an output stabilization unit. The current sense amplification unit receives differential input currents and generates differential output voltages corresponding to the differential input currents. The voltage difference amplification unit amplifies a voltage level difference between the differential output voltages through positive feedback using cross-coupled transistors. The output stabilization unit connects output stabilizing elements having a positive input resistance in parallel with the voltage difference amplification unit having a negative input resistance to stabilize the output of the voltage difference amplification unit.
摘要:
A method of configuring a memory cell array block includes dividing a first unit logic block into sub-array blocks and assigning a portion of the sub-array blocks to a second unit logic block, wherein the memory cell array block corresponds to the portion of the sub-array blocks and the second unit logic block, and the portion of the sub-array blocks and the second unit logic block share a peripheral circuit. The first unit logic block may be divided into the sub-array blocks based on a unit of a word line and/or a unit of a bit line. The peripheral circuit may include a row decoder, a column decoder, a sense amplifier and/or an equalize/precharge circuit. A related addressing method, a memory cell array block and semiconductor memory device are also provided.
摘要:
A memory core includes a first sub-memory array including a plurality of first memory cells, a second sub-memory array including a plurality of second memory cells, a bit line amplification circuit configured to amplify a voltage difference between the first bit line and the second bit line, and a column selection circuit including a first column selection transistor and a second column selection transistor, wherein the first and the second selection transistors share a drain and electrically couple the complementary bit line pair to a complementary local input/output line pair, respectively. As a result, the data error due to the distance mismatching can be reduced.
摘要:
Integrated circuits and methods use a margin test voltage generator that is powered at a first power supply voltage to generate a second power supply voltage that has a magnitude that is less than the magnitude of the first power supply voltage. During a low supply voltage margin test, a first logic circuit is powered at the first power supply voltage while a second logic circuit, which is the subject of the test, is powered at the second power supply voltage. As a result, the first power supply voltage may remain at a sufficient magnitude to reliably power other devices or components that are not undergoing the low supply voltage margin test.
摘要:
A semiconductor device includes first and second unit circuits. Each first unit circuit has first transistors connected in series, wherein each of the first transistors includes a first gate structure having a pitch. Each second unit circuit has second transistors connected in series, wherein each of the second transistors includes a second gate structure having the pitch. A third transistor and a fourth transistor electrically isolate each of the first and second unit circuits, respectively. An insulation layer covers the first through the fourth transistors. Plugs in the insulation layer are connected to a first gate structure, a second gate structure, a first source region, a first drain region, a second source region or a second drain region. A wiring is connected to the plugs.
摘要:
A method of configuring a memory cell array block includes dividing a first unit logic block into sub-array blocks and assigning a portion of the sub-array blocks to a second unit logic block, wherein the memory cell array block corresponds to the portion of the sub-array blocks and the second unit logic block, and the portion of the sub-array blocks and the second unit logic block share a peripheral circuit. The first unit logic block may be divided into the sub-array blocks based on a unit of a word line and/or a unit of a bit line. The peripheral circuit may include a row decoder, a column decoder, a sense amplifier and/or an equalize/precharge circuit. A related addressing method, a memory cell array block and semiconductor memory device are also provided.
摘要:
A seal pattern for a liquid crystal display device includes a substrate having an active area and a non-active area, a main seal pattern having an injection hole arranged in a boundary between the active and non-active areas, and first, second, and third dummy-seal patterns in the non-active area that are arranged along a same direction as a portion of the main seal pattern having the injection hole and spaced apart from each other. The first and second dummy-seal patterns have first and second openings corresponding to opposite ends of the injection hole. The third dummy-seal pattern has third, fourth, and fifth openings arranged alternately in correspondence with the first and second openings.
摘要:
An internal clock delay circuit of a semiconductor device and a method for delaying an internal clock of the semiconductor device. The semiconductor device includes a CAS latency signal generator that generates CAS latency signals comprising a first CAS latency signal, a second CAS latency signal and a third CAS latency signal, and an internal clock delay circuit that receives one of the CAS latency signals and an internal clock signal and delays the internal clock signal by a predetermined time in response to the received CAS latency signal. The internal clock delay circuit includes delay circuits that delay the internal clock signal, and the internal clock signal passes through only one among the delay circuits when the semiconductor device operates in the second CAS latency mode. The method includes: inputting an internal clock signal to an internal clock delay circuit, which includes delayers, of a semiconductor device; and inputting CAS latency signals to the internal clock delay circuit to determine CAS latency modes of the semiconductor device; and outputting the internal clock signal through the delay circuits as an output signal of the internal clock signal delay circuit. The internal clock signal passes through one of the delay circuits in a second CAS latency mode and passes through at least two delay circuits among the delay circuits in either a first CAS latency mode or a third CAS latency mode.
摘要:
A CMOS latch-type sense amplifying circuit is disclosed. The circuit comprises a CMOS differential amplifier configured to amplify a voltage signal of an input line pair to generate a first amplified voltage signal pair, and provide the first amplified voltage signal pair to an output line pair, a first pre-charge voltage having a first voltage level being applied to the input line pair. The circuit further comprises a CMOS latch-type sense amplifier configured to amplify a voltage signal of the output line pair to generate a second amplified voltage signal pair, and provide the second amplified voltage signal pair to the output line pair. The circuit additionally comprises a first common node controlled by a first common enable signal and connected to both the CMOS differential amplifier and the CMOS latch-type sense amplifier, such that the first common enable signal controls both the CMOS differential amplifier and the CMOS latch-type sense amplifier.
摘要:
A semiconductor memory device including a CMOS-type local sensing amplifier circuit is provided. The semiconductor memory device includes a first input/output (I/O) line pair, a second I/O line pair pre-charged to a one-half power voltage level and receives data from the first I/O line pair, and a pull-up circuit pulling up a voltage of one of the second I/O pair to a full power voltage level.